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1. 发明授权

US07368928B2 Vertical type high frequency probe card 有权
标题翻译：垂直式高频探针卡
公开(公告)号：US07368928B2
公开(公告)日：2008-05-06
申请号：US11511285
申请日：2006-08-29
申请人： Hsin-Hung Lin , Shih-Cheng Wu , Wei-Cheng Ku , Chien-Liang Chen , Ming-Chi Chen , Hendra Sudin
发明人： Hsin-Hung Lin , Shih-Cheng Wu , Wei-Cheng Ku , Chien-Liang Chen , Ming-Chi Chen , Hendra Sudin
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R1/07371 , G01R1/06772
摘要： A vertical-type probe card includes a circuit board, which has signal circuits and grounding circuits arranged in such a manner that each signal circuit is disposed in parallel and adjacent to one grounding circuit and kept a predetermined distance from the grounding circuit, and a probe assembly, which is arranged at the bottom side of the circuit board and has an upper guide plate, a lower guide plate, a conducting layer provided on the lower guide plate, a plurality of signal probes respectively electrically connected to the signal circuits and adjacent to a plurality of compensation probes, and at least one grounding probe electrically connected to the grounding circuits in a manner that the signal, compensation and grounding probes are vertically inserted through the upper and lower guide plates, and the conducting layer is conducted with the compensation probe and the grounding probe while electrically insulated to the signal probe.
摘要翻译：垂直型探针卡包括电路板，其具有信号电路和接地电路，其布置成使得每个信号电路并联并且邻近一个接地电路并且与接地电路保持预定距离，并且探针组件，其布置在电路板的底侧，并具有上引导板，下引导板，设置在下引导板上的导电层，多个信号探头，分别电连接到信号电路并邻近多个补偿探针和至少一个接地探针，以使得信号，补偿和接地探针垂直插入上，下引导板的方式电连接到接地电路，并且导电层通过补偿探针和接地探头，同时与信号探头电绝缘。

2. 发明申请

US20080054918A1 VERTICAL TYPE HIGH FREQUENCY PROBE CARD 有权
标题翻译：垂直型高频探头卡
公开(公告)号：US20080054918A1
公开(公告)日：2008-03-06
申请号：US11511285
申请日：2006-08-29
申请人： Hsin-Hung Lin , Shih-Cheng Wu , Wei-Cheng Ku , Chien-Liang Chen , Ming-Chi Chen , Hendra Sudin
发明人： Hsin-Hung Lin , Shih-Cheng Wu , Wei-Cheng Ku , Chien-Liang Chen , Ming-Chi Chen , Hendra Sudin
IPC分类号： G01R31/02
CPC分类号： G01R1/07371 , G01R1/06772
摘要： A vertical-type probe card includes a circuit board, which has signal circuits and grounding circuits arranged in such a manner that each signal circuit is disposed in parallel and adjacent to one grounding circuit and kept a predetermined distance from the grounding circuit, and a probe assembly, which is arranged at the bottom side of the circuit board and has an upper guide plate, a lower guide plate, a conducting layer provided on the lower guide plate, a plurality of signal probes respectively electrically connected to the signal circuits and adjacent to a plurality of compensation probes, and at least one grounding probe electrically connected to the grounding circuits in a manner that the signal, compensation and grounding probes are vertically inserted through the upper and lower guide plates, and the conducting layer is conducted with the compensation probe and the grounding probe while electrically insulated to the signal probe.
摘要翻译：垂直型探针卡包括电路板，其具有信号电路和接地电路，其布置成使得每个信号电路并联并且邻近一个接地电路并且与接地电路保持预定距离，并且探针组件，其布置在电路板的底侧，并具有上引导板，下引导板，设置在下引导板上的导电层，多个信号探头，分别电连接到信号电路并邻近多个补偿探针和至少一个接地探针，以使得信号，补偿和接地探针垂直插入上，下引导板的方式电连接到接地电路，并且导电层通过补偿探针和接地探头，同时与信号探头电绝缘。

3. 发明授权

US07400156B2 Vertical probe device 有权
标题翻译：垂直探头装置
公开(公告)号：US07400156B2
公开(公告)日：2008-07-15
申请号：US11515731
申请日：2006-09-06
申请人： Shih-Chang Wu , Hendra Sudin , Hsin-Hung Lin , Ming-Chi Chen
发明人： Shih-Chang Wu , Hendra Sudin , Hsin-Hung Lin , Ming-Chi Chen
IPC分类号： G01R31/02 , G01R31/00
CPC分类号： G01R1/07371 , G01R1/07357
摘要： A vertical probe device includes two guide members arranged in a stack manner and defining therebetween an accommodation chamber, a probe holder plate disposed between the guide members, and a plurality of probes inserted through the guide plates and the probe holder plate in such a manner that the probes are flexible within the accommodation chamber. One of the guide plates has at least one through hole. The probe holder plate is slightly moveable in horizontal and vertical directions but fixable to one of the guide plats under a force applied through the at least one through hole to the probe holder plate while the other of the guide plates is removed, thereby preventing damage of the probes or movement of the probes during a maintenance work.
摘要翻译：垂直探针装置包括以堆叠方式布置的两个引导构件，并且在其间限定容纳室，设置在引导构件之间的探针保持板和穿过引导板和探针保持器板插入的多个探针，探头在容纳室内是柔性的。一个引导板具有至少一个通孔。探针支架板在水平和垂直方向上可稍微移动，但是在通过至少一个通孔施加到探针保持板的力的作用下可固定到一个导向平板，而另一个导板被移除，从而防止在维护工作期间探头或探头的移动。

4. 发明申请

US20080054919A1 Vertical probe device 有权
公开(公告)号：US20080054919A1
公开(公告)日：2008-03-06
申请号：US11515731
申请日：2006-09-06
申请人： Shih-Chang Wu , Hendra Sudin , Hsin-Hung Lin , Ming-Chi Chen
发明人： Shih-Chang Wu , Hendra Sudin , Hsin-Hung Lin , Ming-Chi Chen
IPC分类号： G01R31/02
CPC分类号： G01R1/07371 , G01R1/07357
摘要： A vertical probe device includes two guide members arranged in a stack manner and defining therebetween an accommodation chamber, a probe holder plate disposed between the guide members, and a plurality of probes inserted through the guide plates and the probe holder plate in such a manner that the probes are flexible within the accommodation chamber. One of the guide plates has at least one through hole. The probe holder plate is slightly moveable in horizontal and vertical directions but fixable to one of the guide plats under a force applied through the at least one through hole to the probe holder plate while the other of the guide plates is removed, thereby preventing damage of the probes or movement of the probes during a maintenance work.

5. 发明申请

US20060170440A1 Vertical probe card, probes for vertical probe card and method of making the same 审中-公开
标题翻译：垂直探针卡，垂直探针卡探针及其制作方法
公开(公告)号：US20060170440A1
公开(公告)日：2006-08-03
申请号：US11325376
申请日：2006-01-05
申请人： Hendra Sudin
发明人： Hendra Sudin
IPC分类号： G01R31/02
CPC分类号： G01R1/06716
摘要： A vertical probe card includes a circuit board and a probe set having a base and a plurality of probes provided at the base and electrically connected to the circuit board. Each probe has a foot, a tip and a middle body portion connected between the foot and the tip. The middle body portion has a coefficient of elasticity smaller than that of the base or the foot so that the middle body portion is forced to deform relative to the base when the tip touched a device under test.
摘要翻译：垂直探针卡包括电路板和探针组，探针组具有底座和设置在基座处并电连接到电路板的多个探针。每个探头具有连接在脚和尖端之间的脚，尖端和中间体部分。中间部分的弹性系数小于基部或底部的弹性系数，使得当尖端触及待测器件时，中间本体部分相对于基部被迫变形。

6. 发明授权

US07053636B2 Probe device for electrical testing an integrated circuit device and probe card using the same 失效
标题翻译：用于电气测试的探针装置，其使用集成电路装置和探针卡
公开(公告)号：US07053636B2
公开(公告)日：2006-05-30
申请号：US10709723
申请日：2004-05-25
申请人： Hendra Sudin
发明人： Hendra Sudin
IPC分类号： G01R31/02
CPC分类号： G01R1/06722 , G01R1/06733 , G01R1/07314
摘要： The present probe device comprises an insulative body, at least one supporter positioned in the insulative body, a probe positioned substantially at the center of the supporter, and a conductive wire positioned in the insulative body and electrically connected to the supporter. The supporter can be a helical spring, which connects to the probe with its inner end and to the insulative body with its outer end. In addition, the supporter may include a plurality of beams, which connects to the probe at one end and to the insulative body at the other end. The beams are positioned in a radial manner with the probe at the center, and the included angle between two adjacent beams is substantially the same. The supporter can further comprise at least one ring connecting the plurality of beams.
摘要翻译：本探针装置包括绝缘体，位于绝缘体中的至少一个支撑体，基本上位于支撑体中心的探针，以及定位在绝缘体中并与支撑体电连接的导线。支撑件可以是螺旋弹簧，其连接到具有其内端的探针和具有其外端的绝缘体。此外，支撑件可以包括多个梁，其在一端连接到探针并且在另一端连接到绝缘体。梁以径向方式定位，探头位于中心，两个相邻梁之间的夹角基本相同。支撑件还可以包括连接多个梁的至少一个环。

7. 发明申请

US20050200375A1 PROBE DEVICE AND PROBE CARD USING THE SAME 失效
标题翻译：探针装置和探针卡
公开(公告)号：US20050200375A1
公开(公告)日：2005-09-15
申请号：US10709723
申请日：2004-05-25
申请人： Hendra Sudin
发明人： Hendra Sudin
IPC分类号： G01R31/00 , G01R31/02
CPC分类号： G01R1/06722 , G01R1/06733 , G01R1/07314
摘要： The present probe device comprises an insulative body, at least one supporter positioned in the insulative body, a probe positioned substantially at the center of the supporter, and a conductive wire positioned in the insulative body and electrically connected to the supporter. The supporter can be a helical spring, which connects to the probe with its inner end and to the insulative body with its outer end. In addition, the supporter may include a plurality of beams, which connects to the probe at one end and to the insulative body at the other end. The beams are positioned in a radial manner with the probe at the center, and the included angle between two adjacent beams is substantially the same. The supporter can further comprise at least one ring connecting the plurality of beams.
摘要翻译：本探针装置包括绝缘体，位于绝缘体中的至少一个支撑体，基本上位于支撑体中心的探针，以及定位在绝缘体中并与支撑体电连接的导线。支撑件可以是螺旋弹簧，其连接到具有其内端的探针和具有其外端的绝缘体。此外，支撑件可以包括多个梁，其在一端连接到探针并且在另一端连接到绝缘体。梁以径向方式定位，探头位于中心，两个相邻梁之间的夹角基本相同。支撑件还可以包括连接多个梁的至少一个环。

8. 发明授权

US07154284B2 Integrated circuit probe card 失效
标题翻译：集成电路探针卡
公开(公告)号：US07154284B2
公开(公告)日：2006-12-26
申请号：US10905482
申请日：2005-01-06
申请人： Horng-Kuang Fan , Hendra Sudin
发明人： Horng-Kuang Fan , Hendra Sudin
IPC分类号： G01R31/02
CPC分类号： G01R1/07342
摘要： The probe card comprises a primary circuit board with a plurality of signal contacts, a probe assembly including a plurality of probes electrically connected to the signal contact and an adjusting assembly for adjusting the coplanarity between the probe assembly and a device under test. The adjusting assembly comprises a groove plate with a plurality of grooves, a wedge positioned in the groove, at least one adjusting pin connecting the wedge and the probe assembly and at least one screw positioned at one side of the wedge. The wedge comprises an inclined surface, and one end of the adjusting pin contacts the inclined surface of the wedge and the other end contacts the probe assembly. The circuit probe card moves the wedge laterally to further move the adjusting pin upwards and downwards, so that to the coplanarity between the probe assembly and the device under test can be adjusted.
摘要翻译：探针卡包括具有多个信号触点的主电路板，包括电连接到信号触点的多个探针的探针组件和用于调节探针组件和被测器件之间共面度的调节组件。调节组件包括具有多个凹槽的槽板，位于凹槽中的楔子，连接楔块和探针组件的至少一个调整销和位于楔形件一侧的至少一个螺钉。楔形件包括倾斜表面，并且调节销的一端接触楔形件的倾斜表面，另一端接触探针组件。电路探针卡横向移动楔子，以进一步向上和向下移动调节销，使得可以调节探针组件和被测器件之间的共面性。

9. 发明申请

US20060022686A1 INTEGRATED CIRCUIT PROBE CARD 失效
标题翻译：集成电路探头卡
公开(公告)号：US20060022686A1
公开(公告)日：2006-02-02
申请号：US10905482
申请日：2005-01-06
申请人： Horng-Kuang Fan , Hendra Sudin
发明人： Horng-Kuang Fan , Hendra Sudin
IPC分类号： G01R31/02
CPC分类号： G01R1/07342
摘要： The probe card comprises a primary circuit board with a plurality of signal contacts, a probe assembly including a plurality of probes electrically connected to the signal contact and an adjusting assembly for adjusting the coplanarity between the probe assembly and a device under test. The adjusting assembly comprises a groove plate with a plurality of grooves, a wedge positioned in the groove, at least one adjusting pin connecting the wedge and the probe assembly and at least one screw positioned at one side of the wedge. The wedge comprises an inclined surface, and one end of the adjusting pin contacts the inclined surface of the wedge and the other end contacts the probe assembly. The circuit probe card moves the wedge laterally to further move the adjusting pin upwards and downwards, so that to the coplanarity between the probe assembly and the device under test can be adjusted.
摘要翻译：探针卡包括具有多个信号触点的主电路板，包括电连接到信号触点的多个探针的探针组件和用于调节探针组件和被测器件之间共面度的调节组件。调节组件包括具有多个凹槽的槽板，位于凹槽中的楔子，连接楔块和探针组件的至少一个调整销和位于楔形件一侧的至少一个螺钉。楔形件包括倾斜表面，并且调节销的一端接触楔形件的倾斜表面，另一端接触探针组件。电路探针卡横向移动楔子，以进一步向上和向下移动调节销，使得可以调节探针组件和被测器件之间的共面性。

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