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    • 3. 发明授权
    • Method for measuring a workpiece using a machine tool
    • 使用机床测量工件的方法
    • US07886453B2
    • 2011-02-15
    • US12312770
    • 2007-12-11
    • John Charles OuldKevin James Tett
    • John Charles OuldKevin James Tett
    • G01B5/004
    • G01B21/042Y10T83/04Y10T83/0405
    • A method is described for measuring a workpiece on a machine tool using an analogue probe having a deflectable stylus. The method comprises the step of taking a workpiece having a nominal surface profile, the workpiece being located within the working area of the machine tool. The machine tool is used to move the analogue probe along a predetermined (known) measurement path relative to the workpiece whilst deflection of the stylus is measured. The analogue probe is moved relative to the workpiece at a speed greater than five millimeters per second and the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.
    • 描述了一种用于使用具有可偏转的触笔的模拟探针来测量机床上的工件的方法。 该方法包括采取具有标称表面轮廓的工件的步骤,工件位于机床的工作区域内。 机床用于沿相对于工件的预定(已知)测量路径移动模拟探头,同时测量触针的偏转。 模拟探头以大于每毫米5毫米的速度相对于工件移动,并且选择预定的测量路径以提供触针和工件之间的间歇接触。
    • 7. 发明申请
    • CALIBRATION METHOD AND APPARATUS
    • 校准方法和装置
    • US20100018069A1
    • 2010-01-28
    • US12449148
    • 2008-02-18
    • John Charles OuldAlexander Tennant Sutherland
    • John Charles OuldAlexander Tennant Sutherland
    • G01B5/004G01B5/00
    • G01B21/042
    • A method is described for calibrating apparatus comprising a measurement probe (4) mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data (x,y,z;70;80) indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data (a,b,c;72;82) indicative of the position of a surface relative to the measurement probe (4). The measurement probe (4) may be an analogue or scanning probe having a deflectable stylus (14). The first step of the method involves moving the measurement probe (4) at a known speed relative to an artefact (30;40,42) whilst capturing probe data (a,b,c;72;82) and machine position data (x,y,z;70;80). In particular, the measurement probe (4) is moved along a path that enables probe data (a,b,c;72;82) to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe (4). A second step of the method comprises analysing the machine position data (x,y,z;70;80) and the probe data (a,b,c;72;82) and determining from that data the relative delay in capturing probe data and machine position data (i.e. the so-called system delay).
    • 描述了一种用于校准装置的方法,该装置包括安装在诸如机床的机器上的测量探针(4)。 机器被布置成捕获指示测量探针的位置的机器位置数据(x,y,z; 70; 80),并且测量探针被布置成捕获指示性的探测数据(a,b,c; 72; 82) 的表面相对于测量探针(4)的位置。 测量探针(4)可以是具有偏转触笔(14)的模拟或扫描探针。 该方法的第一步包括以相对于人造物(30; 40,42)的已知速度移动测量探针(4),同时捕获探测数据(a,b,c; 72; 82)和机器位置数据(x ,y,z; 70; 80)。 特别地,测量探针(4)沿着允许探测数据(a,b,c; 72; 82)被捕获的路径移动,该路径指示在人造物相对表面上的两个或多个点的位置 到测量探头(4)。 该方法的第二步包括分析机器位置数据(x,y,z; 70; 80)和探测数据(a,b,c; 72; 82),并根据该数据确定捕获探测数据的相对延迟 和机器位置数据(即所谓的系统延迟)。
    • 8. 发明授权
    • Calibration method and apparatus
    • 校准方法和仪器
    • US07866056B2
    • 2011-01-11
    • US12449148
    • 2008-02-18
    • John Charles OuldAlexander Tennant Sutherland
    • John Charles OuldAlexander Tennant Sutherland
    • G01B5/004G01D21/00
    • G01B21/042
    • A method is described for calibrating apparatus including a measurement probe mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data indicative of the position of a surface relative to the measurement probe. The measurement probe may be an analogue or scanning probe having a deflectable stylus. The first step of the method involves moving the measurement probe at a known speed relative to an artefact whilst capturing probe data and machine position data. In particular, the measurement probe is moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe. A second step of the method comprises analyzing the machine position data and the probe data and determining from that data the relative delay in capturing probe data and machine position data (i.e. the so-called system delay).
    • 描述了一种用于校准装置的方法,该装置包括安装在诸如机床的机器上的测量探针。 机器被布置成捕获指示测量探针的位置的机器位置数据,并且测量探针被布置成捕获指示表面相对于测量探针的位置的探测数据。 测量探头可以是具有可偏转的触笔的模拟或扫描探针。 该方法的第一步包括以相对于人造物的已知速度移动测量探针,同时捕获探针数据和机器位置数据。 特别地,测量探针沿着使得能够捕获指示相对于测量探针的人造物表面上的两个或更多个点的位置的探针数据的路径移动。 该方法的第二步包括分析机器位置数据和探头数据,并根据该数据确定捕获探头数据和机器位置数据(即所谓的系统延迟)的相对延迟。