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    • 1. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US08493135B2
    • 2013-07-23
    • US13100991
    • 2011-05-04
    • Jae-Boum Park
    • Jae-Boum Park
    • G05F1/10
    • H02M1/36H02M3/07H02M2001/0041
    • A semiconductor integrated circuit includes a pre-charge signal generator configured to pre-charge a plurality of oscillation signals to a certain voltage level in a pre-charge mode, wherein the pre-charge signal generator includes: a first storage unit for storing a first pre-charge oscillation signal in response to a reference oscillation signal, a feedback unit for feeding back a second pre-charge oscillation signal, a second storage unit for storing the second pre-charge oscillation signal corresponding to an output signal of the first storage unit in response to the reference oscillation signal, and a pre-charge signal output unit for outputting a pre-charge signal in response to the first pre-charge oscillation signal and the second pre-charge oscillation signal.
    • 半导体集成电路包括预充电信号发生器,其被配置为在预充电模式下将多个振荡信号预充电到一定电压电平,其中所述预充电信号发生器包括:第一存储单元,用于存储第一 响应于参考振荡信号的预充电振荡信号,用于反馈第二预充电振荡信号的反馈单元,用于存储与第一存储单元的输出信号相对应的第二预充电振荡信号的第二存储单元 响应于参考振荡信号,以及预充电信号输出单元,用于响应于第一预充电振荡信号和第二预充电振荡信号而输出预充电信号。
    • 2. 发明授权
    • Test entry circuit and method for generating test entry signal
    • 测试录入电路和产生测试录入信号的方法
    • US07949923B2
    • 2011-05-24
    • US12165008
    • 2008-06-30
    • Jae-Boum Park
    • Jae-Boum Park
    • G06F11/263G06F11/30
    • G11C29/06G11C29/46
    • Test entry circuit and method for generating test entry signal including a first source signal generator configured to receive a test signal through a pad to generate a first mode source signal for a first test mode, a second source signal generator configured to count activation transitions of the test signal to generate a second mode source signal for a second test mode and an entry signal generator configured to receive the first and second mode source signals to generate a first test mode entry signal for entering the first test mode and a second test mode entry signal for entering the second test mode.
    • 用于生成测试入口信号的测试入口电路和方法,包括第一源信号发生器,其被配置为通过焊盘接收测试信号以产生用于第一测试模式的第一模式源信号;第二源信号发生器,被配置为对 测试信号以产生用于第二测试模式的第二模式源信号和输入信号发生器,其被配置为接收第一和第二模式源信号以产生用于进入第一测试模式的第一测试模式输入信号和第二测试模式输入信号 进入第二个测试模式。
    • 3. 发明授权
    • Internal voltage generation circuit
    • 内部电压产生电路
    • US07786791B2
    • 2010-08-31
    • US12130623
    • 2008-05-30
    • Jae-Boum Park
    • Jae-Boum Park
    • G05F1/10
    • H02M1/088H02M3/07
    • Internal voltage generation circuit including a reference oscillation signal generator for generating a reference oscillation signal according to a comparison result of a pumping voltage with a reference voltage, an oscillation signal generator for generating a plurality of oscillation signals with a predetermined phase difference and a pumping voltage generator for generating a pumping voltage through sequential charge pumping operations performed in response to the plurality of oscillation signals, respectively.
    • 内部电压产生电路,包括用于根据具有参考电压的泵浦电压的比较结果产生参考振荡信号的参考振荡信号发生器,用于产生具有预定相位差的多个振荡信号的振荡信号发生器和泵浦电压 发生器,用于通过分别响应于所述多个振荡信号执行的顺序电荷泵送操作产生泵浦电压。
    • 4. 发明授权
    • Core voltage generation circuit
    • 核心电压发生电路
    • US07671668B2
    • 2010-03-02
    • US12164275
    • 2008-06-30
    • Jae-Boum Park
    • Jae-Boum Park
    • G05F1/10
    • G05F1/565
    • A core voltage generation circuit includes a comparator configured to perform a differential comparison of a reference voltage and a feedback core voltage. An amplifier is configured to amplify the external power supply voltage in response to an output signal of the comparator to generate the core voltage. A control switch is configured to form a current path of the comparator using different switch units according to a voltage level of an external power supply voltage input to the core voltage generation circuit.
    • 核心电压产生电路包括比较器,被配置为执行参考电压和反馈核心电压的差分比较。 放大器被配置为响应于比较器的输出信号放大外部电源电压以产生核心电压。 控制开关被配置为根据输入到核心电压产生电路的外部电源电压的电压电平,使用不同的开关单元形成比较器的电流路径。
    • 6. 发明授权
    • Internal voltage generation circuit
    • 内部电压产生电路
    • US07961036B2
    • 2011-06-14
    • US12847451
    • 2010-07-30
    • Jae-Boum Park
    • Jae-Boum Park
    • G05F1/10
    • H02M1/088H02M3/07
    • Internal voltage generation circuit including a reference oscillation signal generator for generating a reference oscillation signal according to a comparison result of a pumping voltage with a reference voltage, an oscillation signal generator for generating a plurality of oscillation signals with a predetermined phase difference and a pumping voltage generator for generating a pumping voltage through sequential charge pumping operations performed in response to the plurality of oscillation signals, respectively.
    • 内部电压产生电路,包括用于根据具有参考电压的泵浦电压的比较结果产生参考振荡信号的参考振荡信号发生器,用于产生具有预定相位差的多个振荡信号的振荡信号发生器和泵浦电压 发生器,用于通过分别响应于所述多个振荡信号执行的顺序电荷泵送操作产生泵浦电压。