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1. 发明申请

US20150219715A1 METHODS AND DEVICES FOR THE COMPUTER-AIDED DETERMINATION OF DEVIATION PATTERNS DURING THE PRODUCTION AND/OR TESTING OF A MULTIPLICITY OF DIES AND COMPUTER PROGRAM PRODUCTS 有权
标题翻译：计算机辅助设计在计算机和计算机程序产品的生产和/或测试过程中用于确定偏差模式的方法和设备
公开(公告)号：US20150219715A1
公开(公告)日：2015-08-06
申请号：US14612343
申请日：2015-02-03
申请人： Infineon Technologies AG
发明人： Reinhard Schachtner , Gerhard Poeppel
IPC分类号： G01R31/28
CPC分类号： G01R31/2834 , G01N21/9501 , G01R31/2601 , G01R31/2894 , G01R31/31707 , G01R31/3185 , G06T2207/30148 , H01L22/20 , H01L22/34
摘要： In various embodiments, a method for the computer-aided determination of deviation patterns during at least one of the production or testing of a multiplicity of dies is provided. The dies are uniquely identified. The method may include determining, for each die of the multiplicity of dies and for at least one measurement process of a plurality of measurement processes which are applied to at least one portion of the dies, a measurement value which was determined in the measurement process for the respective die; and carrying out a blind source separation using the measurement values, thereby determining the deviation patterns for the dies.
摘要翻译：在各种实施例中，提供了一种在多个管芯的生产或测试中的至少一个中计算机辅助确定偏差图案的方法。模具被唯一标识。该方法可以包括针对多个管芯的每个管芯以及施加到管芯的至少一部分的多个测量过程的至少一个测量过程来确定在测量过程中确定的测量值相应的模具; 并使用测量值进行盲源分离，从而确定模具的偏离图案。

2. 发明授权

US10209212B2 Sensor arrangement for particle analysis and a method for particle analysis 有权
公开(公告)号：US10209212B2
公开(公告)日：2019-02-19
申请号：US15043701
申请日：2016-02-15
申请人： Infineon Technologies AG
发明人： Guenther Ruhl , Thomas Hirsch , Gerhard Poeppel , Herbert Roedig
IPC分类号： G01R17/00 , G01N27/22 , G01N15/10
摘要： According to various embodiments, a sensor arrangement for particle analysis may include: a base electrode configured to generate an electrical field for particle attraction; a support layer disposed over the base electrode; a sensor array disposed over the support layer and including or formed from a plurality of sensor elements, wherein each sensor element of the plurality of sensor elements is configured to generate or modify an electrical signal in response to a particle at least one of adsorbed to and approaching the sensor element; and an electrical contact structure may include or be formed from a plurality of contact lines, wherein each contact line of the plurality of contact lines is electrically connected to a respective sensor element of the plurality of sensor elements, such that each sensor element of the plurality of sensor elements is addressable via the contact structure.

3. 发明授权

US10573533B2 Method of reducing a sheet resistance in an electronic device, and an electronic device 有权
公开(公告)号：US10573533B2
公开(公告)日：2020-02-25
申请号：US16116210
申请日：2018-08-29
申请人： Infineon Technologies AG
发明人： Edward Fuergut , Irmgard Escher-Poeppel , Stephanie Fassl , Paul Ganitzer , Gerhard Poeppel , Werner Schustereder , Harald Wiedenhofer
IPC分类号： H01L21/324 , H01L23/31 , H01L21/268 , H01L21/04 , H01L21/225 , H01L21/285
摘要： Various embodiments provide a method of reducing a sheet resistance in an electronic device encapsulated at least partially in an encapsulation material, wherein the method comprises: providing an electronic device comprising a multilayer structure and being at least partially encapsulated by an encapsulation material; and locally introducing energy into the multilayer structure for reducing a sheet resistance.

4. 发明申请

US20190013210A1 METHOD OF REDUCING A SHEET RESISTANCE IN AN ELECTRONIC DEVICE, AND AN ELECTRONIC DEVICE 审中-公开
公开(公告)号：US20190013210A1
公开(公告)日：2019-01-10
申请号：US16116210
申请日：2018-08-29
申请人： Infineon Technologies AG
发明人： Edward Fuergut , Irmgard Escher-Poeppel , Stephanie Fassl , Paul Ganitzer , Gerhard Poeppel , Werner Schustereder , Harald Wiedenhofer
IPC分类号： H01L21/324 , H01L21/285 , H01L21/225 , H01L21/04 , H01L21/321 , H01L21/268 , H01L23/31
CPC分类号： H01L21/324 , H01L21/0455 , H01L21/0485 , H01L21/2254 , H01L21/2258 , H01L21/268 , H01L21/28512 , H01L21/28575 , H01L23/3157
摘要： Various embodiments provide a method of reducing a sheet resistance in an electronic device encapsulated at least partially in an encapsulation material, wherein the method comprises: providing an electronic device comprising a multilayer structure and being at least partially encapsulated by an encapsulation material; and locally introducing energy into the multilayer structure for reducing a sheet resistance.

5. 发明授权

US09201007B2 Device for determination of gas concentration 有权
标题翻译：气体浓度测定装置
公开(公告)号：US09201007B2
公开(公告)日：2015-12-01
申请号：US13851879
申请日：2013-03-27
申请人： Infineon Technologies AG
发明人： Dieter Kohlert , Gerhard Poeppel , Franz Schreier
IPC分类号： G01J3/00 , G01N21/61 , G01N21/3504 , G01N21/35
CPC分类号： G01N21/61 , G01N21/3504 , G01N2021/3513 , G01N2021/3595 , G01N2201/0636
摘要： A device can be used for establishing gas concentrations in an examination volume. A radiation source is configured to generate an electromagnetic beam. A beam guiding apparatus is arranged downstream of the radiation source. The beam guiding apparatus is configured to set a plurality of variations of beam guidance of the beam entering the beam guiding apparatus in an observation plane in the examination volume. A spectrometer is arranged downstream of the beam guiding apparatus. The spectrometer is configured to carry out a spectral analysis of the beam leaving the beam guiding apparatus. An evaluation unit is configured to establish in the observation plane a 2D concentration distribution for one or more gases in the examination volume on the basis of the spectral analysis for different variations of beam guidance.
摘要翻译：一种装置可用于建立检查体积中的气体浓度。辐射源被配置为产生电磁波束。光束引导装置布置在辐射源的下游。光束引导装置被配置为在检查体积中的观察平面中设置进入光束引导装置的光束的多个波束引导变化。光谱仪布置在光束引导装置的下游。光谱仪被配置为对离开光束引导装置的光束进行光谱分析。评估单元被配置为基于对波束引导的不同变化的频谱分析，在观察平面中建立检查体积中的一种或多种气体的2D浓度分布。

6. 发明授权

US11531056B2 Predictive chip-maintenance 有权
公开(公告)号：US11531056B2
公开(公告)日：2022-12-20
申请号：US16849931
申请日：2020-04-15
申请人： Infineon Technologies AG
发明人： Irmgard Escher-Poeppel , Thorsten Meyer , Gerhard Poeppel
IPC分类号： G01R31/26 , G01R31/28 , G01R31/316 , H01L23/60
摘要： The disclosure describes to techniques for detecting field failures or performance degradation of circuits, including integrated circuits (IC), by including additional contacts, i.e. terminals, along with the functional contacts that used for connecting the circuit to a system in which the circuit is a part. These additional contacts may be used to measure dynamic changing electrical characteristics over time e.g. voltage, current, temperature and impedance. These electrical characteristics may be representative of a certain failure mode and may be an indicator for circuit state-of-health (SOH), while the circuit is performing in the field.

7. 发明申请

US20210325445A1 PREDICTIVE CHIP-MAINTENANCE 有权
公开(公告)号：US20210325445A1
公开(公告)日：2021-10-21
申请号：US16849931
申请日：2020-04-15
申请人： Infineon Technologies AG
发明人： Irmgard Escher-Poeppel , Thorsten Meyer , Gerhard Poeppel
IPC分类号： G01R31/26 , G01R31/28 , G01R31/316 , H01L23/60
摘要： The disclosure describes to techniques for detecting field failures or performance degradation of circuits, including integrated circuits (IC), by including additional contacts, i.e. terminals, along with the functional contacts that used for connecting the circuit to a system in which the circuit is a part. These additional contacts may be used to measure dynamic changing electrical characteristics over time e.g. voltage, current, temperature and impedance. These electrical characteristics may be representative of a certain failure mode and may be an indicator for circuit state-of-health (SOH), while the circuit is performing in the field.

8. 发明授权

US09970983B2 Methods and devices for the computer-aided determination of deviation patterns during the production and/or testing of a multiplicity of dies and computer program products 有权
公开(公告)号：US09970983B2
公开(公告)日：2018-05-15
申请号：US14612343
申请日：2015-02-03
申请人： Infineon Technologies AG
发明人： Reinhard Schachtner , Gerhard Poeppel
IPC分类号： G01R31/28 , G01R31/26 , G01R31/3185 , H01L21/66 , G01N21/95 , G01R31/317
CPC分类号： G01R31/2834 , G01N21/9501 , G01R31/2601 , G01R31/2894 , G01R31/31707 , G01R31/3185 , G06T2207/30148 , H01L22/20 , H01L22/34
摘要： In various embodiments, a method for the computer-aided determination of deviation patterns during at least one of the production or testing of a multiplicity of dies is provided. The dies are uniquely identified. The method may include determining, for each die of the multiplicity of dies and for at least one measurement process of a plurality of measurement processes which are applied to at least one portion of the dies, a measurement value which was determined in the measurement process for the respective die; and carrying out a blind source separation using the measurement values, thereby determining the deviation patterns for the dies.

9. 发明申请

US20130258315A1 Device for Determination of Gas Concentration 有权
标题翻译：气体浓度测定装置
公开(公告)号：US20130258315A1
公开(公告)日：2013-10-03
申请号：US13851879
申请日：2013-03-27
申请人： INFINEON TECHNOLOGIES AG
发明人： Dieter Kohlert , Gerhard Poeppel , Franz Schreier
IPC分类号： G01N21/61
CPC分类号： G01N21/61 , G01N21/3504 , G01N2021/3513 , G01N2021/3595 , G01N2201/0636
摘要： A device can be used for establishing gas concentrations in an examination volume. A radiation source is configured to generate an electromagnetic beam. A beam guiding apparatus is arranged downstream of the radiation source. The beam guiding apparatus is configured to set a plurality of variations of beam guidance of the beam entering the beam guiding apparatus in an observation plane in the examination volume. A spectrometer is arranged downstream of the beam guiding apparatus. The spectrometer is configured to carry out a spectral analysis of the beam leaving the beam guiding apparatus. An evaluation unit is configured to establish in the observation plane a 2D concentration distribution for one or more gases in the examination volume on the basis of the spectral analysis for different variations of beam guidance.
摘要翻译：一种装置可用于建立检查体积中的气体浓度。辐射源被配置为产生电磁波束。光束引导装置布置在辐射源的下游。光束引导装置被配置为在检查体积中的观察平面中设置进入光束引导装置的光束的多个波束引导变化。光谱仪布置在光束引导装置的下游。光谱仪被配置为对离开光束引导装置的光束进行光谱分析。评估单元被配置为基于对波束引导的不同变化的频谱分析，在观察平面中建立检查体积中的一种或多种气体的2D浓度分布。

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