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    • 9. 发明申请
    • SELF-TESTING APPARATUS AND METHOD FOR PHASE ADJUSTMENT CIRCUIT
    • 自适应调试电路的自检装置及方法
    • US20120008670A1
    • 2012-01-12
    • US13241582
    • 2011-09-23
    • Hiroshi NAKAYAMAJunji IchimiyaDaishuke ItouShintaro Itozawa
    • Hiroshi NAKAYAMAJunji IchimiyaDaishuke ItouShintaro Itozawa
    • H04B17/00
    • G01R33/098B82Y25/00G01R31/31917G01R31/31922G01R33/093
    • A signal inversion unit inverts an adjustment pattern signal input as received data. A clock adjustment control circuit acquires a first TAP value adjusted and obtained when a phase adjusting operation is performed on a clock adjustment circuit in a state in which the adjustment pattern signal is not inverted, a first detection frequency of the adjustment pattern signal in a runtime of the operation, a second TAP value adjusted and obtained when the phase adjusting operation is performed in a state in which the adjustment pattern signal is inverted by the signal inversion unit, and a second detection frequency of the adjustment pattern signal in the runtime of the operation. A controller tests an operating state of the phase adjusting operation based on the first and second TAP values and the first and second detection frequencies of the adjustment pattern obtained by the clock adjustment control circuit.
    • 信号反转单元将输入的调整图案信号反转为接收数据。 时钟调整控制电路获取在调整图形信号未被反相的状态下对时钟调整电路进行相位调整动作时调整后获得的第一TAP值,运行时调整图形信号的第一检测频度 在通过信号反转单元反转调节图案信号的状态下执行相位调整操作时调整并获得的第二TAP值,以及在调节图案信号的第二检测频率 操作。 控制器基于第一和第二TAP值以及由时钟调整控制电路获得的调整模式的第一和第二检测频率来测试相位调整操作的操作状态。