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    • 2. 发明授权
    • Method of purifying alkaline solution and method of etching
semiconductor wafers
    • 碱性溶液的净化方法及蚀刻半导体晶片的方法
    • US6110839A
    • 2000-08-29
    • US703645
    • 1996-08-27
    • Masami NakanoIsao UchiyamaToshio AjitoHideo Kudo
    • Masami NakanoIsao UchiyamaToshio AjitoHideo Kudo
    • C01D1/28C30B29/06C30B33/10H01L21/308B44C1/22
    • C01D1/28
    • A method of purifying an alkaline solution includes dissolving metallic silicon and/or silicon compounds in the alkaline solution and non-ionizing metallic ions in the alkaline solution with reaction products generated when the metallic silicon and/or silicon compounds are dissolved therein. This purifying method is capable of remarkably decreasing metallic ions in the alkaline solution at a low-cost by an easy operation. A method of etching semiconductor wafers includes purifying an alkaline solution by non-ionizing metallic ions in the alkaline solution and etching the semiconductor wafers by using the purified alkaline solution. According to this etching method, the metallic contamination level due to the etching of the semiconductor wafers is greatly decreased, there being neither deterioration in the wafer quality nor deterioration in the characteristic of the semiconductor device.
    • 纯化碱性溶液的方法包括在金属硅和/或硅化合物溶解时产生的反应产物将金属硅和/或硅化合物溶解在碱性溶液中,并在碱性溶液中溶解非电离金属离子。 该纯化方法能够通过简单的操作以低成本显着降低碱性溶液中的金属离子。 蚀刻半导体晶片的方法包括通过在碱性溶液中非离子化金属离子来纯化碱性溶液,并通过使用纯化的碱性溶液蚀刻半导体晶片。 根据该蚀刻方法,由于半导体晶片的蚀刻而导致的金属污染程度大大降低,晶片质量不会降低,也不会降低半导体器件的特性。