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    • 2. 发明申请
    • SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF
    • 半导体存储器件及其工作方法
    • US20120327718A1
    • 2012-12-27
    • US13531998
    • 2012-06-25
    • Hyung Min LEE
    • Hyung Min LEE
    • G11C16/10
    • G11C16/06G11C11/5628G11C16/0483G11C16/345
    • An operating method of a semiconductor memory device includes performing a first LSB program loop for storing first LSB data in first memory cells of a word line, performing a second LSB program loop for storing second LSB data in second memory cells of the selected word line and for detecting over-erased memory cells having threshold voltages lower than an over-erase reference voltage of a negative potential to raise the threshold voltages to be higher than the over-erase reference voltage, performing a first MSB program loop for storing first MSB data in the first memory cells, and performing a second MSB program loop for storing second MSB data in the second memory cells.
    • 半导体存储器件的操作方法包括:执行第一LSB程序循环,用于将第一LSB数据存储在字线的第一存储单元中,执行用于将第二LSB数据存储在所选字线的第二存储器单元中的第二LSB程序循环;以及 用于检测具有低于负电位的过擦除参考电压的阈值电压的过擦除存储器单元,以将阈值电压升高到高于过擦除参考电压,执行用于存储第一MSB数据的第一MSB程序循环 第一存储器单元,并且执行用于在第二存储器单元中存储第二MSB数据的第二MSB程序循环。