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    • 5. 发明授权
    • Static random access memory capable of reducing stendly power
consumption and off-leakage current
    • 静态随机存取存储器能够降低待机功耗和漏电流
    • US5764566A
    • 1998-06-09
    • US893682
    • 1997-07-11
    • Hironori AkamatsuToru IwataHisakazu Kotani
    • Hironori AkamatsuToru IwataHisakazu Kotani
    • G11C11/412G11C11/417G11C11/413
    • G11C11/412G11C11/417
    • When a memory chip is in a standby mode, a ground power supply line of a flip-flop forming a memory cell is intermittently placed in the floating state. A switching NMOS transistor is connected between the ground power supply line and a power supply VSS. The gate of the NMOS transistor is controlled by an activation signal. When entering the floating state, the ground power supply line is charged due to an off-leakage current flowing in the transistor of the memory cell. As a result, the voltage of the ground power supply line is increased from the voltage of the power supply VSS. Accordingly, the off-leakage current of the memory cell is reduced, whereby the standby-time power consumption of the memory chip is decreased. When the voltage of the ground power supply line keeps going up, it becomes impossible to read data held in the memory cell in a short time, resulting in the data being lost. In order to prevent the loss of the data, the switching NMOS transistor is made to intermittently turn on.
    • 当存储器芯片处于待机模式时,形成存储单元的触发器的接地电源线被间歇地置于浮置状态。 开关NMOS晶体管连接在接地电源线和电源VSS之间。 NMOS晶体管的栅极由激活信号控制。 当进入浮动状态时,由于在存储单元的晶体管中流过的漏电流导致接地电源线被充电。 结果,接地电源线的电压从电源VSS的电压增加。 因此,存储单元的泄漏电流减小,从而存储芯片的待机时功耗降低。 当接地电源线的电压持续上升时,不可能在短时间内读取保存在存储单元中的数据,导致数据丢失。 为了防止数据丢失,使开关式NMOS晶体管间歇地导通。
    • 10. 发明授权
    • Semiconductor integrated circuit containing redundant memory element
    • 包含冗余存储元件的半导体集成电路
    • US5293339A
    • 1994-03-08
    • US863268
    • 1992-04-03
    • Toshikazu SuzukiHisakazu KotaniHironori Akamatsu
    • Toshikazu SuzukiHisakazu KotaniHironori Akamatsu
    • G11C29/00G11C29/04G11C8/00H03K19/003
    • G11C29/806G11C29/83G11C29/84
    • A semiconductor integrated circuit contains a plurality of programmable circuits each including a plurality of fuses and a first transistor which has a gate subjected to an address decoded signal, a drain connected to first ends of the fuses, and a source connected to a common precharge node. The address decoded signal results from decoding a first portion of an address signal for access to memory cells. The sources of the first transistors in the respective programmable circuits are connected to the common precharge node. A plurality of second transistors have gates subjected to a second portion of the address signal, sources connected to a first power supply line, and drains connected to second ends of the fuses in each of the programmable circuits respectively. The second portion of the address signal differs from the first portion of the address signal. A third transistor has a gate subjected to a precharge control signal, a source connected to a second power supply line, and a drain connected to the common precharge node.
    • 半导体集成电路包含多个可编程电路,每个可编程电路包括多个保险丝,第一晶体管具有经过地址解码信号的栅极,连接到保险丝的第一端的漏极和连接到公共预充电节点 。 地址解码信号是对解码访问存储单元的地址信号的第一部分而产生的。 各个可编程电路中的第一晶体管的源极连接到公共预充电节点。 多个第二晶体管具有经过地址信号的第二部分的栅极,分别连接到第一电源线的源和连接到每个可编程电路中的熔丝的第二端的漏极。 地址信号的第二部分与地址信号的第一部分不同。 第三晶体管具有经受预充电控制信号的栅极,连接到第二电源线的源极和连接到公共预充电节点的漏极。