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    • 1. 发明授权
    • Semiconductor integrated circuit device
    • 半导体集成电路器件
    • US06597191B2
    • 2003-07-22
    • US10036460
    • 2002-01-07
    • Hirotaka OosawaMasumi KasaharaKazuo Watanabe
    • Hirotaka OosawaMasumi KasaharaKazuo Watanabe
    • G01R3102
    • G01R31/3172G01R31/3167
    • An input/output pin for test corresponding to a test circuit of the digital section is used in common as the input/output pin for usual operation of the analog section, the selection switches are respectively provided between the relevant analog pin and analog circuit and on a signal line up to the test circuit of the digital section from the relevant analog pin and the switches are provided at both end portions of the signal line between the test circuit of digital section and the input/output pin for common use in order to fix the voltage of the signal line to the predetermined voltage such as the ground voltage during the usual operation.
    • 与数字部分的测试电路相对应的用于测试的输入/输出引脚用作模拟部分的通常操作的输入/输出引脚,选择开关分别设置在相关的模拟引脚和模拟电路之间,并在 在数字部分的测试电路和用于常用的输入/输出引脚之间的信号线的两端提供直到来自相关模拟引脚的数字部分的测试电路的信号线和开关,以便固定 在正常操作期间信号线的电压等于预定电压,例如接地电压。
    • 2. 发明授权
    • Semiconductor integrated circuit device
    • 半导体集成电路器件
    • US06917213B2
    • 2005-07-12
    • US10615787
    • 2003-07-10
    • Hirotaka OosawaMasumi KasaharaKazuo Watanabe
    • Hirotaka OosawaMasumi KasaharaKazuo Watanabe
    • G01R31/316G01R31/28G01R31/3167G01R31/317H01L21/822H01L21/8249H01L27/04H01L27/06G01R31/02
    • G01R31/3172G01R31/3167
    • An input/output pin for test corresponding to a test circuit of the digital section is used in common as the input/output pin for normal operation of the analog section. The selection switches are respectively provided between the relevant analog pin and analog circuit and on a signal line up to the test circuit of the digital section from the relevant analog pin and the switches are provided at both end portions of the signal line between the test circuit of digital section and the input/output pin for common use in order to fix the voltage of the signal line to the predetermined voltage such as the ground voltage during the normal operation. Thereby, it is possible in a semiconductor integrated circuit having the analog and digital sections to eliminate adverse effect, even if the input/output pin for testing corresponding to the test circuit of the digital section is used in common as the input/output pin for normal operation of the analog section, from the analog circuit due to the noise which is generated in the digital section and is then transferred to the analog circuit through the signal path up to the analog input/output pin connected to the test circuit from this test circuit of the digital section.
    • 用于与数字部分的测试电路相对应的用于测试的输入/输出引脚用作模拟部分的正常操作的输入/输出引脚。 选择开关分别设置在相关的模拟引脚和模拟电路之间以及在相关模拟引脚上的数字部分的测试电路的信号线上,并且开关设在测试电路之间的信号线的两端 的数字部分和用于常用的输入/输出引脚,以便在正常操作期间将信号线的电压固定为诸如接地电压的预定电压。 因此,具有模拟部分和数字部分的半导体集成电路可以消除不利影响,即使与数字部分的测试电路相对应的用于测试的输入/输出引脚被公共地用作输入/输出引脚 模拟部分的正常工作,由模拟电路由于数字部分产生的噪声而被传送到模拟电路,然后通过信号路径传送到连接到测试电路的模拟输入/输出引脚从该测试 电路的数字部分。