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    • 8. 发明授权
    • Wheel durability test equipment
    • 车轮耐久性试验设备
    • US06810726B2
    • 2004-11-02
    • US10350099
    • 2003-01-24
    • Hiroyuki MogiYoshiaki Hamada
    • Hiroyuki MogiYoshiaki Hamada
    • G01M1702
    • G01M17/013
    • Equipment for testing wheel durability in which the marginal portion of the rim portion of the wheel is mounted to the rotary disk with one end of the moment shaft and the spindle shaft corresponding to the axle being mounted to the disk portion of the wheel. The rotary disk is rotated in a state in which a load is applied to the other end of this moment shaft for thereby evaluating the durability of the wheel. The marginal portion of the wheel is mounted to the rotary disk while pressing with the pressing member obtained by dividing a ring-shaped plate into two. The pressing member permits the mounting of the wheel to the rotary disk with an uniform pressing force in the circumferential direction and prevents rattling, local deformation and the like of the wheel.
    • 用于测试车轮耐久性的设备,其中轮的轮辋部分的边缘部分安装到旋转盘,转轴的一端和轴对应于轴的主轴安装到车轮的盘部分。 旋转盘在向该力矩轴的另一端施加载荷的状态下旋转,从而评价车轮的耐久性。 将轮的边缘部分安装到旋转盘上,同时用通过将环形板分成两个而获得的按压构件进行加压。 按压构件允许轮在圆周方向上以均匀的压力将轮安装到旋转盘,并且防止轮的晃动,局部变形等。
    • 9. 发明授权
    • IC tester socket
    • IC测试仪插座
    • US4872850A
    • 1989-10-10
    • US207101
    • 1988-06-08
    • Hiroyuki MogiKazuhisa Ozawa
    • Hiroyuki MogiKazuhisa Ozawa
    • G01R1/04H05K7/10H01R9/09H01R13/631
    • H05K7/1007G01R1/0433
    • An IC tester socket comprises a spring for keeping the socket body and the spacer frame in their state of being spaced apart from each other with a predetermined interval; and contacting pins each having a spring portion shaped in a pair of arcuate forms, in order to ensure the contact between the lead terminals of an IC requiring testing and the contacting pins to be realized positively and stably and to make it possible for the socket to stand its use for a prolonged period of time. The arm of each contacting pin which is brought into contact with the side face to its mating lead terminal of the IC is adapted to contact the side face of the lead terminal, and is so shaped as to be able to lock the IC package at the position of contact of this arm.
    • IC测试器插座包括用于将插座主体和间隔框架保持在彼此以预定间隔间隔开的状态的弹簧; 并且使每个具有成形为一对弓形形式的弹簧部分的销接触,以便确保需要测试的IC的引线端子和接触销之间的接触被积极且稳定地实现,并且使插座 长期使用它。 每个接触销的与侧面接触到其IC的配合引线端子的臂适于接触引线端子的侧面,并且被成形为能够将IC封装锁定在 这个手臂的接触位置。
    • 10. 发明授权
    • IC socket
    • IC插座
    • US5395254A
    • 1995-03-07
    • US140597
    • 1993-10-21
    • Hiroyuki Mogi
    • Hiroyuki Mogi
    • H01L23/32H01R33/76H05K7/10H01R9/09H01R13/62
    • H05K7/1084H05K7/1007H01L2924/0002
    • An IC socket comprising a floating plate having a plurality of through holes and attached to a main body of the IC socket so as to be vertically movable, an adaptor plate having a plurality of through holes corresponding to the through holes of the floating plate and removably attached to the floating plate, intermediate contact members disposed in the through holes of the adaptor plate, and wire-like contact pins fixed to the main body and having free ends inserted into the through holes of the floating plate.This IC socket is capable of mounting two types of IC packages selectively by attaching and removing the adaptor plate and the intermediate contact members to and from the floating plate.
    • 一种IC插座,包括具有多个通孔的浮动板,并且被附接到IC插座的主体以便可垂直移动;适配器板,具有与浮动板的通孔相对应的多个通孔,并且可拆卸地 附接到浮动板,设置在适配器板的通孔中的中间接触构件和固定到主体上并具有插入浮动板的通孔中的自由端的线状接触销。 该IC插座能够通过将适配器板和中间接触构件连接到浮动板和从浮动板移除来选择性地安装两种类型的IC封装。