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    • 2. 发明授权
    • Incident light illumination instrument for selective light and dark
field illumination
    • 入射光照明仪器,用于选择性的光和暗场照明
    • US3930713A
    • 1976-01-06
    • US473818
    • 1974-05-28
    • Hans-Werner StankewitzHans Determann
    • Hans-Werner StankewitzHans Determann
    • G02B21/06G02B21/08G02B21/10
    • G02B21/084
    • An incident light illumination device or instrument for generating dark and light field illumination, wherein at least one optical component is used in a region where the dark field and the light field illumination beams are kept in separate zones. The inner zone is traversed by the light field beam and is endowed with an index of refraction other than the outer zone which is traversed by the dark field beam. A switchable stop for eliminating the light field beam is provided in the vicinity of the optical component (s). The index of refraction of the inner zone of at least one optical component is selected so that the light source is reproduced in the rear focal plane of a microscope objective. A mirror designed as a rotating body and reflecting from its inside surface is located in the optic path from the optic component to the microscope objective and this mirror solely reproduces the dark field beam as a light ring in a plane on the rear side of the microscope objective.
    • 一种用于产生暗和光场照明的入射光照明装置或仪器,其中在暗场和光场照明光束保持在分开的区域中的区域中使用至少一个光学部件。 内部区域由光场光束穿过,并且具有除了由暗场光束穿过的外部区域之外的折射率。 在光学部件附近设有用于消除光场光束的切换停止。 选择至少一个光学部件的内部区域的折射率,使得光源在显微镜物镜的后焦平面上再现。 设计为旋转体并从其内表面反射的反射镜位于从光学部件到显微镜物镜的光学路径中,并且该反射镜仅在显微镜后侧的平面中仅再现作为光环的暗视场光束 目的。
    • 3. 发明授权
    • Variable epi-illumination interference attachment
    • 可变外照射干扰附件
    • US06538809B1
    • 2003-03-25
    • US08232362
    • 1994-04-25
    • Hans-Werner Stankewitz
    • Hans-Werner Stankewitz
    • G02B2100
    • G02B21/00
    • An epi-illumination interference attachment according to Mirau that can be mounted onto the objective (1) of a microscope as a two-ray interference attachment module (12). The attachment has a reference mirror (6) and several beam splitters (8a-8d) which are affixed on a carrier such as turret plate (7). The beam splitters (8a-8d) show specific reflection/transmission characteristics (R/T values), especially 20/80, 35/65, 43/57, and 50/50. The reference mirror (6) shows, for instance a reflection value of 85 percent. With the installation according to this invention, objects (4) with very different reflection values can be observed and measured without any contrast problems.
    • 根据Mirau的可以安装在显微镜的物镜(1)上的外照射干涉附件作为二射线干涉附着模块(12)。 附件具有参考反射镜(6)和几个分束器(8a-8d),其被固定在诸如转盘(7)的载体上。 分束器(8a-8d)显示特定的反射/透射特性(R / T值),特别是20 / 80,35 / 65,43 / 57和50/50。 参考镜(6)示出了例如85%的反射值。 根据本发明的安装,可以观察和测量具有非常不同反射值的物体(4)而没有任何对比度问题。
    • 6. 发明授权
    • Process and apparatus for automatically realizing Kohler's principle of
illumination
    • 自动实现Kohler {3 s照明原理的过程和设备
    • US4163150A
    • 1979-07-31
    • US837402
    • 1977-09-28
    • Hans-Werner Stankewitz
    • Hans-Werner Stankewitz
    • G02B21/06G02B21/08G05D25/00G01J1/32
    • G02B21/08
    • A process and apparatus is disclosed for automatically realizing Kohler's Principle of Illumination in microscopes and the like in which the illumination means of the microscope is adjusted to fully take Kohler's Principle of Illumination into account. Optimization is achieved by sensing the extent of illumination, preferably with photoelectric type sensors, which generate signals proportional to the brightness of illumination. The signals are converted into control signals in a converter stage which in turn control motor means which serve to adjust the openings of at least one diaphragm and/or the focal length of an illumination pancratics in the system. The sensing means are adjustably positioned so that it may be moved depending on the objective and magnification used.
    • 公开了一种用于在显微镜等中自动实现科勒照明原理的方法和装置,其中调整显微镜的照明装置以充分考虑科勒的照明原理。 通过感测照射的程度来实现优化,优选地是利用光电式传感器产生与照明亮度成比例的信号。 信号在转换器阶段转换成控制信号,转换器级又控制用于调节系统中至少一个光阑的开口和/或照明泛光焦点的电动机装置。 感测装置可调节地定位,使得其可以根据所使用的物镜和放大率而移动。
    • 8. 发明授权
    • Process and device for contrasting objects to be microscopically examined
    • 用于对比物体的显微镜检查的过程和装置
    • US5708526A
    • 1998-01-13
    • US428130
    • 1995-04-28
    • Hans-Werner Stankewitz
    • Hans-Werner Stankewitz
    • G02B21/14G02B21/06G02B5/22G02B26/02
    • G02B21/14
    • A contrasting process and device allows a relief contrast to be obtained for microscopic amplitude and/or phase objects. The input aperture (L') of the condenser (2) is partially and asymmetrically masked at the same time as an image (S') of a sector diaphragm (S) is generated in the output aperture (L") of the objective lens (3), a phase segment (8) of a phase plate (7) covering the image (S') at least partially. The size of the phase segment (8) may be adapted to the size of the image (S') cutout; it may however also be substantially smaller. In the latter case, the sector diaphragm (5) may have additional attenuating sectors (D) made of semi-transparent material with a defined attenuating factor, for example 15%. The process and device are suitable for transmitted light and/or reflected light microscopy in a normal or inverted beam path.
    • PCT No.PCT / DE93 / 00858 Sec。 371日期:1995年4月28日 102(e)1995年4月28日PCT PCT 1993年9月15日PCT公布。 公开号WO94 / 10597 日期1994年5月11日对比过程和设备允许为微观振幅和/或相位物体获得浮雕对比度。 同时,在物镜的输出孔径(L“)中产生扇形光阑(S)的图像(S')的同时,电容器(2)的输入孔径(L')被部分地和不对称地屏蔽 透镜(3),至少部分地覆盖图像(S')的相位板(7)的相位段(8)。 相位段(8)的尺寸可以适应于图像(S')切口的尺寸; 然而,它也可以显着更小。 在后一种情况下,扇形隔膜(5)可以具有由半透明材料制成的附加衰减扇区(D),其具有限定的衰减因子,例如15%。 该方法和装置适用于正常或反向光束路径中的透射光和/或反射光显微镜。
    • 9. 发明授权
    • Epi-illumination system for microscopes
    • 显微镜的Epi照明系统
    • US5521755A
    • 1996-05-28
    • US244055
    • 1994-06-27
    • Hans-Werner Stankewitz
    • Hans-Werner Stankewitz
    • G02B21/06G02B21/08G02B23/00
    • G02B21/082
    • An epi-illumination system for microscopes is described, which contains an epi-illumination module (18) that consists of a Smith-splitter with an integrated telescope system (14). The telescope system (14) corrects in the sense of "Shift-Optics" differences in length that appear when switching from a modularly-designed 45 degree neutral splitter (20) to a Smith-splitter containing module (18). The arrangement of the two lenses in the telescope system (14) is such that the positive member (15) is directed towards the mirror (4) of the Smith-splitter and the negative member (16) is directed towards the light source (6). Alternatively it is also possible to install a telescope system with an opposite lens arrangement in a module (19), containing a 45-degree neutral splitter, if this is exchanged for a Smith-splitter containing module, so that the negative member (16) is directed towards the 45-degree neutral splitter (20) and the positive member (15) is directed towards the light source (6).
    • PCT No.PCT / DE93 / 00865 Sec。 371日期1994年6月27日第 102(e)日期1994年6月27日PCT提交1993年9月15日PCT公布。 出版物WO94 / 07168 日期为1994年3月31日。描述了一种用于显微镜的外照明系统,其包含由具有集成望远镜系统(14)的史密斯分离器组成的外延照明模块(18)。 望远镜系统(14)在从模块化设计的45度中性分离器(20)切换到包含史密斯分离器模块(18)的模块化设计中出现的长度上的“偏移光学”差异的校正。 望远镜系统(14)中的两个透镜的布置使得正构件(15)指向史密斯分离器的反射镜(4),并且负构件(16)被引向光源(6) )。 或者,也可以在模块(19)中安装具有相反透镜装置的望远镜系统,其包含45度中性分离器,如果这被更换为包含史密斯分离器的模块,则负构件(16) 指向45度中性分离器(20),并且正构件(15)指向光源(6)。
    • 10. 发明授权
    • Field stop for dark field illumination in autofocus optical device
    • 自动对焦光学装置中暗场照明的场地停止
    • US4798948A
    • 1989-01-17
    • US39249
    • 1987-04-17
    • Burkhard NeumannHans-Werner Stankewitz
    • Burkhard NeumannHans-Werner Stankewitz
    • G02B5/20G02B5/22G02B7/28G02B7/32G02B21/10G02B21/24G01J1/20
    • G02B5/22G02B21/10G02B21/24
    • An optical component is described which can be introduced into a finite or an infinite beam path and which is provided with a spectrally selective filtering characteristic and thus as the same time compensates the thereby generated geometric-optical negative influence by appropriate image-relevant compensation measures. The optical component exhibits at least one optically effective, non-planar surface. It has, for example, the property of completely absorbing visible light and of being completely transparent to shorter- or longer-wavelength light. In addition to this, a laser autofocus arrangement known per se is described, which is equipped with the optical component according to the invention, whereby a dark field illumination with an incident light microscope can be achieved while maintaining the autofocus function.
    • 描述了可以被引入有限或无限波束路径并且被提供有频谱选择性滤波特性的光学部件,因此同时由适当的图像相关补偿措施补偿由此产生的几何光学负面影响。 光学部件表现出至少一个光学有效的非平面表面。 它具有例如完全吸收可见光并对较短波长或更长波长的光完全透明的性质。 除此之外,还描述了本发明的激光自动对焦装置,其配备有根据本发明的光学部件,由此可以在保持自动聚焦功能的同时实现具有入射光学显微镜的暗视场照明。