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    • 2. 发明授权
    • Integrated circuit chip with improved locations of overvoltage protection elements
    • 集成电路芯片,具有改进的过电压保护元件位置
    • US06291879B1
    • 2001-09-18
    • US09289640
    • 1999-04-12
    • Seiya Yamano
    • Seiya Yamano
    • H01L2704
    • H01L27/0266H01L23/62H01L24/06H01L27/0248H01L2224/05554H01L2924/14H01L2924/3011H01L2924/00
    • On a semiconductor integrated circuit chip, multiple equipotential power-line conductors are provided to supply power to circuit elements. First protecting elements are provided for interconnecting the power-line conductors for protecting the circuit elements. A number of input/output pads are also connected to the power-line conductors via second protecting elements. The arrangement is such that the contact positions of any of the first protecting elements and any of the second protecting elements on the power-line conductors are nearer to respective end portions of the conductors than the contact position of any of the circuit elements on the conductors. Each of the contact positions serves as a dividing point for dividing a high potential electrostatic charge into at least two low potential charges.
    • 在半导体集成电路芯片上,提供多个等电位线路导体,以向电路元件供电。 提供第一保护元件用于互连电力线导体以保护电路元件。 多个输入/输出焊盘也通过第二保护元件连接到电力线导体。 这种布置使得电力线导体上的任何第一保护元件和任何第二保护元件的接触位置比导体中任何电路元件的接触位置更接近导体的相应端部 。 每个接触位置用作将高电位静电电荷分成至少两个低电位电荷的分割点。