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1. 发明申请

US20040184649A1 Granular product inspection device 有权
标题翻译：颗粒产品检验装置
公开(公告)号：US20040184649A1
公开(公告)日：2004-09-23
申请号：US10740244
申请日：2003-12-18
申请人： J.M. Canty Inc.
发明人： Thomas M. Canty , Paul J. O'Brien , Christian P. Marks , Richard E. Owen
IPC分类号： G06K009/00
CPC分类号： G01N15/1475 , G01N15/1427 , G01N15/147 , G01N21/88 , G01N2015/0019 , G01N2015/025 , G01N2015/144 , G01N2015/1472 , G01N2015/1497
摘要： An inspection device for inspecting a granular product includes a feed tray having a receiving region for receiving the granular product and an imaging region and a vibration device configured to impart vibrations to the feed tray for moving granules of the granular product from the receiving region to the imaging region. The inspection device also includes an image capturing device configured to capture an image of a sample of the granular product in an image area of the imaging region. In addition, a method for inspecting a granular product includes disposing the granular product on a receiving region of a feed tray, vibrating the feed tray so as to induce a movement of the granular product from the receiving region of the feed tray to an imaging region of the feed tray, and capturing an image of a sample of the granular product in an image area of the imaging region.
摘要翻译：用于检查颗粒状产品的检查装置包括具有用于接收颗粒产品的接收区域和成像区域的进给托盘和被配置为向进料托盘施加振动的振动装置，用于将颗粒状产品的颗粒从接收区移动到成像区域。检查装置还包括被配置为在成像区域的图像区域中捕获粒状产品的样本的图像的图像捕获装置。此外，用于检查颗粒产品的方法包括将颗粒状产品放置在进料盘的接收区域上，使进料盘振动，以引起粒状产物从进料盘的接收区域移动到成像区域并且在成像区域的图像区域中捕获粒状产品的样本的图像。

2. 发明申请

US20040189991A1 Rocksizer 有权
公开(公告)号：US20040189991A1
公开(公告)日：2004-09-30
申请号：US10400723
申请日：2003-03-27
申请人： J.M. Canty Inc.
发明人： Thomas Canty , Paul O'Brien , Christian P. Marks , Richard E. Owen
IPC分类号： G01N015/02
CPC分类号： G01N15/1475 , G01N15/1425 , G01N15/147 , G01N21/85 , G01N2015/0019 , G01N2015/1472 , G01N2015/1497 , G01N2021/8592
摘要： A particle inspection device includes a feeder configured to drop a particle through an image area, a reflector configured to provide a reflected view of the particle in the image area, and an image capturing device configured to capture an image of the particle in the image area such that the image includes at least a direct view of the particle and the reflected view of the particle. In addition, a method for inspecting a particle includes dropping the particle through an image area, providing a reflected view of the particle in the image area using a reflector, and capturing an image of the particle in the image area using an image capturing device so that the image includes a direct view of the particle and the reflected view of the particle.
摘要翻译：粒子检测装置包括：配置成将粒子落入图像区域的送料器;配置成在图像区域中提供粒子的反射视图的反射器;以及被配置为捕获图像区域中的粒子的图像的图像捕获装置使得图像至少包括颗粒的直接视图和颗粒的反射视图。此外，用于检查颗粒的方法包括：通过图像区域滴下颗粒，使用反射器在图像区域中提供颗粒的反射视图，并使用图像捕获装置捕获图像区域中的颗粒的图像，从而图像包括粒子的直接视图和粒子的反射视图。

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