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    • 4. 发明授权
    • Testing circuit and method for phase-locked loop
    • 锁相环测试电路及方法
    • US06832173B1
    • 2004-12-14
    • US10209633
    • 2002-07-30
    • Gregory StarrWanli Chang
    • Gregory StarrWanli Chang
    • G01R3500
    • H03L7/0891H03L7/0896
    • A testing circuit and method for a phase-locked loop allow measurement of leakage currents in the phase-locked loop components. By forcing the output of the phase-frequency detector to a particular state, the charge pump can be disabled. This disables the effect of feedback in the phase-locked loop, and allowing the output frequency to be determined by the voltage on the control voltage node at the time the feedback is disabled. If there is no leakage, the control voltage, and therefore the output frequency, should remain the same as they were at the moment feedback was disabled. Monitoring the output frequency for changes provides an indication of the presence or absence of leakage. Conducting the test using two different charge pump reference currents allows one to detect leakage resulting from charge pump mismatch.
    • 用于锁相环的测试电路和方法允许测量锁相环组件中的漏电流。 通过将相频检测器的输出强制到特定状态,可以禁用电荷泵。 这将禁止反相在锁相环中的影响,并允许输出频率由禁止反馈时控制电压节点上的电压决定。 如果没有泄漏,则控制电压,因此输出频率应保持与反馈禁用时相同。 监控变频器的输出频率提供有无泄漏的指示。 使用两种不同的电荷泵参考电流进行测试可以检测电荷泵不匹配造成的泄漏。
    • 8. 发明授权
    • Programmable logic array integrated circuits
    • 可编程逻辑阵列集成电路
    • US5828229A
    • 1998-10-27
    • US847004
    • 1997-05-01
    • Richard G. CliffL. Todd CopeCameron McClintockWilliam LeongJames Allen WatsonJoseph HuangBahram AhaninChiakang SungWanli Chang
    • Richard G. CliffL. Todd CopeCameron McClintockWilliam LeongJames Allen WatsonJoseph HuangBahram AhaninChiakang SungWanli Chang
    • G01R31/3185G11C8/12G11C8/16G11C29/32H03K19/173H03K19/177
    • H03K19/1737G11C29/32G11C8/12G11C8/16H03K19/17704H03K19/17728H03K19/1776H03K19/17764G01R31/318516
    • A programmable logic array integrated circuit has a number of programmable logic modules which are grouped together in a plurality of logic array blocks ("LABs"). The LABs are arranged on the circuit in a two dimensional array. A conductor network is provided for interconnecting any logic module with any other logic module. In addition, adjacent or nearby logic modules are connectable to one another for such special purposes as providing a carry chain between logic modules and/or for connecting two or more modules together to provide more complex logic functions without having to make use of the general interconnection network. Another network of so-called fast or universal conductors is provided for distributing widely used logic signals such as clock and clear signals throughout the circuit. Multiplexers can be used in various ways to reduce the number of programmable interconnections required between signal conductors. A relatively large block of random access memory ("RAM") may be provided on the device for use as read-only memory ("ROM") or RAM during operation of the device to perform logic. The RAM block is connected in the circuitry of the device so that it can be programmed and verified compatibly with other memory on the device. Thereafter the circuitry of the RAM block allows it to be switched over to operation as RAM or ROM during logic operation of the device.
    • 可编程逻辑阵列集成电路具有多个可编程逻辑模块,它们被组合在多个逻辑阵列块(“LAB”)中。 LAB以二维阵列布置在电路上。 提供一个导线网络,用于将任何逻辑模块与任何其他逻辑模块相互连接。 此外,相邻或附近的逻辑模块可以彼此连接,用于在逻辑模块之间提供进位链和/或用于将两个或多个模块连接在一起以提供更复杂的逻辑功能而不必利用一般互连的特殊目的 网络。 提供了所谓的快速或通用导体的另一网络,用于在整个电路中分布广泛使用的逻辑信号,例如时钟和清除信号。 多路复用器可以以各种方式用于减少信号导体之间所需的可编程互连数量。 随机存取存储器(“RAM”)相对较大的块可以在设备的操作期间被提供在设备上用作只读存储器(“ROM”)或RAM,以执行逻辑。 RAM块连接在设备的电路中,使其可以与设备上的其他存储器进行编程和验证。 此后,RAM块的电路允许在设备的逻辑运行期间将其切换到作为RAM或ROM的操作。