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    • 1. 发明申请
    • LASER SCANNING MICROSCOPE AND ASSEMBLY FOR NON-DESCANNED DETECTION
    • 激光扫描显微镜和组件进行非破坏性检测
    • US20090194715A1
    • 2009-08-06
    • US12362110
    • 2009-01-29
    • HARALD SCHADWINKELHubert WahlDieter Schau
    • HARALD SCHADWINKELHubert WahlDieter Schau
    • G02B21/06
    • G02B21/0076G02B21/24
    • A scanning microscope with a light source which emits illumination light for illuminating a specimen, with at least a first detector for detecting the detection light proceeding from the specimen, and with an objective through which the specimen can be illuminated and detected, wherein the objective is arranged in an illumination beam path and in a detection beam path, and with a second detector for non-descanned detection of the detection light proceeding from the specimen, wherein a compact assembly is provided which comprises a housing which is attached to a microscope stand and which has at least one receptacle for a microscope objective for the illumination beam path and/or detection beam path of the scanning microscope, wherein at least the second detector is arranged in the housing and can be acted upon by specimen light.
    • 一种具有光源的扫描显微镜,其具有用于照射样本的照明光,至少具有用于检测从样本进行的检测光的第一检测器,以及可以照射和检测样本的物镜,其中, 布置在照明光束路径和检测光束路径中,并且具有第二检测器,用于未检测从样本进行的检测光,其中提供紧凑的组件,其包括附接到显微镜支架的壳体和 其具有用于照明光束路径的显微镜物镜和/或扫描显微镜的检测光束路径的至少一个容器,其中至少第二检测器布置在壳体中并且可以由样本光作用。