会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明授权
    • Nonvolatile memory devices with age-based variability of read operations and methods of operating same
    • 非易失性存储器件,具有基于年龄的读取操作的可变性和操作方法
    • US08694852B2
    • 2014-04-08
    • US13033276
    • 2011-02-23
    • JinHyeok ChoiHwaseok Oh
    • JinHyeok ChoiHwaseok Oh
    • H03M13/00
    • G06F11/1072G06F11/1048G11C16/349
    • Integrated circuit memory systems include a nonvolatile memory device having an array of nonvolatile memory cells therein and a memory controller, which is electrically coupled to the nonvolatile memory device. The memory controller is configured to apply signals to the nonvolatile memory device that cause the nonvolatile memory device to modify how data is read from the array of nonvolatile memory cells. This modification occurs in response to detecting an increase in an age of the nonvolatile memory device. The age of the nonvolatile memory device may be determined by keeping a count of how many times the nonvolatile memory device has undergone a program/erase cycle.
    • 集成电路存储器系统包括其中具有非易失性存储器单元的阵列的非易失性存储器件以及电耦合到非易失性存储器件的存储器控​​制器。 存储器控制器被配置为将信号施加到非易失性存储器件,使得非易失性存储器件修改如何从非易失性存储器单元阵列中读取数据。 响应于检测到非易失性存储器件的年龄增加而发生该修改。 可以通过保持非易失性存储器件已经经历了编程/擦除周期的次数来确定非易失性存储器件的时代。
    • 6. 发明授权
    • Nonvolatile memory devices and error correction methods thereof
    • 非易失性存储器件及其纠错方法
    • US08365030B1
    • 2013-01-29
    • US12662016
    • 2010-03-29
    • JinHyeok ChoiHwaseok Oh
    • JinHyeok ChoiHwaseok Oh
    • G06F11/00
    • G06F11/1048G11C2029/0411
    • A method for correcting read data error of a nonvolatile memory device, the error correction method including performing a first read operation of applying a first non-selection read voltage to a plurality of unselected memory cells to read a plurality of selected memory cells, performing a second read operation of applying a second non-selection read voltage less than the first non-selection read voltage to the unselected memory cells to read the selected memory cells, and comparing data sensed in the first and second read operations to detect error locations of read data.
    • 一种用于校正非易失性存储器件的读取数据错误的方法,所述纠错方法包括执行将第一非选择读取电压施加到多个未选择的存储器单元以读取多个选择的存储单元的第一读取操作,执行 第二读取操作,将小于第一非选择读取电压的第二非选择读取电压施加到未选择的存储器单元以读取所选择的存储器单元,以及比较在第一和第二读取操作中感测的数据以检测读取的错误位置 数据。