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    • 3. 发明申请
    • SENSOR DIFFERENTIATED FAULT ISOLATION
    • 传感器差异故障分离
    • US20070126450A1
    • 2007-06-07
    • US11670001
    • 2007-02-01
    • Kevin CondonTheodore LevinLeah PastelDavid Vallett
    • Kevin CondonTheodore LevinLeah PastelDavid Vallett
    • G01R31/02
    • G01R31/311G01R31/302G01R31/31728G01R31/3187
    • Disclosed is an apparatus and method for diagnostically testing circuitry within a device. The apparatus and method incorporate the use of energy (e.g., light, heat, magnetic, electric, etc.) applied directly to any location on the device that can affect the electrical activity within the circuitry being tested in order to produce an indicator of a response. A local sensor (e.g., photonic, magnetic, etc.) is positioned at another location on the device where the sensor can detect the indicator of the response within the circuitry. A correlator is configured with response location correlation software and/or circuit tracing software so that when the indicator is detected, the correlator can determine the exact location of a response causing a device failure and/or trace the connectivity of the circuitry, based upon the location of the energy source and the location of the sensor.
    • 公开了一种用于诊断测试设备内的电路的装置和方法。 该装置和方法包括直接应用于设备上可能影响被测电路内的电活动的任何位置的能量(例如光,热,磁,电等)的使用,以便产生一个 响应。 本地传感器(例如,光子,磁性等)位于设备上的另一位置处,其中传感器可以检测电路内的响应的指示符。 相关器被配置有响应位置相关软件和/或电路跟踪软件,使得当检测到指示符时,相关器可基于导致设备故障的确定位置和/或跟踪电路的连通性来确定电路的连接性 能源的位置和传感器的位置。
    • 4. 发明申请
    • SENSOR DIFFERENTIATED FAULT ISOLATION
    • 传感器差异故障分离
    • US20060232284A1
    • 2006-10-19
    • US10907787
    • 2005-04-15
    • Kevin CondonTheodore LevinLeah PastelDavid Vallett
    • Kevin CondonTheodore LevinLeah PastelDavid Vallett
    • G01R31/302
    • G01R31/311G01R31/302G01R31/31728G01R31/3187
    • Disclosed is an apparatus and method for diagnostically testing circuitry within a device. The apparatus and method incorporate the use of energy (e.g., light, heat, magnetic, electric, etc.) applied directly to any location on the device that can affect the electrical activity within the circuitry being tested in order to produce an indicator of a response. A local sensor (e.g., photonic, magnetic, etc.) is positioned at another location on the device where the sensor can detect the indicator of the response within the circuitry. A correlator is configured with response location correlation software and/or circuit tracing software so that when the indicator is detected, the correlator can determine the exact location of a response causing a device failure and/or trace the connectivity of the circuitry, based upon the location of the energy source and the location of the sensor.
    • 公开了一种用于诊断测试设备内的电路的装置和方法。 该装置和方法包括直接应用于设备上可能影响被测电路内的电活动的任何位置的能量(例如光,热,磁,电等)的使用,以便产生一个 响应。 本地传感器(例如,光子,磁性等)位于设备上的另一位置处,其中传感器可以检测电路内的响应的指示符。 相关器被配置有响应位置相关软件和/或电路跟踪软件,使得当检测到指示符时,相关器可基于导致设备故障的确定位置和/或跟踪电路的连通性来确定电路的连接性 能源的位置和传感器的位置。