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1. 发明申请

US20050206869A1 Lithographic apparatus, device manufacturing method and variable attenuator 失效
标题翻译：光刻设备，器件制造方法和可变衰减器
公开(公告)号：US20050206869A1
公开(公告)日：2005-09-22
申请号：US10805526
申请日：2004-03-22
申请人： Harm-Jan Voorma , Antonius Johannes Van Dijsseldonk , Uwe Mickan
发明人： Harm-Jan Voorma , Antonius Johannes Van Dijsseldonk , Uwe Mickan
IPC分类号： H01L21/027 , G03F7/20 , G03B27/52
CPC分类号： G03F7/70558
摘要： A lithographic apparatus includes an illumination system for providing a projection beam of radiation, a support structure for supporting patterning structure for imparting a pattern to the projection beam, a substrate table for holding a wafer and a projection system for projecting the patterned beam onto a target portion of the wafer. In order to permit control of the radiation dose at the wafer so that the throughput of wafers can be optimised, a variable attenuator is provided to vary the intensity of the projection beam while not changing the position of the beam. The variable attenuator comprises two parallel mirrors positioned such that an input beam of radiation is incident on a first of the mirrors by which it is reflected towards a second of the mirrors by which the beam is reflected to produce an output beam of radiation of required intensity for input to the illumination system, and a tilting mechanism for tilting the mirrors such that the mirrors remain parallel to one another and the angles of incidence of the beams on the mirrors are changed so as to vary the intensity of the output beam. This allows the intensity of the projection beam to be varied continuously without changing the position of the beam, whether the input beam is converging, diverging or parallel.
摘要翻译：光刻设备包括用于提供投射辐射束的照明系统，用于支撑用于将投影光束赋予图案的图形结构的支撑结构，用于保持晶片的基板台和用于将图案化光束投影到目标上的投影系统部分晶片。为了允许控制晶片上的辐射剂量，从而可以优化晶片的生产量，可以提供可变衰减器来改变投影光束的强度，同时不改变光束的位置。可变衰减器包括两个平行的反射镜，其被定位成使得输入射线束入射在第一反射镜上，通过该反射镜被反射到第二反射镜，通过该反射镜反射光束以产生所需强度的辐射输出束用于输入到照明系统，以及倾斜机构，用于倾斜反射镜，使得反射镜保持彼此平行，并且改变反射镜上的光束的入射角度，以便改变输出光束的强度。这允许投影光束的强度连续变化而不改变光束的位置，无论输入光束是会聚，发散还是平行。

2. 发明申请

US20050134820A1 Method for exposing a substrate, patterning device, and lithographic apparatus 审中-公开
标题翻译：曝光基板，图案形成装置和光刻装置的方法
公开(公告)号：US20050134820A1
公开(公告)日：2005-06-23
申请号：US10740830
申请日：2003-12-22
申请人： Heine Mulder , Antonius Johannes Van Dijsseldonk , Erik Loopstra , Uwe Mickan , Johannes Catharinus Mulkens , Harm-Jan Voorma
发明人： Heine Mulder , Antonius Johannes Van Dijsseldonk , Erik Loopstra , Uwe Mickan , Johannes Catharinus Mulkens , Harm-Jan Voorma
IPC分类号： G03B27/54 , G03F7/20
CPC分类号： G03F7/70075 , G03F7/701 , G03F7/70425 , G03F7/70566
摘要： A method using a lithographic apparatus comprising a reflective integrator is claimed that optimizes the exposure of features on a target area of a substrate, when the features make an angle between 5 and 85 degrees with respect to the target area. The method comprises rotating the reflective integrator with respect to the target area providing a rotated mirror-symmetric pupil shape, which is implemented by either rotating the substrate or rotating the reflective integrator with respect to the machine or the patterning device. The patterning device comprises a maximum usable area and a patterned area which are rotated with respect to each other if a rotated substrate is employed. The method can be used in single exposure or double exposure mode. A further advantage of the method of using a rotated wafer is that it can be used for exposing features on a substrate in any direction even when the projection system of the lithographic apparatus shows a preferred polarization direction.
摘要翻译：要求使用包括反射积分器的光刻设备的方法，当特征相对于目标区域形成5至85度的角度时，可优化基板目标区域上的特征的曝光。该方法包括使反射积分器相对于目标区域旋转，从而提供旋转的对称瞳孔形状，其通过旋转基底或相对于机器或图案形成装置旋转反射积分器来实现。如果使用旋转的衬底，则图案形成装置包括相对于彼此旋转的最大可用面积和图案化区域。该方法可用于单次曝光或双曝光模式。使用旋转晶片的方法的另一个优点是，即使当光刻设备的投影系统显示优选的偏振方向时，其可以用于在任何方向上曝光衬底上的特征。

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