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1. 发明授权

US06844717B2 Test handler 有权
标题翻译：测试处理程序
公开(公告)号：US06844717B2
公开(公告)日：2005-01-18
申请号：US09975861
申请日：2001-10-12
申请人： Jae-Gyun Shim , Seung-Won Jeon , Yun-Sung Na , In-Gu Jeon
发明人： Jae-Gyun Shim , Seung-Won Jeon , Yun-Sung Na , In-Gu Jeon
IPC分类号： G01R31/28 , H01L21/00 , H01L21/677 , G01R31/26
CPC分类号： H01L21/67236 , G01R31/2887 , G01R31/2893 , H01L21/67242 , H01L21/67778
摘要： The present invention discloses a test handler comprising a main body, a stocker including a user tray supplier and a user tray deliverer for loading plurality of user trays carrying the semiconductor device during devices tests, a plurality of test trays, a device loading means for transferring the devices in the user tray of the user tray supplier to the test tray, a first tray inverter changing the horizontal posture of the test tray, a soak chamber preparing a desired test temperature condition, a test chamber accomplishing tests, a de-soak chamber restoring the devices temperature, a second tray inverter inverting to the test tray of a horizontal posture, a device unloading means transferring the semiconductor devices on the test tray. The present invention can double the lot size in unit operation to improve equipment operation ratio. In more, the device loading time and unloading can be reduced so that the number of the devices treated in unit operation can be increased.
摘要翻译：本发明公开了一种测试处理器，包括主体，包括用户托盘供应器的储料器和用于在设备测试期间装载携带半导体器件的多个用户托盘的用户托盘输送器，多个测试托盘，用于传送的设备加载装置用户托盘的用户托盘中的设备供应到测试托盘，第一托盘变换器改变测试托盘的水平姿势，准备所需测试温度条件的浸泡室，完成测试的测试室，脱泡室恢复设备温度，第二托盘变换器反转到水平姿态的测试托盘，装置卸载装置将半导体器件传送到测试托盘上。本发明可以使单位操作中的批量增加一倍，以提高设备运行率。此外，可以减少装置加载时间和卸载，从而可以增加在单元操作中处理的装置的数量。

2. 发明授权

US06651817B2 Test tray insert of test handler 有权
标题翻译：测试托盘的测试盘插入
公开(公告)号：US06651817B2
公开(公告)日：2003-11-25
申请号：US09981486
申请日：2001-10-17
申请人： Jae-Gyun Shim , Seung-Won Jeon , Yun-Sung Na , In-Gu Jeon
发明人： Jae-Gyun Shim , Seung-Won Jeon , Yun-Sung Na , In-Gu Jeon
IPC分类号： B65D8530
CPC分类号： G01R1/04 , G01R31/01 , G01R31/2893 , H01L21/6835
摘要： A test tray insert of a test handler is provided including a housing, a locker, and a stopper, where one end side of the stopper is hinged on the inside of the mounting hole and the other end side of the stopper is protruded to the receiving hole so that the stopper fixes the device. The housing includes a receiving hole for loading a device in the enter of the receiving hole, and a mounting hole, extended from both sides of the receiving hole, including a joint jaw. The housing further includes a base protrusion placed n both ends of the bottom of the receiving hole and a supporting protrusion placed in both sides of the base protrusion.
摘要翻译：提供了一种测试处理机的测试盘插入件，包括壳体，储物柜和止动器，止动器的一端侧铰接在安装孔的内侧，止动件的另一端侧突出到接收器孔，使得止动器固定该装置。壳体包括用于将装置装载在接收孔的入口中的接收孔以及包括接合钳口的从容纳孔的两侧延伸的安装孔。所述壳体还包括在所述容纳孔的底部的两端部和设置在所述基部突起的两侧的支撑突起的基部突出部。

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