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    • 2. 发明授权
    • Chip protection register unlocking
    • 芯片保护寄存器解锁
    • US07145799B2
    • 2006-12-05
    • US11170880
    • 2005-06-30
    • Giovanni NasoPietro PiersimoniTommaso Vali
    • Giovanni NasoPietro PiersimoniTommaso Vali
    • G11C16/22
    • G11C7/24G11C16/22G11C2029/4402
    • An improved Flash memory device is described with a protection register lock bit erase enable circuit. A bond pad coupled to the lock bit erase enable circuit of the improved Flash memory is not bonded when the individual Flash memory chip wafer is packaged. This allows the memory manufacturer to access the bond pad and erase the lock bits while the chip is still in wafer form via a test card probe, but makes the lock bits effectively uneraseable when the chip wafer is packaged. This enables the memory chip manufacturer to enhance reliability and fault tolerance of the Flash memory device by thoroughly testing the lock bits and protection register functionality. Additionally, the lock bit erase enable circuit increases manufacturing flexibility by allowing the memory chip manufacturer to reprogram the protection register and lock bits in case of organizational changes or inadvertent or erroneous programming of the protection register.
    • 用保护寄存器锁定位擦除使能电路描述改进的闪速存储器件。 当单独的闪存芯片晶片被封装时,耦合到改进的闪速存储器的锁定位擦除使能电路的接合焊盘不被接合。 这允许存储器制造商通过测试卡探针访问焊盘并擦除锁定位,同时芯片仍然是晶片形式,但是当芯片晶片被封装时,使得锁定位有效地不可靠。 这使得内存芯片制造商能够通过彻底测试锁定位和保护寄存器功能来增强闪存设备的可靠性和容错能力。 此外,锁定位擦除使能电路通过允许存储器芯片制造商在组织改变或保护寄存器的无意或错误编程的情况下重新编程保护寄存器和锁定位来提高制造灵活性。
    • 3. 发明授权
    • Chip protection register unlocking
    • 芯片保护寄存器解锁
    • US06947323B2
    • 2005-09-20
    • US10698752
    • 2003-10-31
    • Giovanni NasoPietro PiersimoniTommaso Vali
    • Giovanni NasoPietro PiersimoniTommaso Vali
    • G11C7/24G11C16/00G11C16/04G11C16/22G11C17/00
    • G11C7/24G11C16/22G11C2029/4402
    • An improved Flash memory device is described with a protection register lock bit erase enable circuit. A bond pad coupled to the lock bit erase enable circuit of the improved Flash memory is not bonded when the individual Flash memory chip wafer is packaged. This allows the memory manufacturer to access the bond pad and erase the lock bits while the chip is still in wafer form via a test card probe, but makes the lock bits effectively uneraseable when the chip wafer is packaged. This enables the memory chip manufacturer to enhance reliability and fault tolerance of the Flash memory device by thoroughly testing the lock bits and protection register functionality. Additionally, the lock bit erase enable circuit increases manufacturing flexibility by allowing the memory chip manufacturer to reprogram the protection register and lock bits in case of organizational changes or inadvertent or erroneous programming of the protection register.
    • 用保护寄存器锁定位擦除使能电路描述改进的闪速存储器件。 当单独的闪存芯片晶片被封装时,耦合到改进的闪速存储器的锁定位擦除使能电路的接合焊盘不被接合。 这允许存储器制造商通过测试卡探针访问焊盘并擦除锁定位,同时芯片仍然是晶片形式,但是当芯片晶片被封装时,使得锁定位有效地不可靠。 这使得内存芯片制造商能够通过彻底测试锁定位和保护寄存器功能来增强闪存设备的可靠性和容错能力。 此外,锁定位擦除使能电路通过允许存储器芯片制造商在组织改变或保护寄存器的无意或错误编程的情况下重新编程保护寄存器和锁定位来提高制造灵活性。
    • 8. 发明授权
    • Low voltage, high current pump for flash memory
    • 低电压,高电流泵用于闪存
    • US5874849A
    • 1999-02-23
    • US684652
    • 1996-07-19
    • Giulio MarottaGiovanni SantinPietro PiersimoniMichael C. Smayling
    • Giulio MarottaGiovanni SantinPietro PiersimoniMichael C. Smayling
    • H02M3/07G05F1/10
    • H02M3/073
    • A charge pump 1 for operation in an integrated circuit having a power source Vdd. The pump is made of a plurality of pump cells 10 connected together. Each pump cell includes an inverter 50 having a port 42 to receive a negative bias input, a port 44 to receive a positive bias input, a port 38 to receive a clock input, and a port 40 to output an output clock signal at the same frequency of the clock input, but phase shifted by a predetermined amount determined by the signal levels of the negative bias and said positive bias. Also included in each pump cell is a capacitor 26. A circuit 20, 22, 24, for coupling the output clock signal to one port of the capacitor is also provided, as is a pair of diodes 28, 30, connected serially together, one end of the pair being connected to the power source and the other end 48 of the pair providing the output signal of the pump cell, the common point of the pair being connected to the other port of the capacitor. The pump cells are connected together such that the inverters are connected together to form a ring oscillator and such that the output signals are connected in parallel. The pump provides a stable source of high current at a moderately boosted voltage, with very low ripple, and is suitable for use with non-volatile, programmable memories.
    • 一种用于在具有电源Vdd的集成电路中操作的电荷泵1。 泵由连接在一起的多个泵电池10制成。 每个泵单元包括具有端口42以接收负偏置输入的反相器50,用于接收正偏压输入的端口44,用于接收时钟输入的端口38和用于输出时钟输入的端口40以输出相同的输出时钟信号 时钟输入的频率,但是相移了由负偏压和所述正偏压的信号电平确定的预定量。 还包括在每个泵浦单元中的是电容器26.还提供用于将输出时钟信号耦合到电容器的一个端口的电路20,22,24,以及串联连接在一起的一对二极管28,30,一个 该对的端部连接到电源,并且该对的另一端48提供泵电池的输出信号,该对的公共点连接到电容器的另一个端口。 泵电池连接在一起,使得逆变器连接在一起以形成环形振荡器,并且使得输出信号并联连接。 该泵在适中的升压电压下提供稳定的高电流源,具有非常低的纹波,适用于非易失性可编程存储器。
    • 9. 发明授权
    • Programmable memory verify
    • 可编程存储器验证“0”并验证“1”电路和方法
    • US5715195A
    • 1998-02-03
    • US683943
    • 1996-07-19
    • Michael C. SmaylingGiulio MarottaGiovanni SantinPietro PiersimoniCristina Lattaro
    • Michael C. SmaylingGiulio MarottaGiovanni SantinPietro PiersimoniCristina Lattaro
    • G11C16/34G11C11/34
    • G11C16/3445G11C16/3436G11C16/3459
    • A method for automatically detecting and correcting the underprogramming of a memory cell 10 in a non-volatile, progrommable memory array 1, the array having a plurality of such cells, each such cell being programmable by a progromming step that stores charge therein and being erasable by an erasing step that removes charge therefrom, and each such cell being readable to determine whether such cell is in a progrommed state or in an erased state. First, charge is stored in a selected cell therein 74. Then the selected cell is read to determine whether the selected cell is programmed 78. If the step of reading does not determine such cell to be programmed 80, the steps of storing and reading are automatically repeated until either the step of sensing indicates a sufficiently programmed cell or, alternatively, until a predermined number of iterations of the steps has been performed 86.
    • 一种用于在非易失性可编程存储器阵列1中自动检测和校正存储器单元10的欠编程的方法,所述阵列具有多个这样的单元,每个这样的单元可以通过在其中存储电荷并且是可擦除的编程步骤来编程 通过从其中去除电荷的擦除步骤,并且每个这样的单元是可读取的,以确定这样的单元是处于预占状态还是处于擦除状态。 首先,将电荷存储在其中的所选择的单元中。然后读取所选择的单元,以确定所选择的单元是否被编程78.如果读取步骤不确定这样的要被编程的单元80,则存储和读取的步骤是 自动重复,直到感测步骤指示足够编程的单元,或者替代地,直到已经执行步骤的迭代次数已被执行86。