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1. 发明申请

US20110261491A1 MONITOR CIRCUIT FOR DETERMINING THE LIFETIME OF A SEMICONDUCTOR DEVICE 有权
标题翻译：用于确定半导体器件寿命的监视器电路
公开(公告)号：US20110261491A1
公开(公告)日：2011-10-27
申请号：US12764689
申请日：2010-04-21
申请人： JASON C. PERKEY , Scott S. Roth , Tim J. Zoerner
发明人： JASON C. PERKEY , Scott S. Roth , Tim J. Zoerner
IPC分类号： H02H3/02 , H01L21/768
CPC分类号： G01R31/2642
摘要： A circuit comprises a first conductor, a second conductor, and a first detect and disconnect circuit. The first conductor is coupled to a first power supply voltage terminal. The second conductor is positioned a first predetermined distance from the first conductor. The first detect and disconnect circuit has a first terminal coupled to the second conductor and a second terminal coupled to a second power supply voltage terminal. The first detect and disconnect circuit detects a first electrical property change between the second conductor and the first conductor. In response to detecting the change in the first electrical property, the second conductor is disconnected from the second power supply voltage terminal. A method for manufacturing a semiconductor device comprising the circuit is also provided.
摘要翻译：电路包括第一导体，第二导体和第一检测和断开电路。第一导体耦合到第一电源电压端子。第二导体位于距第一导体第一预定距离处。第一检测和断开电路具有耦合到第二导体的第一端子和耦合到第二电源电压端子的第二端子。第一检测和断开电路检测第二导体和第一导体之间的第一电特性变化。响应于检测到第一电气特性的变化，第二导体与第二电源电压端子断开。还提供了一种制造包括该电路的半导体器件的方法。

2. 发明授权

US08824114B2 Monitor circuit for determining the lifetime of a semiconductor device 有权
标题翻译：用于确定半导体器件的寿命的监视器电路
公开(公告)号：US08824114B2
公开(公告)日：2014-09-02
申请号：US12764689
申请日：2010-04-21
申请人： Jason C. Perkey , Scott S. Roth , Tim J. Zoerner
发明人： Jason C. Perkey , Scott S. Roth , Tim J. Zoerner
IPC分类号： H02H3/00 , G01R31/26 , H02H3/22 , H02H9/00 , H01L21/768
CPC分类号： G01R31/2642
摘要： A circuit comprises a first conductor, a second conductor, and a first detect and disconnect circuit. The first conductor is coupled to a first power supply voltage terminal. The second conductor is positioned a first predetermined distance from the first conductor. The first detect and disconnect circuit has a first terminal coupled to the second conductor and a second terminal coupled to a second power supply voltage terminal. The first detect and disconnect circuit detects a first electrical property change between the second conductor and the first conductor. In response to detecting the change in the first electrical property, the second conductor is disconnected from the second power supply voltage terminal. A method for manufacturing a semiconductor device comprising the circuit is also provided.
摘要翻译：电路包括第一导体，第二导体和第一检测和断开电路。第一导体耦合到第一电源电压端子。第二导体位于距第一导体第一预定距离处。第一检测和断开电路具有耦合到第二导体的第一端子和耦合到第二电源电压端子的第二端子。第一检测和断开电路检测第二导体和第一导体之间的第一电特性变化。响应于检测到第一电气特性的变化，第二导体与第二电源电压端子断开。还提供了一种制造包括该电路的半导体器件的方法。

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