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    • 4. 发明授权
    • Probe for checking linear dimensions
    • 用于检查线性尺寸的探头
    • US4553332A
    • 1985-11-19
    • US543011
    • 1983-10-18
    • Guido GolinelliCarlo Dall'Aglio
    • Guido GolinelliCarlo Dall'Aglio
    • B23Q1/36G01B7/00G01B7/016G01B7/28G01B21/00G01B7/02
    • B23Q1/36G01B7/002
    • A probe for checking linear dimensions of mechanical parts comprises a support, a movable arm carrying a feeler adapted for contacting the part to be checked and an integral member coupled to the movable arm and the support. The member includes a first portion fixed to the movable arm a second portion fixed to the support and an intermediate portion having two sections with reduced thickness which define two axes of mutual rotation of the first and second portion. An electrical circuit closed under rest conditions comprises two pairs of electrical contacts which are opened in consequence of displacements of the movable arm along opposite directions or of an axial displacement of the arm.
    • 用于检查机械部件的线性尺寸的探针包括支撑件,携带适于接触待检查部件的触片的可移动臂和联接到可动臂和支撑件的整体构件。 该构件包括固定到可动臂的第一部分,固定到支撑件上的第二部分和具有限定第一和第二部分相互旋转的两个轴线的厚度减小的两个部分的中间部分。 在静止状态下闭合的电路包括两对电触头,这两对电触点由于可动臂沿着相反方向的位移或臂的轴向位移而被打开。
    • 5. 发明授权
    • Apparatus and method for checking thickness dimensions of an element while it is being machined
    • 用于在加工元件时检查元件的厚度尺寸的装置和方法
    • US08546760B2
    • 2013-10-01
    • US12668720
    • 2008-07-18
    • Carlo Dall'Aglio
    • Carlo Dall'Aglio
    • G01N21/35G01B11/06
    • G01B11/06B24B7/228B24B49/12H01L22/26
    • An apparatus for checking thickness dimensions in a semiconductor wafer (1) during grinding operations includes an optical probe (3) which transmits infrared radiations on the surface (2) being machined of the wafer (1), and detects beams that are reflected by said surface, by an opposite surface (2′) of the wafer and/or by surfaces (2″, 2′″) separating different layers in the wafer. The beam of emitted and reflected radiations travels along a path (4) with known and constant discontinuities, in part through the air (15) and in part through a cushion (30) of low flow liquid, which flows with substantially laminar flow. A support and positioning element (7) for the optical probe includes hydraulic ducts (22,25) that generate the liquid cushion. A method for checking the thickness dimensions includes the generation of the liquid cushion at the path along which the beam of emitted and reflected radiations travels.
    • 一种用于在研磨操作期间检查半导体晶片(1)中的厚度尺寸的装置,包括在被加工晶片(1)的表面(2)上透过红外辐射的光学探头(3),并且检测由所述 表面,由晶片的相对表面(2')和/或通过分离晶片中的不同层的表面(2“,”2“)。 发射和反射辐射的光束沿着具有已知和恒定不连续性的路径(4)行进,部分地通过空气(15)并且部分地通过基本上层流流动的低流动液体的衬垫(30)。 用于光学探针的支撑和定位元件(7)包括产生液体垫的液压管道(22,25)。 用于检查厚度尺寸的方法包括在发射和反射辐射束行进的路径处产生液体缓冲垫。
    • 6. 发明申请
    • TOUCH PROBE AND RELATED CHECKING METHOD
    • 触摸探针和相关检查方法
    • US20130205609A1
    • 2013-08-15
    • US13880335
    • 2011-10-25
    • Antonio GambiniCarlo Dall'Aglio
    • Antonio GambiniCarlo Dall'Aglio
    • G01B7/016
    • G01B7/016G01B5/016G01B7/012G01B21/04G01L1/16
    • A touch probe (1;1′;1″;1′″) for applications in machine tools or measuring machines includes a support frame (2) with a protective casing (3), and a movable armset (5) with a feeler (11) to touch a part to be checked (13). The probe includes a detection device (23) with a laminar piezoelectric transducer (25) made of polymeric material, such as polyvinylidene fluoride, which is connected to the support frame and fixed at a bearing and locating area (7), on which the movable armset rests in a position defined by an isostatic rest system (17). Conditioning electronics (30) connected to the support frame include processing means for processing a force signal (M) provided by the detection device, comparing it with a threshold value (S) and generating a touch signal (T). The conditioning electronics include differential charge amplifiers (3) and a processing system (55) to dynamically vary the threshold value depending on the most recent values of the force signal detected.
    • 用于在机床或测量机中应用的触摸探针(1; 1'; 1“; 1”)包括具有保护壳体(3)的支撑框架(2)和具有保护壳体 触摸(11)触摸待检查的部分(13)。 探针包括检测装置(23),其具有由诸如聚偏二氟乙烯的聚合物材料制成的层状压电换能器(25),其连接到支撑框架并固定在轴承和定位区域(7)上,可移动 臂架搁置在由等静止休息系统(17)限定的位置。 连接到支撑框架的调节电子设备(30)包括用于处理由检测装置提供的力信号(M)的处理装置,将其与阈值(S)进行比较并产生触摸信号(T)。 调理电子器件包括差分电荷放大器(3)和处理系统(55),以根据检测到的力信号的最近值来动态地改变阈值。
    • 7. 发明授权
    • Apparatus for checking diametral dimensions of a rotating cylindrical part during a grinding thereof
    • 用于在其研磨期间检查旋转圆柱形部件的直径尺寸的装置
    • US07954253B2
    • 2011-06-07
    • US12559642
    • 2009-09-15
    • Carlo Dall'AglioRiccardo Cipriani
    • Carlo Dall'AglioRiccardo Cipriani
    • G01B3/00G01D21/00
    • B24B49/04B24B5/42
    • An apparatus for checking the diameter of crankpins (18) of a crankshaft (34) in the course of the machining in a grinding machine comprises a first arm (9) rotating with respect to a support (5) arranged on the grinding-wheel slide (1) of the grinding machine, a second arm (12) rotating with respect to the first, a reference device (20) carried by the second arm and a measuring device (16, 17, 40-45) associated with a reference device. A guide device (21), fixed to the reference device (20), enables the apparatus to engage a crankpin, in the course of the orbital motion of the crankpin, and limit the displacements of the first arm and those of the second arm when a control device (28-30) displaces the apparatus to a rest position.
    • 一种用于在磨床中在机加工过程中检查曲轴(34)的曲柄销(18)的直径的装置包括相对于布置在研磨轮滑块上的支撑件(5)旋转的第一臂(9) (1),相对于第一臂旋转的第二臂(12),由第二臂承载的参考装置(20)和与参考装置相关联的测量装置(16,17,40-45) 。 固定在参考装置(20)上的引导装置(21)使得该装置能够在曲柄销的轨道运动过程中与曲柄销接合,并且限制第一臂和第二臂的位移 控制装置(28-30)将装置移动到静止位置。
    • 8. 发明授权
    • Apparatus for the dimensional checking of an orbitally rotating crankpin of a crankshaft
    • 用于曲轴的轨道旋转曲柄销的尺寸检查的装置
    • US07690127B2
    • 2010-04-06
    • US12268248
    • 2008-11-10
    • Carlo Dall'AglioWilliam Montanari
    • Carlo Dall'AglioWilliam Montanari
    • G01B3/38
    • B24B49/045B24B5/42B24B49/04G01B5/08
    • An apparatus for checking the diameter of crankpins of a crankshaft in the course of the machining in a grinding machine includes a Vee-shaped reference device, a measuring device associated with the reference device and including a feeler axially movable along the bisecting line of the Vee-shaped reference device, and a support device with a first arm rotating with respect to a support arranged on the grinding-wheel slide and a second arm rotating with respect to the first and carrying the Vee-shaped reference device.A guiding mechanism includes a limiting device, with mutually abutting surfaces and coupled to the support device, that guides the displacement of the reference device along a trajectory substantially parallel to the profile of the grinding wheel, allows the engagement of the reference device on a crankpin to be checked while the latter is orbitally moving, and does not interfere with the displacements of the support device caused by the orbital motion of the crankpin in the checking condition.
    • 一种用于在研磨机中加工过程中检查曲轴的曲柄销直径的装置包括V形形状的参考装置,与参考装置相关联的测量装置,包括沿着Vee的平分线可轴向运动的测头 以及支撑装置,其具有相对于布置在研磨轮滑块上的支撑件旋转的第一臂和相对于第一臂旋转并承载V形形状的参考装置的第二臂。 引导机构包括具有彼此邻接的表面并且联接到支撑装置的限制装置,其引导参考装置沿着基本上平行于砂轮的轮廓的轨迹的位移,允许参考装置接合在曲柄销 在后者被轨道移动时被检查,并且不会在检查条件下干扰由曲柄销的轨道运动引起的支撑装置的位移。
    • 9. 发明申请
    • APPARATUS FOR THE DIMENSIONAL CHECKING OF AN ORBITALLY ROTATING CRANKPIN OF A CRANKSHAFT
    • 用于尺寸检查起重机的旋转起重机的装置
    • US20090113736A1
    • 2009-05-07
    • US12268248
    • 2008-11-10
    • Carlo Dall'AglioWilliam Montanari
    • Carlo Dall'AglioWilliam Montanari
    • G01B3/38
    • B24B49/045B24B5/42B24B49/04G01B5/08
    • An apparatus for checking the diameter of crankpins of a crankshaft in the course of the machining in a grinding machine includes a Vee-shaped reference device, a measuring device associated with the reference device and including a feeler axially movable along the bisecting line of the Vee-shaped reference device, and a support device with a first arm rotating with respect to a support arranged on the grinding-wheel slide and a second arm rotating with respect to the first and carrying the Vee-shaped reference device.A guiding mechanism includes a limiting device, with mutually abutting surfaces and coupled to the support device, that guides the displacement of the reference device along a trajectory substantially parallel to the profile of the grinding wheel, allows the engagement of the reference device on a crankpin to be checked while the latter is orbitally moving, and does not interfere with the displacements of the support device caused by the orbital motion of the crankpin in the checking condition.
    • 一种用于在研磨机中加工过程中检查曲轴的曲柄销直径的装置包括V形形状的参考装置,与参考装置相关联的测量装置,包括沿着Vee的平分线可轴向运动的测头 以及支撑装置,其具有相对于布置在研磨轮滑块上的支撑件旋转的第一臂和相对于第一臂旋转并承载V形形状的参考装置的第二臂。 引导机构包括具有彼此邻接的表面并且联接到支撑装置的限制装置,其引导参考装置沿着基本上平行于砂轮的轮廓的轨迹的位移,允许参考装置接合在曲柄销 在后者被轨道移动时被检查,并且不会在检查条件下干扰由曲柄销的轨道运动引起的支撑装置的位移。