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1. 发明授权

US08343867B2 Method for main spacer trim-back 有权
标题翻译：主间隔装饰方法
公开(公告)号：US08343867B2
公开(公告)日：2013-01-01
申请号：US13234674
申请日：2011-09-16
申请人： Jin-Aun Ng , Yu-Ying Hsu , Chi-Ju Lee , Sin-Hua Wu , Bao-Ru Young , Harry-Hak-Lay Chuang
发明人： Jin-Aun Ng , Yu-Ying Hsu , Chi-Ju Lee , Sin-Hua Wu , Bao-Ru Young , Harry-Hak-Lay Chuang
IPC分类号： H01L21/4763
CPC分类号： H01L21/823425 , H01L21/823468 , H01L21/823475
摘要： The embodiments of methods described in this disclosure for trimming back nitride spacers for replacement gates allows the hard mask layers (or hard mask) to protect the polysilicon above the high-K dielectric during trim back process. The process sequence also allows determining the trim-back amount based on the process uniformity (or control) of nitride deposition and nitride etchback (or trimming) processes. Nitride spacer trim-back process integration is critical to avoid creating undesirable consequences, such as silicided polyisicon on top of high-K dielectric described above. The integrated process also allows widening the space between the gate structures to allow formation of silicide with good quality and allow contact plugs to have sufficient contact with the silicide regions. The silicide with good quality and good contact between the contact plugs and the silicide regions increase the yield of contact and allows the contact resistance to be in acceptable and workable ranges.
摘要翻译：在本公开中描述的用于修整用于替换栅极的氮化物间隔物的方法的实施例允许硬掩模层（或硬掩模）在修整回复工艺期间保护高K电介质上方的多晶硅。工艺顺序还允许基于氮化物沉积和氮化物回蚀（或修整）工艺的工艺均匀性（或控制）确定修剪量。氮化物间隔件后退工艺集成对于避免产生不期望的后果至关重要，例如上述高K电介质顶部的硅化聚异氰酸酯。集成的过程还允许扩大栅极结构之间的空间以允许形成具有良好质量的硅化物，并允许接触插塞与硅化物区域充分接触。接触插塞和硅化物区域之间质量好，接触良好的硅化物提高了接触的收率，并使接触电阻达到可接受和可操作的范围。

2. 发明授权

US08039388B1 Main spacer trim-back method for replacement gate process 有权
标题翻译：替代浇口工艺的主要间隔件修剪方法
公开(公告)号：US08039388B1
公开(公告)日：2011-10-18
申请号：US12730375
申请日：2010-03-24
申请人： Jin-Aun Ng , Yu-Ying Hsu , Chi-Ju Lee , Sin-Hua Wu , Bao-Ru Young , Harry-Hak-Lay Chuang
发明人： Jin-Aun Ng , Yu-Ying Hsu , Chi-Ju Lee , Sin-Hua Wu , Bao-Ru Young , Harry-Hak-Lay Chuang
IPC分类号： H01L21/4763
CPC分类号： H01L21/823425 , H01L21/823468 , H01L21/823475
摘要： The embodiments of methods described in this disclosure for trimming back nitride spacers for replacement gates allows the hard mask layers (or hard mask) to protect the polysilicon above the high-K dielectric during trim back process. The process sequence also allows determining the trim-back amount based on the process uniformity (or control) of nitride deposition and nitride etchback (or trimming) processes. Nitride spacer trim-back process integration is critical to avoid creating undesirable consequences, such as silicided polyisicon on top of high-K dielectric described above. The integrated process also allows widening the space between the gate structures to allow formation of silicide with good quality and allow contact plugs to have sufficient contact with the silicide regions. The silicide with good quality and good contact between the contact plugs and the silicide regions increase the yield of contact and allows the contact resistance to be in acceptable and workable ranges.
摘要翻译：在本公开中描述的用于修整用于替换栅极的氮化物间隔物的方法的实施例允许硬掩模层（或硬掩模）在修整回复工艺期间保护高K电介质上方的多晶硅。工艺顺序还允许基于氮化物沉积和氮化物回蚀（或修整）工艺的工艺均匀性（或控制）确定修剪量。氮化物间隔件后退工艺集成对于避免产生不期望的后果至关重要，例如上述高K电介质顶部的硅化聚异氰酸酯。集成的过程还允许扩大栅极结构之间的空间以允许形成具有良好质量的硅化物，并允许接触插塞与硅化物区域充分接触。接触插塞和硅化物区域之间质量好，接触良好的硅化物提高了接触的收率，并使接触电阻达到可接受和可操作的范围。

3. 发明授权

US09000533B2 Device and methods for high-K and metal gate stacks 有权
标题翻译：高K和金属栅极堆叠的器件和方法
公开(公告)号：US09000533B2
公开(公告)日：2015-04-07
申请号：US13457079
申请日：2012-04-26
申请人： Wei Cheng Wu , Po-Nien Chen , Jin-Aun Ng , Bao-Ru Young , Harry-Hak-Lay Chuang
发明人： Wei Cheng Wu , Po-Nien Chen , Jin-Aun Ng , Bao-Ru Young , Harry-Hak-Lay Chuang
IPC分类号： H01L27/11 , H01L21/8238 , H01L27/06 , H01L29/51
CPC分类号： H01L21/823462 , H01L21/823842 , H01L21/823857 , H01L27/0629 , H01L29/4925 , H01L29/513 , H01L29/517 , H01L29/518
摘要： A semiconductor device having five gate stacks on different regions of a substrate and methods of making the same are described. The device includes a semiconductor substrate and isolation features to separate the different regions on the substrate. The different regions include a p-type field-effect transistor (pFET) core region, an input/output pFET (pFET IO) region, an n-type field-effect transistor (nFET) core region, an input/output nFET (nFET IO) region, and a high-resistor region.
摘要翻译：描述了在基板的不同区域上具有五个栅极叠层的半导体器件及其制造方法。该器件包括半导体衬底和用于分离衬底上的不同区域的隔离特征。不同的区域包括p型场效应晶体管（pFET）芯区域，输入/输出pFET（pFET IO）区域，n型场效应晶体管（nFET）核心区域，输入/输出nFET（nFET） IO）区域和高电阻区域。

4. 发明授权

US08450834B2 Spacer structure of a field effect transistor with an oxygen-containing layer between two oxygen-sealing layers 有权
标题翻译：在两个氧气密封层之间具有含氧层的场效应晶体管的间隔结构
公开(公告)号：US08450834B2
公开(公告)日：2013-05-28
申请号：US12706191
申请日：2010-02-16
申请人： Jin-Aun Ng , Bao-Ru Young , Harry-Hak-Lay Chuang , Ryan Chia-Jen Chen
发明人： Jin-Aun Ng , Bao-Ru Young , Harry-Hak-Lay Chuang , Ryan Chia-Jen Chen
IPC分类号： H01L21/8238
CPC分类号： H01L29/401 , H01L21/823814 , H01L21/823864 , H01L29/6653 , H01L29/66545 , H01L29/6656
摘要： This disclosure relates to a spacer structure of a field effect transistor. An exemplary structure for a field effect transistor includes a substrate; a gate structure that has a sidewall overlying the substrate; a silicide region in the substrate on one side of the gate structure having an inner edge closest to the gate structure; a first oxygen-sealing layer adjoining the sidewall of the gate structure; an oxygen-containing layer adjoining the first oxygen-sealing layer on the sidewall and further including a portion extending over the substrate; and a second oxygen-sealing layer adjoining the oxygen-containing layer and extending over the portion of the oxygen-containing layer over the substrate, wherein an outer edge of the second oxygen-sealing layer is offset from the inner edge of the silicide region.
摘要翻译：本公开涉及场效应晶体管的间隔结构。场效应晶体管的示例性结构包括：衬底; 栅极结构，其具有覆盖所述衬底的侧壁; 所述栅极结构的一侧上的所述衬底中的硅化物区域具有最靠近所述栅极结构的内部边缘; 与栅极结构的侧壁相邻的第一氧气密封层; 邻接所述侧壁上的所述第一氧气密封层并且还包括在所述衬底上延伸的部分的含氧层; 以及邻接所述含氧层并在所述基底上的所述含氧层的所述部分上延伸的第二氧气密封层，其中所述第二氧气密封层的外边缘从所述硅化物区域的内边缘偏移。

5. 发明申请

US20110198675A1 SPACER STRUCTURE OF A FIELD EFFECT TRANSISTOR 有权
标题翻译：场效应晶体管的间隔结构
公开(公告)号：US20110198675A1
公开(公告)日：2011-08-18
申请号：US12706191
申请日：2010-02-16
申请人： Jin-Aun NG , Bao-Ru Young , Harry-Hak-Lay Chuang , Ryan Chia-Jen Chen
发明人： Jin-Aun NG , Bao-Ru Young , Harry-Hak-Lay Chuang , Ryan Chia-Jen Chen
IPC分类号： H01L29/78 , H01L21/311
CPC分类号： H01L29/401 , H01L21/823814 , H01L21/823864 , H01L29/6653 , H01L29/66545 , H01L29/6656
摘要： This disclosure relates to a spacer structure of a field effect transistor. An exemplary structure for a field effect transistor includes a substrate; a gate structure that has a sidewall overlying the substrate; a silicide region in the substrate on one side of the gate structure having an inner edge closest to the gate structure; a first oxygen-sealing layer adjoining the sidewall of the gate structure; an oxygen-containing layer adjoining the first oxygen-sealing layer on the sidewall and further including a portion extending over the substrate; and a second oxygen-sealing layer adjoining the oxygen-containing layer and extending over the portion of the oxygen-containing layer over the substrate, wherein an outer edge of the second oxygen-sealing layer is offset from the inner edge of the silicide region.
摘要翻译：本公开涉及场效应晶体管的间隔结构。场效应晶体管的示例性结构包括：衬底; 栅极结构，其具有覆盖所述衬底的侧壁; 所述栅极结构的一侧上的所述衬底中的硅化物区域具有最靠近所述栅极结构的内部边缘; 与栅极结构的侧壁相邻的第一氧气密封层; 邻接所述侧壁上的所述第一氧气密封层并且还包括在所述衬底上延伸的部分的含氧层; 以及邻接所述含氧层并在所述基底上的所述含氧层的所述部分上延伸的第二氧气密封层，其中所述第二氧气密封层的外边缘从所述硅化物区域的内边缘偏移。

6. 发明授权

US09142414B2 CMOS devices with metal gates and methods for forming the same 有权
标题翻译：具有金属栅极的CMOS器件及其形成方法
公开(公告)号：US09142414B2
公开(公告)日：2015-09-22
申请号：US13331214
申请日：2011-12-20
申请人： Sheng-Chen Chung , Ming Zhu , Harry-Hak-Lay Chuang , Bao-Ru Young , Wei-Cheng Wu , Chia Ming Liang , Sin-Hua Wu
发明人： Sheng-Chen Chung , Ming Zhu , Harry-Hak-Lay Chuang , Bao-Ru Young , Wei-Cheng Wu , Chia Ming Liang , Sin-Hua Wu
IPC分类号： H01L21/28 , H01L21/8238 , H01L29/49 , H01L29/51 , H01L29/66 , H01L29/78
CPC分类号： H01L21/28088 , H01L21/823807 , H01L21/823842 , H01L21/823857 , H01L29/4966 , H01L29/513 , H01L29/517 , H01L29/665 , H01L29/66545 , H01L29/6659 , H01L29/7833 , H01L29/7843 , H01L29/7848
摘要： A method includes forming a PMOS device. The method includes forming a gate dielectric layer over a semiconductor substrate and in a PMOS region, forming a first metal-containing layer over the gate dielectric layer and in the PMOS region, performing a treatment on the first metal-containing layer in the PMOS region using an oxygen-containing process gas, and forming a second metal-containing layer over the first metal-containing layer and in the PMOS region. The second metal-containing layer has a work function lower than a mid-gap work function of silicon. The first metal-containing layer and the second metal-containing layer form a gate of the PMOS device.
摘要翻译：一种方法包括形成PMOS器件。该方法包括在半导体衬底和PMOS区域上形成栅极电介质层，在栅极电介质层和PMOS区域上形成第一含金属层，对PMOS区域中的第一含金属层进行处理使用含氧处理气体，并在第一含金属层和PMOS区域上形成第二含金属层。第二含金属层具有低于硅的中间间隙功函数的功函数。第一含金属层和第二含金属层形成PMOS器件的栅极。

7. 发明授权

US08889501B2 Methods for forming MOS devices with raised source/drain regions 有权
标题翻译：用于形成具有升高的源极/漏极区域的MOS器件的方法
公开(公告)号：US08889501B2
公开(公告)日：2014-11-18
申请号：US13486240
申请日：2012-06-01
申请人： Harry-Hak-Lay Chuang , Sin-Hua Wu , Chung-Hau Fei , Ming Zhu , Bao-Ru Young , Yen-Ru Lee , Chii-Horng Li , Tze-Liang Lee
发明人： Harry-Hak-Lay Chuang , Sin-Hua Wu , Chung-Hau Fei , Ming Zhu , Bao-Ru Young , Yen-Ru Lee , Chii-Horng Li , Tze-Liang Lee
IPC分类号： H01L21/336 , H01L21/8238 , H01L27/11
CPC分类号： H01L27/1116 , H01L21/823807 , H01L21/823814
摘要： A method includes forming a first gate stack of a first device over a semiconductor substrate, and forming a second gate stack of a second MOS device over the semiconductor substrate. A first epitaxy is performed to form a source/drain stressor for the second MOS device, wherein the source/drain stressor is adjacent to the second gate stack. A second epitaxy is performed to form a first silicon layer and a second silicon layer simultaneously, wherein the first silicon layer is over a first portion of the semiconductor substrate, and is adjacent the first gate stack. The second silicon layer overlaps the source/drain stressor.
摘要翻译：一种方法包括在半导体衬底上形成第一器件的第一栅极堆叠，以及在半导体衬底上形成第二MOS器件的第二栅极堆叠。执行第一外延以形成用于第二MOS器件的源/漏应力源，其中源极/漏极应力器与第二栅极堆叠相邻。执行第二外延以同时形成第一硅层和第二硅层，其中第一硅层位于半导体衬底的第一部分之上并且与第一栅极堆叠相邻。第二硅层与源极/漏极应力源重叠。

8. 发明申请

US20130154022A1 CMOS Devices with Metal Gates and Methods for Forming the Same 有权
标题翻译：具有金属门的CMOS器件及其形成方法
公开(公告)号：US20130154022A1
公开(公告)日：2013-06-20
申请号：US13331214
申请日：2011-12-20
申请人： Sheng-Chen Chung , Ming Zhu , Harry-Hak-Lay Chuang , Bao-Ru Young , Wei-Cheng Wu , Chia Ming Liang , Sin-Hua Wu
发明人： Sheng-Chen Chung , Ming Zhu , Harry-Hak-Lay Chuang , Bao-Ru Young , Wei-Cheng Wu , Chia Ming Liang , Sin-Hua Wu
IPC分类号： H01L27/092 , H01L21/8238
CPC分类号： H01L21/28088 , H01L21/823807 , H01L21/823842 , H01L21/823857 , H01L29/4966 , H01L29/513 , H01L29/517 , H01L29/665 , H01L29/66545 , H01L29/6659 , H01L29/7833 , H01L29/7843 , H01L29/7848
摘要： A method includes forming a PMOS device. The method includes forming a gate dielectric layer over a semiconductor substrate and in a PMOS region, forming a first metal-containing layer over the gate dielectric layer and in the PMOS region, performing a treatment on the first metal-containing layer in the PMOS region using an oxygen-containing process gas, and forming a second metal-containing layer over the first metal-containing layer and in the PMOS region. The second metal-containing layer has a work function lower than a mid-gap work function of silicon. The first metal-containing layer and the second metal-containing layer form a gate of the PMOS device.
摘要翻译：一种方法包括形成PMOS器件。该方法包括在半导体衬底和PMOS区域上形成栅极电介质层，在栅极电介质层和PMOS区域上形成第一含金属层，对PMOS区域中的第一含金属层进行处理使用含氧处理气体，并在第一含金属层和PMOS区域上形成第二含金属层。第二含金属层具有低于硅的中间间隙功函数的功函数。第一含金属层和第二含金属层形成PMOS器件的栅极。

9. 发明授权

US09324622B2 Semiconductor device and method of forming the same 有权
标题翻译：半导体器件及其形成方法
公开(公告)号：US09324622B2
公开(公告)日：2016-04-26
申请号：US13586472
申请日：2012-08-15
申请人： Harry-Hak-Lay Chuang , Sin-Hua Wu , Chung-Hau Fei , Ming Zhu , Bao-Ru Young
发明人： Harry-Hak-Lay Chuang , Sin-Hua Wu , Chung-Hau Fei , Ming Zhu , Bao-Ru Young
IPC分类号： H01L29/66 , H01L21/8238 , H01L21/265 , H01L29/78 , H01L29/165
CPC分类号： H01L21/823814 , H01L21/26506 , H01L21/26586 , H01L21/26593 , H01L21/324 , H01L21/823807 , H01L27/092 , H01L29/0688 , H01L29/165 , H01L29/41758 , H01L29/6653 , H01L29/66553 , H01L29/66628 , H01L29/66636 , H01L29/7843 , H01L29/7847 , H01L29/7848
摘要： A method of forming a semiconductor device includes forming a gate stack over a substrate, forming an amorphized region in the substrate adjacent to an edge of the gate stack, forming a stress film over the substrate, performing a process to form a dislocation with a pinchoff point in the substrate, removing at least a portion of the dislocation to form a recess cavity with a tip in the substrate, and forming a source/drain feature in the recess cavity.
摘要翻译：一种形成半导体器件的方法包括在衬底上形成栅极叠层，在邻近栅极叠层的边缘的衬底中形成非晶化区域，在衬底上形成应力膜，执行用pinchoff形成位错的过程在衬底中去除至少一部分位错以在衬底中形成具有尖端的凹腔，并且在凹腔中形成源/漏特征。

10. 发明申请

US20140048886A1 SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME 有权
标题翻译：半导体器件及其形成方法
公开(公告)号：US20140048886A1
公开(公告)日：2014-02-20
申请号：US13586472
申请日：2012-08-15
申请人： Harry-Hak-Lay Chuang , Sin-Hua Wu , Chung-Hau Fei , Ming Zhu , Bao-Ru Young
发明人： Harry-Hak-Lay Chuang , Sin-Hua Wu , Chung-Hau Fei , Ming Zhu , Bao-Ru Young
IPC分类号： H01L21/336 , H01L27/092 , H01L21/8238
CPC分类号： H01L21/823814 , H01L21/26506 , H01L21/26586 , H01L21/26593 , H01L21/324 , H01L21/823807 , H01L27/092 , H01L29/0688 , H01L29/165 , H01L29/41758 , H01L29/6653 , H01L29/66553 , H01L29/66628 , H01L29/66636 , H01L29/7843 , H01L29/7847 , H01L29/7848
摘要： A method of forming a semiconductor device includes forming a gate stack over a substrate, forming an amorphized region in the substrate adjacent to an edge of the gate stack, forming a stress film over the substrate, performing a process to form a dislocation with a pinchoff point in the substrate, removing at least a portion of the dislocation to form a recess cavity with a tip in the substrate, and forming a source/drain feature in the recess cavity.
摘要翻译：一种形成半导体器件的方法包括在衬底上形成栅极叠层，在邻近栅极叠层的边缘的衬底中形成非晶化区域，在衬底上形成应力膜，执行用pinchoff形成位错的工艺在衬底中去除至少一部分位错以在衬底中形成具有尖端的凹腔，并且在凹腔中形成源/漏特征。

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