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1. 发明授权

US06381837B1 Method for making an electronic circuit assembly 失效
标题翻译：制造电子电路组件的方法
公开(公告)号：US06381837B1
公开(公告)日：2002-05-07
申请号：US09148061
申请日：1998-09-04
申请人： Jay DeAvis Baker , Edward McLeskey , Delin Li , Cuong Van Pham , Robert Edward Belke , Vivek Amir Jairazbhoy , Thomas B Krautheim , Mohan R. Paruchuri , Lakhi Nandlal Goenka , Jun Ming Hu
发明人： Jay DeAvis Baker , Edward McLeskey , Delin Li , Cuong Van Pham , Robert Edward Belke , Vivek Amir Jairazbhoy , Thomas B Krautheim , Mohan R. Paruchuri , Lakhi Nandlal Goenka , Jun Ming Hu
IPC分类号： H05K334
CPC分类号： H05K3/4685 , H05K1/111 , H05K3/062 , H05K3/303 , H05K3/328 , H05K3/3442 , H05K3/4007 , H05K2201/0361 , H05K2201/0367 , H05K2201/0373 , H05K2201/09781 , H05K2201/10636 , H05K2201/2036 , H05K2203/049 , Y02P70/611 , Y02P70/613 , Y10T29/49126 , Y10T29/49128 , Y10T29/4913 , Y10T29/49133 , Y10T29/49144 , Y10T29/49149 , Y10T29/49155 , Y10T29/49156
摘要： A method for producing an electronic circuit assembly (e.g., a circuit board) from an etched tri-metal-layer structure which provides air bridge crossovers and specially designed bumps etched from a middle layer of the tri-metal-layer structure. The bumps are formed at particular circuit locations in order to provide interconnects for (1) heavy wirebonding, (2) fine wirebonding, or (3) direct chip attachment; or, to provide (4) lifters for assuring a minimum solder joint standoff height or (5) barriers for retarding solder joint crack propagation.
摘要翻译：从蚀刻的三金属层结构制造电子电路组件（例如，电路板）的方法，其提供空气桥交叉和从三金属层结构的中间层蚀刻的特殊设计的凸起。凸起形成在特定的电路位置，以提供用于（1）重引线键合，（2）细线接合或（3）直接芯片附接的互连。或者提供（4）用于确保最小焊点间隙高度的提升器，或（5）阻止焊点裂纹扩展的障碍物。

2. 发明授权

US5931371A Standoff controlled interconnection 失效
标题翻译：对接控制互连
公开(公告)号：US5931371A
公开(公告)日：1999-08-03
申请号：US784333
申请日：1997-01-16
申请人： Yi-Hsin Pao , Chan-Jiun Jih , Jun Ming Hu , Vivek Amir Jairazbhoy , Richard Keith McMillan, II , Xu Song
发明人： Yi-Hsin Pao , Chan-Jiun Jih , Jun Ming Hu , Vivek Amir Jairazbhoy , Richard Keith McMillan, II , Xu Song
IPC分类号： B23K35/02 , H01L21/60 , H05K3/30 , H05K3/34 , B23K31/02 , B23K35/14 , B23K35/24
CPC分类号： H01L24/81 , B23K35/0244 , H05K3/3421 , H05K3/3442 , H01L2224/13111 , H01L2224/17517 , H01L2224/81136 , H01L2224/81801 , H01L2924/00013 , H01L2924/01006 , H01L2924/01013 , H01L2924/01029 , H01L2924/01033 , H01L2924/0105 , H01L2924/01082 , H01L2924/01322 , H01L2924/014 , H01L2924/19041 , H01L2924/19043 , H05K2201/10166 , H05K2201/10636 , H05K2201/10689 , H05K2201/10727 , H05K2201/10992 , H05K2201/2036 , H05K3/305 , Y02P70/611 , Y02P70/613
摘要： A method for joining a component to a substrate applies a base solder portion to the substrate and provides a standoff solder portion in the base solder portion. The standoff solder portion has a higher melting temperature than the base solder portion and a height which substantially corresponds to a desired standoff height between the component and the substrate. The component is positioned on the standoff solder portion and the base solder portion is melted under reflow conditions to form a solder joint between the component and the substrate. This joint substantially encapsulates the standoff solder portion, wherein the reflow conditions create a dendritic structure between the base solder portion and the standoff solder portion.
摘要翻译：用于将部件接合到基板的方法将基底焊接部分施加到基板，并在基底焊接部分中提供支撑焊接部分。隔离焊料部分具有比基底焊料部分更高的熔化温度和基本上对应于部件和基板之间期望的间隔高度的高度。该部件位于支座焊接部分上，并且基底焊料部分在回流条件下熔化以在部件和基板之间形成焊接接头。该接头基本上封装了支座焊接部分，其中回流条件在基底焊料部分和支座焊接部分之间产生树枝状结构。

3. 发明授权

US5965816A Computer program, system and method to specify random vibration tests for product durability validation 失效
标题翻译：计算机程序，系统和方法，用于指定产品耐久性验证的随机振动测试
公开(公告)号：US5965816A
公开(公告)日：1999-10-12
申请号：US940568
申请日：1997-09-30
申请人： Jun Ming Hu
发明人： Jun Ming Hu
IPC分类号： G01M7/02
CPC分类号： G01M7/022
摘要： An application program and computer system for determining the testing profile for accelerated laboratory random vibrational testing of a product, including the application program steps of (i) selecting the frequency range covered in the laboratory accelerated testing, (ii) developing a simplified composite Power Spectral Density function PSD.sub.j (f) representative of the PSD for random vibration loadings in expected field vibration levels, (iii) developing the shape of PSD.sub.T for producing on the product the test acceleration forces corresponding to the PSD.sub.j function, (iv) calculating the stress response curve H(f) for the product representative of the transmissibility function from the input acceleration forces to the local vibration stress forces, (v) selecting the test duration, and then calculating the amplification factor from the relationship ##EQU1## (vi) recalculating the accelerated PSD profile, PSD.sub.T (f) for testing based on the selected test duration and the amplification factor: ##EQU2## and then (vii) testing the product using the selected PSD function, to validate the required performance lifetime for the product when no test failures are observed over all of the T hours.
摘要翻译：一种应用程序和计算机系统，用于确定产品加速实验室随机振动测试的测试概况，包括应用程序步骤：（i）选择实验室加速测试中覆盖的频率范围，（ii）开发简化的复合功率谱密度函数PSDj（f）代表预期场振动水平的随机振动载荷的PSD，（iii）开发用于在产品上产生对应于PSDj函数的测试加速力的PSDT的形状，（iv）计算应力响应曲线H（f）表示从输入加速力到局部振动应力的透射函数的乘积，（v）选择测试持续时间，然后根据关系计算放大系数（vi）重新计算加速PSD曲线，PSDT（f）用于根据所选择的测试持续时间和放大系数进行测试：然后（vii）使用所选的PSD功能测试产品，以便在所有T小时内没有观察到测试失败时验证产品所需的性能寿命。

4. 发明授权

US5847259A Computer program, system and method to specify sinusoidal vibration tests for product durability validation 失效
标题翻译：计算机程序，系统和方法来规定产品耐久性验证的正弦振动试验
公开(公告)号：US5847259A
公开(公告)日：1998-12-08
申请号：US723384
申请日：1996-09-30
申请人： Jun Ming Hu
发明人： Jun Ming Hu
IPC分类号： G01M7/02 , G01M7/00
CPC分类号： G01M7/022
摘要： An application program and computer system for determining the testing profile for accelerated laboratory sinusoidal vibrational testing of a product, includes the application program steps of (i) selecting the type and rate for the frequency sweep, (ii) developing a simplified composite Power Spectral Density function PSD.sub.j representing expected field vibration levels, (iii) developing the acceleration force function G.sub.T (f) corresponding to the PSD function, (iv) determining the stress response curve H(f) for the product, (v) selecting the number of frequency sweeps N.sub.W based on the testing equipment, the testing time available, and the range of acceleration forces required for implementing G.sub.T (f) from the relationship ##EQU1## where K is a constant, (vi) recalculating the acceleration forces G.sub.u, and then (vii) testing the product using the selected variables to validate the required performance lifetime for the product when no test failures are observed over all of the N.sub.W test sweeps.
摘要翻译：一种应用程序和计算机系统，用于确定产品加速实验室正弦振动测试的测试曲线，包括应用程序步骤：（i）选择频率扫描的类型和速率，（ii）开发简化的复合功率谱密度功能PSDj表示预期的场振动水平，（iii）开发对应于PSD功能的加速力函数GT（f），（iv）确定乘积的应力响应曲线H（f），（v）选择频率数根据测试设备扫描NW，可用的测试时间以及从K为常数的关系中实现GT（f）所需的加速力范围，（vi）重新计算加速度Gu，然后（ vii）使用所选变量测试产品，以便在所有NW测试扫描中未观察到测试故障时验证产品所需的性能寿命。

5. 发明授权

US5767406A Method to specify random vibration tests for product durability validation 失效
标题翻译：为产品耐久性验证指定随机振动试验的方法
公开(公告)号：US5767406A
公开(公告)日：1998-06-16
申请号：US724718
申请日：1996-09-30
申请人： Jun Ming Hu
发明人： Jun Ming Hu
IPC分类号： G01M7/02
CPC分类号： G01M7/022
摘要： A method for determining the testing profile for accelerated laboratory random vibrational testing of a product, including the steps of (i) selecting the frequency range covered in the laboratory accelerated testing, (ii) developing a simplified composite Power Spectral Density function PSD.sub.j (f) representative of the PSD for random vibration loadings in expected field vibration levels, (iii) developing the shape of PSD.sub.T for producing on the product the test acceleration forces corresponding to the PSD.sub.j function, (iv) calculating the stress response curve H(f) for the product representative of the transmissibility function from the input acceleration forces to the local vibration stress forces, (v) selecting the test duration, and then calculating the amplification factor from the relationship ##EQU1## (vi) recalculating the accelerated PSD profile, PSD.sub.T (f) for testing based on the selected test duration and the amplification factor: ##EQU2## , and then (vii) testing the product using the selected PSD function, to validate the required performance lifetime for the product when no test failures are observed over all of the T hours.
摘要翻译：一种用于确定产品加速实验室随机振动测试的测试概况的方法，包括以下步骤：（i）选择实验室加速测试中覆盖的频率范围，（ii）开发简化的复合功率谱密度函数PSDj（f）代表PSD在预期场振动水平的随机振动载荷，（iii）开发用于在产品上产生对应于PSDj函数的测试加速力的PSDT的形状，（iv）计算应力响应曲线H（f）代表从输入加速力到局部振动应力的传递函数的乘积，（v）选择测试持续时间，然后根据关系式（6）重新计算加速PSD曲线PSDT（ f）根据所选择的测试持续时间和放大系数进行测试：使用所选择的PSD功能来验证需求在所有T小时内没有观察到测试故障时，产品的红色性能寿命。

6. 发明授权

US5717607A Computer program, system and method to reduce sample size in accelerated reliability verification tests 失效
标题翻译：计算机程序，系统和方法在加速可靠性验证测试中减少样本量
公开(公告)号：US5717607A
公开(公告)日：1998-02-10
申请号：US723385
申请日：1996-09-30
申请人： Jun Ming Hu
发明人： Jun Ming Hu
IPC分类号： G01M13/00 , G06F11/00 , G06F11/263 , G06F19/00 , G06Q10/04 , G06F17/60
CPC分类号： G06Q10/04 , G06F11/008 , G06F11/263
摘要： A method for determining a sample size W required for accelerated testing of a product includes the steps of selecting a Reliability Goal R as appropriate for the product, selecting a Confidence Level CL appropriate for the accuracy required from the results of the accelerated testing, selecting the number of testing cycles N.sub.t defining the accelerated testing period, calculating the Sample Size W for the accelerated testing as ##EQU1## and then testing the W product samples for the N.sub.t testing cycles to validate the required Reliability when no test failures are observed over the N.sub.t testing cycles. A method for determining the Number of Cycles N.sub.t required for accelerated testing of a product having a service lifetime is also described. In either of the above methods, if any failures are observed in the N.sub.t testing cycles/time, then the number of testing cycles/time may be extended to at least 2 N.sub.t and a new Confidence Level is calculated ##EQU2## The Reliability Goal R for the product design is validated if the new Confidence Levels CL.sub.NEW is greater than a CL.sub.min value specified as a minimum confidence level required for the accelerated testing method.
摘要翻译：用于确定产品加速测试所需的样本大小W的方法包括以下步骤：根据产品选择可靠性目标R，从加速测试的结果中选择适合于所需精度的置信水平CL，选择测试周期数Nt定义加速测试周期，计算用于加速测试的样本大小W为，然后测试N个测试周期的W个产品样本，以在Nt没有观察到测试失败时验证所需的可靠性测试周期。还描述了用于确定具有使用寿命的产品的加速测试所需的循环数Nt的方法。在上述任一方法中，如果在Nt测试周期/时间内观察到任何故障，则测试周期/时间的数量可以扩展到至少2 Nt，并且计算新的置信度水平可靠性目标R 如果新的置信度CLNEW大于作为加速测试方法所需的最小置信度指定的CLmin值，则验证产品设计。

7. 发明授权

US5715180A Method to reduce sample size in accelerated reliability verification tests 失效
标题翻译：在加速可靠性验证测试中减少样本量的方法
公开(公告)号：US5715180A
公开(公告)日：1998-02-03
申请号：US543418
申请日：1995-10-16
申请人： Jun Ming Hu
发明人： Jun Ming Hu
IPC分类号： G06Q10/04 , G06F17/60
CPC分类号： G06Q10/04
摘要： A method for determining a sample size W required for accelerated testing of a product includes the steps of selecting a Reliability Goal R as appropriate for the product, selecting a Confidence Level CL appropriate for the accuracy required from the results of the accelerated testing, selecting the number of testing cycles N.sub.t defining the accelerated testing period, calculating the Sample Size W for the accelerated testing as ##EQU1## and then testing the W product samples for the N.sub.t testing cycles to validate the required Reliability when no test failures are observed over the N.sub.t testing cycles. A method for determining the Number of Cycles N.sub.t required for accelerated testing of a product having a service lifetime is also described. In either of the above methods, if any failures are observed in the N.sub.t testing cycles/time, then the number of testing cycles/time may be extended to at least 2 N.sub.t and a new Confidence Level is calculated ##EQU2## The Reliability Goal R for the product design is validated if the new Confidence Levels CL.sub.NEW is greater than a CL.sub.min value specified as a minimum confidence level required for the accelerated testing method.
摘要翻译：用于确定产品加速测试所需的样本大小W的方法包括以下步骤：选择适合于产品的可靠性目标R，从加速测试的结果中选择适合于所需精度的置信水平CL，选择测试周期数Nt定义加速测试周期，计算用于加速测试的样本大小W为，然后测试N个测试周期的W个产品样本，以在Nt没有观察到测试失败时验证所需的可靠性测试周期。还描述了用于确定具有使用寿命的产品的加速测试所需的循环数Nt的方法。在上述任一方法中，如果在Nt测试周期/时间内观察到任何故障，则测试周期/时间的数量可以扩展到至少2 Nt，并且计算新的置信度水平可靠性目标R 如果新的置信度CLNEW大于作为加速测试方法所需的最小置信度指定的CLmin值，则验证产品设计。

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