会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 7. 发明授权
    • Lateral light shield in backside illuminated imaging sensors
    • 背面照明成像传感器的侧面防护罩
    • US08772898B2
    • 2014-07-08
    • US13370085
    • 2012-02-09
    • Duli MaoHsin-Chih TaiVincent VeneziaYin QianGang ChenHoward E. Rhodes
    • Duli MaoHsin-Chih TaiVincent VeneziaYin QianGang ChenHoward E. Rhodes
    • H01L31/0216
    • H01L27/1462H01L27/14623H01L27/1464H01L27/14685
    • A backside illuminated image sensor includes a semiconductor layer and a trench disposed in the semiconductor layer. The semiconductor layer has a frontside surface and a backside surface. The semiconductor layer includes a light sensing element of a pixel array disposed in a sensor array region of the semiconductor layer. The pixel array is positioned to receive external incoming light through the backside surface of the semiconductor layer. The semiconductor layer also includes a light emitting element disposed in a periphery circuit region of the semiconductor layer external to the sensor array region. The trench is disposed in the semiconductor layer between the light sensing element and the light emitting element. The trench is positioned to impede a light path between the light emitting element and the light sensing element when the light path is internal to the semiconductor layer.
    • 背面照明图像传感器包括设置在半导体层中的半导体层和沟槽。 半导体层具有前表面和背面。 半导体层包括设置在半导体层的传感器阵列区域中的像素阵列的光感测元件。 像素阵列被定位成接收穿过半导体层的背面的外部入射光。 半导体层还包括设置在传感器阵列区域外部的半导体层的外围电路区域中的发光元件。 沟槽设置在光感测元件和发光元件之间的半导体层中。 当光路在半导体层内部时,沟槽定位成阻碍发光元件和光感测元件之间的光路。
    • 9. 发明授权
    • In-pixel high dynamic range imaging
    • 像素高动态范围成像
    • US08643132B2
    • 2014-02-04
    • US13155969
    • 2011-06-08
    • Gang ChenDuli MaoHsin-Chih TaiHoward E. Rhodes
    • Gang ChenDuli MaoHsin-Chih TaiHoward E. Rhodes
    • H01L31/06H01L31/062H01L31/113
    • H01L27/14616H01L27/14612H01L27/14643
    • Embodiments of the invention describe providing high dynamic range imaging (HDRI or simply HDR) to an imaging pixel by coupling a floating diffusion node of the imaging pixel to a plurality of metal-oxide semiconductor (MOS) capacitance regions. It is understood that a MOS capacitance region only turns “on” (i.e., changes the overall capacitance of the floating diffusion node) when the voltage at the floating diffusion node (or a voltage difference between a gate node and the floating diffusion node) is greater than its threshold voltage; before the MOS capacitance region is “on” it does not contribute to the overall capacitance or conversion gain of the floating diffusion node.Each of the MOS capacitance regions will have different threshold voltages, thereby turning “on” at different illumination conditions. This increases the dynamic range of the imaging pixel, thereby providing HDR for the host imaging system.
    • 本发明的实施例描述了通过将成像像素的浮动扩散节点耦合到多个金属氧化物半导体(MOS)电容区域来向成像像素提供高动态范围成像(HDRI或简单的HDR)。 可以理解,当浮动扩散节点处的电压(或者栅极节点和浮动扩散节点之间的电压差)为(...)时,MOS电容区域只会变为“导通”(即,改变浮动扩散节点的整体电容) 大于其阈值电压; 在MOS电容区域“接通”之前,它不会对浮动扩散节点的整体电容或转换增益有贡献。 每个MOS电容区域将具有不同的阈值电压,从而在不同的照明条件下“打开”。 这增加了成像像素的动态范围,从而为主机成像系统提供HDR。