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    • 3. 发明授权
    • Apparatus, imaging device and method for counting X-ray photons
    • 用于计数X射线光子的装置,成像装置和方法
    • US08237128B2
    • 2012-08-07
    • US12518299
    • 2007-12-11
    • Roger Steadman BookerChristian BaeumerChristoph HerrmannGuenter Zeitler
    • Roger Steadman BookerChristian BaeumerChristoph HerrmannGuenter Zeitler
    • G01T1/24
    • G01T1/17G01T1/2928
    • The present invention relates to an apparatus (10) for counting X-ray photons (12, 14). The apparatus (10) comprises a sensor (16) adapted to convert a photon (12, 14) into a charge pulse, a processing element (18) adapted to convert the charge pulse (51) into an electrical pulse (53) and a first discriminator (20) adapted to compare the electrical pulse (53) against a first threshold (TH1) and to output an event (55) if the first threshold (TH1) is exceeded. A first counter (22) counts these events (55), unless counting is inhibited by a first gating element (24). The first gating element (24) is activated when the first discriminator (20) outputs the event (55), and it is deactivated, when the processing of a photon (12, 14) is found to be complete or about to be completed by a measurement or by the knowledge about the time that it takes to process a photon (12, 14) in the processing element (18). By activating and deactivating the first counter (22) pile-up events, i.e. pile-up of multiple electrical pulses (53), can be addressed. The invention also relates to a corresponding imaging device and a corresponding method.
    • 本发明涉及一种用于计数X射线光子(12,14)的装置(10)。 所述设备(10)包括适于将光子(12,14)转换为充电脉冲的传感器(16),适于将所述充电脉冲(51)转换成电脉冲(53)的处理元件(18) 适于比较电脉冲(53)与第一阈值(TH1)并且如果超过第一阈值(TH1)则输出事件(55)的第一鉴别器(20)。 第一计数器(22)对这些事件(55)进行计数,除非由第一选通元件(24)抑制计数。 当第一鉴别器(20)输出事件(55)时,第一选通元件(24)被激活,并且当发现光子(12,14)的处理完成或将要由 测量或通过关于在处理元件(18)中处理光子(12,14)所需的时间的知识。 通过激活和去激活第一计数器(22)堆积事件,即堆叠多个电脉冲(53),可以被解决。 本发明还涉及相应的成像装置和相应的方法。
    • 8. 发明申请
    • PROCESSING ELECTRONICS AND METHOD FOR DETERMINING A COUNT RESULT, AND DETECTOR FOR AN X-RAY IMAGING DEVICE
    • 用于确定计数结果的处理电子和方法以及用于X射线成像装置的检测器
    • US20120085915A1
    • 2012-04-12
    • US12679327
    • 2008-09-23
    • Christian BaeumerGuenter ZeitlerKlaus Juergen EngelChristoph HerrmannRoger Steadman Booker
    • Christian BaeumerGuenter ZeitlerKlaus Juergen EngelChristoph HerrmannRoger Steadman Booker
    • G01T1/24
    • G01T1/17
    • The present invention relates to processing electronics (18) for a detector (12) of an X-ray imaging device (14), the processing electronics (18) with a pulse counter section (22) having at least one count output (30) and with an integrator section (24) having an intensity output (32), wherein the processing electronics (18) is adapted to be connected to a sensor (16) in such a manner that X-ray photons (58) arriving at the sensor (16) can be processed by the pulse counter section (22), by the integrator section (24), or both, and wherein the processing electronics (18) comprises a processor (34) adapted to be connected to the count output (30) and to the intensity output (32) and adapted to output a count result (K) that takes into account both count information (N) obtained at the count output (30) and intensity information (I) obtained at the intensity output (32), so that the count result (K) contains information (N) obtained from the pulse counter section (22) and information (M) obtained from the integrator section (24). The present invention further relates to a corresponding detector element (10) for a detector (12), an X-ray imaging device (14), a method for determining a count result (K) from a detector element (10), a computer program, a data carrier and a detector (12) for an X-ray imaging device (14).
    • 本发明涉及用于X射线成像设备(14)的检测器(12)的处理电子器件(18),具有至少一个计数输出(30)的脉冲计数器部分(22)的处理电子器件(18) 以及具有强度输出(32)的积分器部分(24),其中处理电子器件(18)适于以使得X射线光子(58)到达传感器的方式连接到传感器(16) (16)可以由脉冲计数器部分(22),积分器部分(24)或两者处理,并且其中处理电子器件(18)包括适于连接到计数输出(30)的处理器(34) )和强度输出(32)并且适于输出考虑在计数输出(30)处获得的计数信息(N)和在强度输出(32)处获得的强度信息(I)的计数结果(K) ),使得计数结果(K)包含从脉冲计数器部分(22)获得的信息(N)和信息(M) 从积分器部分(24)获得。 本发明还涉及用于检测器(12)的相应的检测器元件(10),X射线成像装置(14),用于从检测器元件(10)确定计数结果(K)的方法,计算机 程序,数据载体和用于X射线成像装置(14)的检测器(12)。