会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Method and device for determining the purity and/or pressure of gases
for electric lamps
    • 用于确定电灯气体纯度和/或压力的方法和装置
    • US5920400A
    • 1999-07-06
    • US860805
    • 1997-07-09
    • Hans EisemannKaren Twesten
    • Hans EisemannKaren Twesten
    • G01N21/31G01N21/66G01N21/67G01N21/69G01J3/46
    • G01N21/69
    • According to the method the intensity of at least one pressure-independent (impurity detection) or pressure-dependent (gas pressure determination) spectral line is measured selectively. Indirect detection utilizes the intensity of spectral lines whose wavelengths correspond to higher levels of excitation energy than those of the impurities. The intensity of these spectral lines is a measure of the impurities. Alternatively, the intensity of at least one spectral line of the respective impurity is measured directly. In order to eliminate co-phasal interference, two spectral lines are measured and the ratio is formed therefrom. The intensity ratio of argon lines of wavelengths .lambda..sub.1 =772.4 nm and .lambda..sub.2 =738.4 nm has in particular proved acceptable for the indirect detection of impurities in argon and the intensity ratio V of the argon lines of wavelengths .lambda..sub.1 =763.5 nm and .lambda..sub.2 =738.4 nm has proved acceptable for determining the argon pressure. The measuring process is in particular suitable for integration in high-speed production lines for discharge lamps.
    • PCT No.PCT / DE96 / 00232 Sec。 371日期1997年7月9日第 102(e)日期1997年7月9日PCT 1996年2月14日PCT PCT。 出版物WO96 / 25658 日期1996年8月22日根据该方法,选择性地测量至少一个压力无关(杂质检测)或压力依赖(气体压力测定)谱线的强度。 间接检测利用波长对应于比杂质更高水平的激发能量的光谱线的强度。 这些谱线的强度是杂质的量度。 或者,直接测量各个杂质的至少一个谱线的强度。 为了消除共相干扰,测量两条光谱线,并由此形成比例。 波长λ1 = 772.4nm和λ2 = 738.4nm的氩线的强度比对于间接检测氩中的杂质和波长λ1 = 763.5nm的氩线的强度比V以及λ 2 = 738.4nm已被证明可以用于确定氩气压力。 测量过程特别适用于集成在高速放电灯生产线上。