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1. 发明申请

US20050171716A1 Attenuator test system 失效
标题翻译：衰减器测试系统
公开(公告)号：US20050171716A1
公开(公告)日：2005-08-04
申请号：US10767038
申请日：2004-01-29
申请人： Jeffrey Clarke , Robert Buckley , Dean Silhan
发明人： Jeffrey Clarke , Robert Buckley , Dean Silhan
IPC分类号： G01R27/28
CPC分类号： G01R27/28
摘要： System for testing attenuators by a flatness and standing wave ratio tests which includes a vector network analyzer (VNA) adapted to be coupled to a device under test (DUT) and which provides an input stimulus signal for the DUT and, when certain conditions are satisfied, receives an output signal from the DUT, and a calibration receiver adapted to be coupled to the DUT via a down-converter. When certain conditions are satisfied, the output signal from the DUT is sent to the calibration receiver (through the down-converter to be possibly modified thereby depending on the testing frequency). A signal generator provides a local oscillator (LO) signal for the down-converter. A control unit is connected to the instruments and embodies software which analyzes the testing conditions, i.e., the attenuator value being tested, and selects whether the network analyzer or the calibration receiver will measure the output signal from the DUT.
摘要翻译：用于通过平坦度和驻波比测试来测试衰减器的系统，其包括适于耦合到待测器件（DUT）的矢量网络分析器（VNA），并且为DUT提供输入激励信号，并且当满足某些条件时从DUT接收输出信号，以及适于通过下变换器耦合到DUT的校准接收器。当满足某些条件时，来自DUT的输出信号被发送到校准接收器（通过下变频器可以根据测试频率进行修改）。信号发生器为下变频器提供本地振荡器（LO）信号。控制单元连接到仪器并体现了软件，其分析测试条件，即被测试的衰减器值，并选择网络分析仪或校准接收机是否将测量来自DUT的输出信号。

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