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    • 2. 发明申请
    • METHOD FOR GROWING GaN CRYSTAL
    • GaN晶体生长方法
    • US20110100292A1
    • 2011-05-05
    • US13003540
    • 2009-07-14
    • Koji UematsuHiroaki YoshidaMasanori MorishitaShinsuke Fujiwara
    • Koji UematsuHiroaki YoshidaMasanori MorishitaShinsuke Fujiwara
    • C30B19/04
    • H01L21/0254C30B9/00C30B29/406H01L21/02378H01L21/02389H01L21/02395H01L21/02625H01L21/02658H01L33/0075H01L33/16
    • A method for growing a GaN crystal includes a step of preparing a substrate (10) that includes a main surface (10m) and includes a Gax Aly In1-x-y N seed crystal (10a) including the main surface (10m) and a step of growing a GaN crystal (20) on the main surface (10m) at an atmosphere temperature of 800° C. or more and 1500° C. or less and at an atmosphere pressure of 500 atmospheres or more and less than 2000 atmospheres by bringing a solution (7) provided by dissolving (5) nitrogen in a Ga melt (3) into contact with the main surface (10m) of the substrate (10). The method further includes, after the step of preparing the substrate (10) and before the step of growing the GaN crystal (20), a step of etching the main surface (10m) of the substrate (10). Thus, a method for growing a GaN crystal having a low dislocation density and high crystallinity is provided without adding impurities other than raw materials to the melt and without increasing the size of a crystal growth apparatus.
    • 一种用于生长GaN晶体的方法包括制备包括主表面(10m)并包括主表面(10m)的Gax Aly In 1-xy N晶种(10a)的衬底(10)的步骤和 在800℃以上且1500℃以下的气氛温度和500大气压以上且小于2000个大气压的气氛下,在主表面(10μm)上生长GaN晶体(20),通过使 通过将(5)氮在Ga熔体(3)中溶解以与衬底(10)的主表面(10m)接触而提供的溶液(7)。 该方法还包括在制备衬底(10)的步骤之后和生长GaN晶体(20)的步骤之前,蚀刻衬底(10)的主表面(10m)的步骤。 因此,提供了一种生长具有低位错密度和高结晶度的GaN晶体的方法,而不增加熔体中的原料以外的杂质,而不增加晶体生长装置的尺寸。