专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06501823B1 Method of reconstructing a tomogram of an X-ray apparatus 有权
标题翻译：重建X射线装置断层图像的方法
公开(公告)号：US06501823B1
公开(公告)日：2002-12-31
申请号：US10053875
申请日：2002-01-24
申请人： Hyeong-Cheol Kim , Won Choi , Jae-Hyun Jung , Yong-Won Kim , Hyoung-Jo Jeon , Seung-Hwan Choi , Hyun-Kwon Jung , Kwang-Jun Yoon , Jun-Bo Kim , Kyoung-Mu Lee
发明人： Hyeong-Cheol Kim , Won Choi , Jae-Hyun Jung , Yong-Won Kim , Hyoung-Jo Jeon , Seung-Hwan Choi , Hyun-Kwon Jung , Kwang-Jun Yoon , Jun-Bo Kim , Kyoung-Mu Lee
IPC分类号： G01N2300
CPC分类号： G01N23/046 , G01N2223/419
摘要： A method of reconstructing a tomogram of an X-ray apparatus. The tomogram reconstructing method includes obtaining model information and a transmission image of a subject. A tomogram is reconstructed from the transmission image using the model information. The reconstructed tomogram obtained is then displayed.
摘要翻译：一种重建X射线装置的断层图像的方法。断层图像重建方法包括获得被摄体的模型信息和透射图像。使用模型信息从发送图像重建断层图像。然后显示所获得的重建的断层图像。

2. 发明授权

US06415014B1 Three-dimensional image constructing method using X-ray apparatus 有权
标题翻译：使用X射线装置的三维图像构造方法
公开(公告)号：US06415014B1
公开(公告)日：2002-07-02
申请号：US09966362
申请日：2001-10-01
申请人： Hyeong-Cheol Kim , Hyoung-Jo Jeon , Jae-Hyun Jung , Yong-Won Kim , Won Choi , Kwang-Jun Yoon , Hyun-Kwon Jung , Jun-Bo Kim , Jae-Wan Kim , Young-Jun Roh , Hyung-Suck Cho
发明人： Hyeong-Cheol Kim , Hyoung-Jo Jeon , Jae-Hyun Jung , Yong-Won Kim , Won Choi , Kwang-Jun Yoon , Hyun-Kwon Jung , Jun-Bo Kim , Jae-Wan Kim , Young-Jun Roh , Hyung-Suck Cho
IPC分类号： A61B603
CPC分类号： G01N23/04 , Y10S378/901
摘要： Disclosed herein is a three-dimensional image constructing method using an X-ray apparatus. In the three-dimensional image constructing method, a construction space of a subject and information for the construction space are set. Thereafter, a plurality of transmission images of the subject are obtained. The data of the construction space are calculated on the basis of the information for the construction space set at the setting step and the transmission images obtained at the image obtaining step. The construction space is constructed on the basis of the data calculated at the image processing step.
摘要翻译：这里公开了使用X射线装置的三维图像构造方法。在三维图像构造方法中，设定被摄体的构造空间和建筑空间的信息。此后，获得被摄体的多个透射图像。基于在设定步骤中设定的建筑空间的信息和在图像获取步骤获得的发送图像来计算建筑空间的数据。基于在图像处理步骤中计算的数据构建建筑空间。

3. 发明授权

US06480002B1 Battery inspection system 失效
标题翻译：电池检查系统
公开(公告)号：US06480002B1
公开(公告)日：2002-11-12
申请号：US09966364
申请日：2001-10-01
申请人： Jae-Hyun Jung , Kwang-Jun Yoon , Hyeong-Cheol Kim , Yong-Won Kim , Won Choi , Hyoung-Jo Jeon , Hyun-Kwon Jung
发明人： Jae-Hyun Jung , Kwang-Jun Yoon , Hyeong-Cheol Kim , Yong-Won Kim , Won Choi , Hyoung-Jo Jeon , Hyun-Kwon Jung
IPC分类号： G01N27416
CPC分类号： H01M10/0583 , G01N23/04 , H01M10/052
摘要： Disclosed herein is a battery inspection system. The battery inspection system includes a battery feeding conveyor for feeding batteries to be inspected. One or more transfer robots are positioned near the rear end of the battery feeding conveyor for transferring batteries fed through the battery feeding conveyor to inspection and discharge positions. An X-ray generator is positioned under the transfer robots for applying X-rays to batteries transferred by the transfer robots. A satisfactory battery discharging conveyor is positioned near the transfer robots for discharging satisfactory battery moved by the transfer robots and having been inspected. A defective battery discharging robot is positioned near the front end of the satisfactory battery discharging conveyor for removing defective batteries from batteries moving along the satisfactory battery discharging conveyor and having been inspected.
摘要翻译：这里公开了电池检查系统。电池检查系统包括用于给待检查的电池供电的电池馈送输送机。一个或多个传送机器人位于电池馈送输送机的后端附近，用于将通过电池馈送输送机馈送的电池转移到检查和放电位置。 X射线发生器位于传送机器人下面，用于将X射线照射到由传送机器人传送的电池上。令人满意的电池排出输送机位于传送机器人附近，用于排出由传送机器人移动并且被检查的令人满意的电池。有缺陷的电池放电机器人位于令人满意的电池排出输送机的前端附近，用于从沿着令人满意的电池排放输送机移动的电池中去除有缺陷的电池并进行了检查。

4. 发明授权

US06830376B2 Radioactive image apparatus and focus control method thereof 失效
标题翻译：放射性图像设备及其聚焦控制方法
公开(公告)号：US06830376B2
公开(公告)日：2004-12-14
申请号：US10282070
申请日：2002-10-29
申请人： Jae-Wan Kim , Jae-Hyun Jung , Hyeong-Cheol Kim , Jun-Bo Kim , Won Choi , Hyoung-Jo Jeon
发明人： Jae-Wan Kim , Jae-Hyun Jung , Hyeong-Cheol Kim , Jun-Bo Kim , Won Choi , Hyoung-Jo Jeon
IPC分类号： G01D1800
CPC分类号： G01N23/04 , A61B6/583
摘要： A radioactive image apparatus and a method of controlling a focus thereof. The radioactive image apparatus includes a radioactive ray generating unit, a robot table, and a radioactive ray detecting unit. The focus control method includes obtaining a radioactive transmission image of a test pattern, defining a circle with a given radius in the radioactive transmission image of the test pattern, detecting values of pixels located on a circumference of the circle, calculating the standard deviation of the values of the pixels located on the circumference of the circle, and determining the radius of the circle to be an index factor of a resolution in response to the calculated standard deviation being smaller than a preset threshold value.
摘要翻译：放射性图像装置及其焦点的控制方法。放射性图像装置包括放射线产生单元，机器人台和放射线检测单元。聚焦控制方法包括获得测试图案的放射性透射图像，在测试图案的放射性透射图像中定义具有给定半径的圆，检测位于圆周上的像素的值，计算位于圆周上的像素的值，以及响应于所计算的标准偏差小于预设阈值，将圆的半径确定为分辨率的指标因子。

5. 发明授权

US09841688B2 Method for detecting overlay error and method for manufacturing semiconductor device using the same 有权
公开(公告)号：US09841688B2
公开(公告)日：2017-12-12
申请号：US14978916
申请日：2015-12-22
申请人： Kang-Woong Ko , Hyoung-Jo Jeon , Masahiro Horie , Gil-Woo Song
发明人： Kang-Woong Ko , Hyoung-Jo Jeon , Masahiro Horie , Gil-Woo Song
IPC分类号： G03F7/20 , H01L21/66 , G01B11/27 , G01B11/14 , H01L23/544
CPC分类号： G03F7/70633 , G01B11/14 , G01B11/27 , H01L22/12 , H01L23/544
摘要： A method for detecting an overlay error includes: forming a first overlay key including a plurality of spaced apart first target patterns having a first pitch on a first layer of a substrate; forming a second overlay key including a plurality of spaced apart second target patterns having a second pitch different than the first pitch on a second layer of the substrate below the first layer; irradiating the first layer and the second layer with incident light having a first wavelength; obtaining a phase pattern of light reflected from the first layer and the second layer; calculating a position of a peak point or a valley point of the phase pattern of the reflected light; and detecting an overlay error of the first layer and the second layer using the position of the peak point or the valley point of the phase pattern.

6. 发明申请

US20160300767A1 METHOD FOR DETECTING OVERLAY ERROR AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME 有权
标题翻译：用于检测覆盖误差的方法及使用其制造半导体器件的方法
公开(公告)号：US20160300767A1
公开(公告)日：2016-10-13
申请号：US14978916
申请日：2015-12-22
申请人： Kang-Woong Ko , Hyoung-Jo Jeon , Masahiro Horie , Gil-Woo Song
发明人： Kang-Woong Ko , Hyoung-Jo Jeon , Masahiro Horie , Gil-Woo Song
IPC分类号： H01L21/66 , G01B11/14 , G01B11/27
CPC分类号： G03F7/70633 , G01B11/14 , G01B11/27 , H01L22/12 , H01L23/544
摘要： A method for detecting an overlay error includes: forming a first overlay key including a plurality of spaced apart first target patterns having a first pitch on a first layer of a substrate; forming a second overlay key including a plurality of spaced apart second target patterns having a second pitch different than the first pitch on a second layer of the substrate below the first layer; irradiating the first layer and the second layer with incident light having a first wavelength; obtaining a phase pattern of light reflected from the first layer and the second layer; calculating a position of a peak point or a valley point of the phase pattern of the reflected light; and detecting an overlay error of the first layer and the second layer using the position of the peak point or the valley point of the phase pattern.
摘要翻译：一种用于检测覆盖误差的方法包括：形成第一覆盖键，该第一覆盖键包括在衬底的第一层上具有第一间距的多个间隔开的第一目标图案; 形成第二覆盖键，其包括在所述第一层下方的所述基板的第二层上具有不同于所述第一间距的第二间距的多个间隔开的第二目标图案; 用具有第一波长的入射光照射第一层和第二层; 获得从第一层和第二层反射的光的相位图案; 计算反射光的相位图案的峰值点或谷点的位置; 以及使用相位图案的峰值点或谷点的位置来检测第一层和第二层的覆盖误差。

7. 发明授权

US07193795B2 Optical system with image producing surface control unit 失效
标题翻译：具有图像产生表面控制单元的光学系统
公开(公告)号：US07193795B2
公开(公告)日：2007-03-20
申请号：US10790791
申请日：2004-03-03
申请人： Hyeong-Min Ahn , Dong-Hee Lee , Chang-Hyo Kim , Hyoung-Jo Jeon
发明人： Hyeong-Min Ahn , Dong-Hee Lee , Chang-Hyo Kim , Hyoung-Jo Jeon
IPC分类号： G02B7/02
CPC分类号： G01N21/95 , G01N2021/9513
摘要： An optical system to attain a clear image of an object when the object is photographed in a state where an optical axis of a lens is inclined relative to the object, includes a lens which refracts light radiating from the object, an image producing surface on which the image of the object is produced according to the light refracted by the lens, and an image producing surface control unit which controls the image producing surface to move with respect to the lens. The image producing surface control unit includes an angle control unit to control an angle between an optical axis of the lens and the image producing surface.
摘要翻译：当在透镜的光轴相对于物体倾斜的状态下拍摄物体时获得物体的清晰图像的光学系统包括折射从物体辐射的光的透镜，其上在该图像产生表面上根据由透镜折射的光产生物体的图像，以及控制图像产生面相对于透镜移动的图像产生面控制部。图像产生表面控制单元包括角度控制单元，用于控制透镜的光轴与图像产生表面之间的角度。

8. 发明申请

US20050094280A1 Optical system with image producing surface control unit 失效
标题翻译：具有图像产生表面控制单元的光学系统
公开(公告)号：US20050094280A1
公开(公告)日：2005-05-05
申请号：US10790791
申请日：2004-03-03
申请人： Hyeong-Min Ahn , Dong-Hee Lee , Chang-Hyo Kim , Hyoung-Jo Jeon
发明人： Hyeong-Min Ahn , Dong-Hee Lee , Chang-Hyo Kim , Hyoung-Jo Jeon
IPC分类号： G03B3/04 , G01M11/00 , G01N21/95 , G02B9/34 , G02B27/10 , G03B13/32
CPC分类号： G01N21/95 , G01N2021/9513
摘要： An optical system to attain a clear image of an object when the object is photographed in a state where an optical axis of a lens is inclined relative to the object, includes a lens which refracts light radiating from the object, an image producing surface on which the image of the object is produced according to the light refracted by the lens, and an image producing surface control unit which controls the image producing surface to move with respect to the lens. The image producing surface control unit includes an angle control unit to control an angle between an optical axis of the lens and the image producing surface.
摘要翻译：当在透镜的光轴相对于物体倾斜的状态下拍摄物体时获得物体的清晰图像的光学系统包括折射从物体辐射的光的透镜，其上在该图像产生表面上根据由透镜折射的光产生物体的图像，以及控制图像产生面相对于透镜移动的图像产生面控制部。图像产生表面控制单元包括角度控制单元，用于控制透镜的光轴与图像产生表面之间的角度。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式