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    • 7. 发明授权
    • Integrated circuit device with low capacitance and high thermal conductivity interface
    • 具有低电容和高导热性界面的集成电路器件
    • US08174112B1
    • 2012-05-08
    • US12544850
    • 2009-08-20
    • James KarpVassili Kireev
    • James KarpVassili Kireev
    • H01L23/34
    • H01L23/42H01L23/10H01L2224/16225H01L2224/73253H01L2924/15311
    • An integrated circuit device includes an integrated circuit formed in a semiconductor die and an integrated circuit package containing the semiconductor die. The integrated circuit package includes a thermal interface material substantially between the semiconductor die and a heat spreader of the integrated circuit device for conducting heat from the semiconductor die to the heat spreader. The thermal interface material includes diamond particles and has a thickness selected to reduce capacitance between the semiconductor die and the heat spreader over that of a conventional integrated circuit device without reducing the rate of thermal conduction from the semiconductor die to the heat spreader. As a result, the integrated circuit device has improved electrostatic discharge immunity.
    • 集成电路器件包括形成在半导体管芯中的集成电路和包含半导体管芯的集成电路封装。 集成电路封装包括基本上在半导体管芯和用于将热量从半导体管芯传导到散热器的集成电路器件的散热器之间的热界面材料。 热界面材料包括金刚石颗粒,并且具有选择的厚度以减小半导体管芯和散热器之间的电容,而不降低从半导体管芯到散热器的热传导速率。 结果,集成电路器件具有改进的静电放电抗扰度。