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    • 9. 发明申请
    • SEMICONDUCTOR WAFER AND METHOD FOR AUTO-CALIBRATING INTEGRATED CIRCUIT CHIPS USING PLL AT WAFER LEVEL
    • 半导体波形和使用PLL在水平方向自动校准集成电路芯片的方法
    • US20130278309A1
    • 2013-10-24
    • US13605554
    • 2012-09-06
    • Hyunseok KIMSu Na ChoiHeyung Sub LeeCheol Sig Pyo
    • Hyunseok KIMSu Na ChoiHeyung Sub LeeCheol Sig Pyo
    • H03L7/06
    • G06K19/0726G06K19/0722
    • In integrated circuit chips that are used for RFID, a method of calibrating an operation frequency that is generated in an operation frequency generator and a semiconductor wafer including a calibration circuit are provided. The method of calibrating an operation frequency of integrated circuit chips includes: supplying DC power to the integrated circuit chips; selecting an integrated circuit chip to perform calibration of an operation frequency; receiving an operation frequency that is generated in the selected integrated circuit chip; calculating a difference between a phase of the operation frequency and a phase of a calibration target frequency; generating a frequency calibration value of the operation frequency using the phase difference; transmitting a control signal including the frequency calibration value to the integrated circuit chip; and releasing a selection of the integrated circuit chip in which calibration of the operation frequency is complete.
    • 在用于RFID的集成电路芯片中,提供校准在操作频率发生器中产生的操作频率的方法和包括校准电路的半导体晶片。 校准集成电路芯片的工作频率的方法包括:向集成电路芯片提供直流电力; 选择集成电路芯片来执行操作频率的校准; 接收在所选集成电路芯片中产生的工作频率; 计算操作频率的相位和校准目标频率的相位之间的差; 使用相位差产生运转频率的频率校准值; 将包括所述频率校准值的控制信号发送到所述集成电路芯片; 并且释放其中操作频率的校准完成的集成电路芯片的选择。
    • 10. 发明授权
    • Semiconductor wafer and method for auto-calibrating integrated circuit chips using PLL at wafer level
    • 半导体晶片和方法,用于在晶片级使用PLL自动校准集成电路芯片
    • US09030217B2
    • 2015-05-12
    • US13605554
    • 2012-09-06
    • Hyunseok KimSu Na ChoiHeyung Sub LeeCheol Sig Pyo
    • Hyunseok KimSu Na ChoiHeyung Sub LeeCheol Sig Pyo
    • G06K19/07
    • G06K19/0726G06K19/0722
    • In integrated circuit chips that are used for RFID, a method of calibrating an operation frequency that is generated in an operation frequency generator and a semiconductor wafer including a calibration circuit are provided. The method of calibrating an operation frequency of integrated circuit chips includes: supplying DC power to the integrated circuit chips; selecting an integrated circuit chip to perform calibration of an operation frequency; receiving an operation frequency that is generated in the selected integrated circuit chip; calculating a difference between a phase of the operation frequency and a phase of a calibration target frequency; generating a frequency calibration value of the operation frequency using the phase difference; transmitting a control signal including the frequency calibration value to the integrated circuit chip; and releasing a selection of the integrated circuit chip in which calibration of the operation frequency is complete.
    • 在用于RFID的集成电路芯片中,提供校准在操作频率发生器中产生的操作频率的方法和包括校准电路的半导体晶片。 校准集成电路芯片的工作频率的方法包括:向集成电路芯片提供直流电力; 选择集成电路芯片来执行操作频率的校准; 接收在所选集成电路芯片中产生的工作频率; 计算操作频率的相位和校准目标频率的相位之间的差; 使用相位差产生运转频率的频率校准值; 将包括所述频率校准值的控制信号发送到所述集成电路芯片; 并且释放其中操作频率的校准完成的集成电路芯片的选择。