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1. 发明授权

US11161216B2 Belt grinder 有权
公开(公告)号：US11161216B2
公开(公告)日：2021-11-02
申请号：US16191224
申请日：2018-11-14
申请人： INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
发明人： Hsiang-Nien Chung , Hung-Hsiu Yu , Kuo-Feng Hung
IPC分类号： B24B21/06 , B24B21/14 , B24B21/16 , B24B21/22 , B24B21/00
摘要： This disclosure relates to a belt grinder includes frame and first grinding assembly. The first grinding assembly includes transmission roller set, grinding belt and adjusting assembly. The transmission roller set includes driving roller and driven roller. Both the driving roller and the driven roller are rotatably disposed on the frame. The grinding belt is installed over the driving roller and the driven roller. The adjusting assembly includes rotatable component and contact rollers. The rotatable component is rotatably disposed on the frame. Rotation axis of the rotatable component is parallel to rotation axis of the driving roller. The contact rollers are rotatably disposed on the rotatable component. Contact rollers are different in shape. The rotatable component is rotatable with respect to the frame so as to force one of the contact rollers to contact or to be separated from the grinding belt.

2. 发明申请

US20200156211A1 METHOD AND SYSTEM FOR CONTROLLING POLISHING AND GRINDING 审中-公开
公开(公告)号：US20200156211A1
公开(公告)日：2020-05-21
申请号：US16233859
申请日：2018-12-27
申请人： Industrial Technology Research Institute
发明人： Cheng-Peng Kuan , Chih-Hsuan Shih , Kuo-Feng Hung , Yen-Chung Chang , Hung-Hsiu Yu
IPC分类号： B24B51/00 , B25J11/00 , B24B21/16 , B24B49/00
摘要： A method for controlling polishing and grinding is provided, including: generating an initial polishing and grinding trajectory for robot movements based on a three-dimensional contour of a work piece; adjusting the initial polishing and grinding trajectory based on a first optimized adjustment value and generating an optimized polishing and grinding trajectory; and evaluating the polishing and grinding quality of the work piece and using the polishing and grinding quality to generate a second optimized adjustment value.

3. 发明授权

US10261025B2 Workpiece surface detection method and system using the same 有权
公开(公告)号：US10261025B2
公开(公告)日：2019-04-16
申请号：US15392325
申请日：2016-12-28
申请人： INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
发明人： Wei-Yao Chiu , Kuo-Feng Hung , Yu-Ting Lin , Keng-Hao Chang
IPC分类号： G01N21/88 , G01N1/42
摘要： A detecting method for a workpiece surface includes the following steps. Firstly, a workpiece is provided with a first environment, wherein the first environment has a first environmental temperature higher than a first saturation temperature corresponding to an environmental-relative humidity. Then, the workpiece is provided with a second environment, wherein the second environment has a second environmental temperature lower than the first environmental temperature, such that a itself-temperature of the workpiece reduces to a mist temperature, wherein the mist temperature is substantially equal to or higher than the second environmental temperature. Then, the workpiece is provided with a mist environment, wherein the mist environment has a mist-saturation temperature corresponding to a mist-environmental relative humidity is equal to or higher than the mist temperature for misting a surface of the workpiece. Then, the surface of the misted workpiece is detected.

4. 发明授权

US09456536B2 Method for pins detection and insertion of electronic component 有权
标题翻译：引脚检测和插入电子元件的方法
公开(公告)号：US09456536B2
公开(公告)日：2016-09-27
申请号：US14074960
申请日：2013-11-08
申请人： Industrial Technology Research Institute
发明人： Kuo-Feng Hung , Yung-Jung Chang , Yen-Chia Peng
IPC分类号： H05K13/00 , H05K13/08 , H05K3/30
CPC分类号： H05K13/0015 , H05K3/306 , H05K13/08 , H05K13/0812 , Y10T29/49004 , Y10T29/53174
摘要： A method and system for pins detection and insertion of an electronic component are provided. The method includes picking an electronic component having a plurality of pins by a pick and place device, acquiring a plurality of serial images with respect to the plurality of pins at different height along an image acquiring direction by an image acquiring device, separately detecting image positions corresponding to the plurality of pins in the plurality of serial images, determining whether the electronic component is qualified according to a distance between the image positions of two adjacent pins, and if the electronic component is qualified, inserting the electronic component to a circuit board according to a position relationship between the image positions of the pins and a geometric center position of the pick and place device.
摘要翻译：提供了一种用于针检测和插入电子部件的方法和系统。该方法包括通过拾取和放置装置拾取具有多个销的电子部件，通过图像获取装置沿着图像获取方向获取与多个针脚相对于多个针脚的多个串行图像，分别检测图像位置对应于多个串行图像中的多个引脚，根据两个相邻引脚的图像位置之间的距离来确定电子元件是否合格，并且如果电子元件合格，则将电子元件插入到电路板中到针脚的图像位置与拾放装置的几何中心位置之间的位置关系。

5. 发明授权

US11562527B2 Labeling method, labeling device using the same, pick-and-place system using the same, pick-and-place method using the same and non-transitory computer readable medium using the same 有权
公开(公告)号：US11562527B2
公开(公告)日：2023-01-24
申请号：US17364072
申请日：2021-06-30
申请人： INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
发明人： Cheng-Han Tsai , Kuo-Feng Hung
IPC分类号： G06T15/08 , B65C9/02 , B65C9/40 , G06T7/70 , G06V20/40 , G06V20/64
摘要： A method further includes the following steps. Firstly, a three-dimensional picture under a generated background condition is generated, wherein the three-dimensional picture includes a three-dimensional object image. Then, a two-dimensional picture of the three-dimensional picture is captured, wherein the two-dimensional picture includes a two-dimensional object image of the three-dimensional object image. Then, an object region of the two-dimensional object image is recognized. Then, an exposed ratio of an exposed area of an exposed region of the object region to an object area of the object region is obtained. Then, whether the exposed ratio is greater than a preset ratio is determined. Then the exposed region is defined as the pick-and-place region when the exposed ratio is greater than the preset ratio.

6. 发明申请

US20180128750A1 WORKPIECE SURFACE DETECTION METHOD AND SYSTEM USING THE SAME 审中-公开
公开(公告)号：US20180128750A1
公开(公告)日：2018-05-10
申请号：US15392325
申请日：2016-12-28
申请人： INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
发明人： Wei-Yao Chiu , Kuo-Feng Hung , Yu-Ting Lin , Keng-Hao Chang
IPC分类号： G01N21/88 , G01N1/42
CPC分类号： G01N21/8806 , G01N1/42
摘要： A detecting method for a workpiece surface includes the following steps. Firstly, a workpiece is provided with a first environment, wherein the first environment has a first environmental temperature higher than a first saturation temperature corresponding to an environmental-relative humidity. Then, the workpiece is provided with a second environment, wherein the second environment has a second environmental temperature lower than the first environmental temperature, such that a itself-temperature of the workpiece reduces to a mist temperature, wherein the mist temperature is substantially equal to or higher than the second environmental temperature. Then, the workpiece is provided with a mist environment, wherein the mist environment has a mist-saturation temperature corresponding to a mist-environmental relative humidity is equal to or higher than the mist temperature for misting a surface of the workpiece. Then, the surface of the misted workpiece is detected.

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