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    • 8. 发明申请
    • Circuit and method for preserving data in sleep mode of semiconductor device using test scan chain
    • 使用测试扫描链在半导体器件的睡眠模式下保存数据的电路和方法
    • US20050202855A1
    • 2005-09-15
    • US11061903
    • 2005-02-18
    • Jin-Hyeok ChoiSam-Yong Bahng
    • Jin-Hyeok ChoiSam-Yong Bahng
    • G11C11/40H04B1/06H04B1/16H04B7/00
    • G11C29/32
    • A data storage circuit and a data preservation method for preserving data when a semiconductor device is in a sleep mode using a test scan chain are provided, where the data storage circuit includes a sleep mode control unit and a scan chain unit, the sleep mode control unit outputs a scan control signal and a scan clock signal in response to one of a test control signal and a sleep mode control signal received from the outside, stores an output data signal in a memory when the output data signal is received, and outputs a test pattern data signal as a scan data signal when the test pattern data signal is received, the scan chain unit outputs a normal data signal stored inside of the scan chain unit as the output data signal to the sleep mode control unit or receives and outputs the scan data signal to a combinational circuit unit in response to the scan control signal and the scan clock signal, and the data storage circuit and the data preservation method prevent a loss of data in a sleep mode of a semiconductor device, and reduce power consumption in a standby state.
    • 数据存储电路和数据保存方法,用于在半导体器件使用测试扫描链处于睡眠模式时保存数据,其中数据存储电路包括睡眠模式控制单元和扫描链单元,睡眠模式控制 响应于从外部接收的测试控制信号和睡眠模式控制信号中的一个输出扫描控制信号和扫描时钟信号,当接收到输出数据信号时,将输出数据信号存储在存储器中,并输出 测试图形数据信号作为扫描数据信号,当接收到测试图形数据信号时,扫描链单元将存储在扫描链单元内的正常数据信号作为输出数据信号输出到睡眠模式控制单元,或者接收并输出 根据扫描控制信号和扫描时钟信号将数据信号扫描到组合电路单元,数据存储电路和数据保存方法防止数据丢失为 半通道模式,并且在待机状态下降低功耗。
    • 9. 发明授权
    • Circuit and method for preserving data in sleep mode of semiconductor device using test scan chain
    • 使用测试扫描链在半导体器件的睡眠模式下保存数据的电路和方法
    • US07376039B2
    • 2008-05-20
    • US11061903
    • 2005-02-18
    • Jin-Hyeok ChoiSam-Yong Bahng
    • Jin-Hyeok ChoiSam-Yong Bahng
    • G11C5/14
    • G11C29/32
    • A data storage circuit and a data preservation method for preserving data when a semiconductor device is in a sleep mode using a test scan chain are provided, where the data storage circuit includes a sleep mode control unit and a scan chain unit, the sleep mode control unit outputs a scan control signal and a scan clock signal in response to one of a test control signal and a sleep mode control signal received from the outside, stores an output data signal in a memory when the output data signal is received, and outputs a test pattern data signal as a scan data signal when the test pattern data signal is received, the scan chain unit outputs a normal data signal stored inside of the scan chain unit as the output data signal to the sleep mode control unit or receives and outputs the scan data signal to a combinational circuit unit in response to the scan control signal and the scan clock signal, and the data storage circuit and the data preservation method prevent a loss of data in a sleep mode of a semiconductor device, and reduce power consumption in a standby state.
    • 数据存储电路和数据保存方法,用于在半导体器件使用测试扫描链处于睡眠模式时保存数据,其中数据存储电路包括睡眠模式控制单元和扫描链单元,睡眠模式控制 响应于从外部接收的测试控制信号和睡眠模式控制信号中的一个输出扫描控制信号和扫描时钟信号,当接收到输出数据信号时,将输出数据信号存储在存储器中,并输出 测试图形数据信号作为扫描数据信号,当接收到测试图形数据信号时,扫描链单元将存储在扫描链单元内的正常数据信号作为输出数据信号输出到睡眠模式控制单元,或者接收并输出 根据扫描控制信号和扫描时钟信号将数据信号扫描到组合电路单元,数据存储电路和数据保存方法防止数据丢失为 半通道模式,并且在待机状态下降低功耗。