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1. 发明授权

US09068927B2 Laboratory diffraction-based phase contrast imaging technique 有权
$Laboratory diffraction-based phase contrast imaging technique$
标题翻译：实验室衍射相位成像技术
公开(公告)号：US09068927B2
公开(公告)日：2015-06-30
申请号：US13725480
申请日：2012-12-21
申请人： General Electric Company
发明人： Susanne Madeline Lee , Sudeep Mandal
IPC分类号： G01N23/223 , G21K1/06 , G01N23/207 , H01J35/08 , H01J35/14 , H01J35/12
CPC分类号： G01N23/207 , G21K1/06 , G21K2207/005 , H01J35/08 , H01J35/12 , H01J35/14 , H01J2235/086 , H01J2235/186
摘要： Embodiments of the disclosure relate to X-ray imaging systems. In one embodiment, the X-ray imaging system features a target configured to receive a focused electron beam from an electron emitter and emit a line source X-ray beam as a result of receiving the focused electron beam; and a monochromator crystal configured to receive the line source X-ray beam from the target and diffract only a portion of the X-rays, wherein the portion of X-rays satisfies the Bragg diffraction condition for the monochromator crystal, and wherein the monochromator crystal is oriented relative to the target such that the portion of the X-rays from the target that satisfy the Bragg condition illuminate an entire length of a surface of the monochromator crystal.
摘要翻译：本公开的实施例涉及X射线成像系统。在一个实施例中，X射线成像系统具有被配置为从电子发射器接收聚焦的电子束并且作为接收聚焦的电子束而发射线源X射线束的靶; 以及单色器晶体，被配置为从所述目标接收所述线源X射线束，并且仅衍射所述X射线的一部分，其中所述X射线部分满足所述单色器晶体的布拉格衍射条件，并且其中所述单色器晶体相对于目标取向，使得来自目标的满足布拉格条件的X射线的部分照亮单色器晶体的表面的整个长度。

2. 发明申请

US20140185778A1 MULTILAYER X-RAY SOURCE TARGET WITH HIGH THERMAL CONDUCTIVITY 有权
标题翻译：具有高导热性的多层X射线源头
公开(公告)号：US20140185778A1
公开(公告)日：2014-07-03
申请号：US13730303
申请日：2012-12-28
申请人： GENERAL ELECTRIC COMPANY
发明人： Susanne Madeline Lee , Raj Bahadur , Sudeep Mandal
IPC分类号： H01J35/12
CPC分类号： G21K1/06 , H01J5/18 , H01J35/12 , H01J2235/086 , H01J2235/087 , H01J2235/088
摘要： In one embodiment, an X-ray source is provided that includes one or more electron emitters configured to emit one or more electron beams and one or more source targets configured to receive the one or more electron beams emitted by the one or more electron emitters and, as a result of receiving the one or more electron beams, to emit X-rays. Each source target of the X-ray source includes a first layer having one or more first materials; and a second layer in thermal communication with the first layer and having one or more second materials. The first layer is positioned closer to the one or more emitters than the second layer, the first material has a higher overall thermal conductivity than the second layer, and the second layer produces the majority of the X-rays emitted by the source target.
摘要翻译：在一个实施例中，提供了一种X射线源，其包括被配置为发射一个或多个电子束的一个或多个电子发射器和被配置为接收由一个或多个电子发射器发射的一个或多个电子束的一个或多个源极，以及作为接收一个或多个电子束的结果，发射X射线。 X射线源的每个源目标包括具有一个或多个第一材料的第一层; 以及与第一层热连通并具有一个或多个第二材料的第二层。第一层被定位成比第二层更靠近一个或多个发射体，第一材料具有比第二层更高的整体热导率，第二层产生由源靶发射的大部分X射线。

3. 发明授权

US10192646B2 Radiation shielding system 有权
公开(公告)号：US10192646B2
公开(公告)日：2019-01-29
申请号：US15495142
申请日：2017-04-24
申请人： General Electric Company
发明人： Susanne Madeline Lee , Douglas Albagli , James Michael Gent , Kevin Edward Kinsey
IPC分类号： G01T1/20 , G21F1/08 , G01T1/24 , G21F1/12 , G21F3/00 , H01L27/146
摘要： A radiation shielding system for an x-ray digital detector array includes a first radiation shield having a plurality of shielding pads and a plurality of interstices between the plurality of shielding pads, the plurality of shielding pads having a greater thickness than the thickness of the plurality of interstices. The plurality of shielding pads is configured to be positioned over active components of the x-ray digital detector array and the interstices are configured to be positioned over passive components of the x-ray digital detector array.

4. 发明授权

US09869607B2 Systems and methods for distributed measurement 有权
公开(公告)号：US09869607B2
公开(公告)日：2018-01-16
申请号：US15134668
申请日：2016-04-21
申请人： General Electric Company
发明人： Sudeep Mandal , Susanne Madeline Lee , Sachin Narahari Dekate , Majid Nayeri
IPC分类号： G01N21/00 , G01M11/00 , G01J5/48
CPC分类号： G01M11/319 , G01J5/48 , G01K11/32 , G01K2011/322 , G01K2011/324 , G01N21/00
摘要： A measurement system includes a cable having a length, a light source, at least one detector, and at least one processor. The light source is operably coupled to the cable and is configured to transmit an optical signal to the cable. The at least one processor is operably coupled to the cable and configured to: receive a scattered signal from the cable responsive to the optical signal transmitted to the cable; map the scattered signal to the length of the cable; and de-convolve a spatial averaging effect of the scattered signal using a weighting profile corresponding to the light source and the cable to generate a distributed property profile defined along the length of the cable.

5. 发明授权

US09746583B2 Gas well integrity inspection system 有权
公开(公告)号：US09746583B2
公开(公告)日：2017-08-29
申请号：US14470348
申请日：2014-08-27
申请人： General Electric Company
发明人： Ertugrul Berkcan , John Scott Price , Edward James Nieters , William Robert Ross , Clifford Bueno , Yuri Alexeyevich Plotnikov , Susanne Madeline Lee
IPC分类号： G01V5/14
CPC分类号： G01V5/145
摘要： A well integrity inspection system configured to inspect a well structure including multiple concentric layers. The well integrity inspection system includes an inspection probe positioned in the well structure. The inspection probe includes a plurality of excitation assemblies for transmitting a plurality of radiation emissions into the well structure. The plurality of excitation assemblies includes at least a neutron excitation assembly and an X-ray excitation assembly. The inspection probe also includes a plurality of detection assemblies configured to receive a plurality of backscatter radiation returns from the well structure. The plurality of detection assemblies includes at least a neutron detection assembly and an X-ray detection assembly. The well integrity inspection system further including a processor operatively coupled to the inspection probe. The processor is configured to determine a well integrity parameter of the well structure based on at least one of the plurality of backscatter radiation returns.

6. 发明申请

US20170307471A1 SYSTEMS AND METHODS FOR DISTRIBUTED MEASUREMENT 有权
公开(公告)号：US20170307471A1
公开(公告)日：2017-10-26
申请号：US15134668
申请日：2016-04-21
申请人： General Electric Company
发明人： Sudeep Mandal , Susanne Madeline Lee , Sachin Narahari Dekate , Majid Nayeri
IPC分类号： G01M11/00
CPC分类号： G01M11/319 , G01J5/48 , G01K11/32 , G01K2011/322 , G01K2011/324 , G01N21/00
摘要： A measurement system includes a cable having a length, a light source, at least one detector, and at least one processor. The light source is operably coupled to the cable and is configured to transmit an optical signal to the cable. The at least one processor is operably coupled to the cable and configured to: receive a scattered signal from the cable responsive to the optical signal transmitted to the cable; map the scattered signal to the length of the cable; and de-convolve a spatial averaging effect of the scattered signal using a weighting profile corresponding to the light source and the cable to generate a distributed property profile defined along the length of the cable.

7. 发明申请

US20160061991A1 GAS WELL INTEGRITY INSPECTION SYSTEM 有权
标题翻译：气体良好检测系统
公开(公告)号：US20160061991A1
公开(公告)日：2016-03-03
申请号：US14470348
申请日：2014-08-27
申请人： General Electric Company
发明人： Ertugrul Berkcan , John Scott Price , Edward James Nieters , William Robert Ross , Clifford Bueno , Yuri Alexeyevich Plotnikov , Susanne Madeline Lee
IPC分类号： G01V5/14
CPC分类号： G01V5/145
摘要： A well integrity inspection system configured to inspect a well structure including multiple concentric layers. The well integrity inspection system includes an inspection probe positioned in the well structure. The inspection probe includes a plurality of excitation assemblies for transmitting a plurality of radiation emissions into the well structure. The plurality of excitation assemblies includes at least a neutron excitation assembly and an X-ray excitation assembly. The inspection probe also includes a plurality of detection assemblies configured to receive a plurality of backscatter radiation returns from the well structure. The plurality of detection assemblies includes at least a neutron detection assembly and an X-ray detection assembly. The well integrity inspection system further including a processor operatively coupled to the inspection probe. The processor is configured to determine a well integrity parameter of the well structure based on at least one of the plurality of backscatter radiation returns.
摘要翻译：一种良好完整性检查系统，其被配置为检查包括多个同心层的井结构。井完整性检查系统包括位于井结构中的检查探针。检查探针包括用于将多个辐射发射物传输到井结构中的多个激发组件。多个激励组件至少包括中子激发组件和X射线激发组件。检查探针还包括多个检测组件，其被配置为从井结构接收多个反向散射辐射返回。多个检测组件至少包括中子检测组件和X射线检测组件。井完整性检查系统还包括可操作地耦合到检查探针的处理器。处理器被配置为基于多个反向散射辐射返回中的至少一个来确定井结构的井完整性参数。

8. 发明申请

US20170309355A1 RADIATION SHIELDING SYSTEM 审中-公开
公开(公告)号：US20170309355A1
公开(公告)日：2017-10-26
申请号：US15495142
申请日：2017-04-24
申请人： General Electric Company
发明人： Susanne Madeline Lee , Douglas Albagli , James Michael Gent , Kevin Edward Kinsey
IPC分类号： G21F1/08 , G01T1/20
CPC分类号： G21F1/085 , G01T1/2018 , G01T1/24 , G21F1/125 , G21F3/00 , H01L27/14623 , H01L27/14658 , H01L27/14676
摘要： A radiation shielding system for an x-ray digital detector array includes a first radiation shield having a plurality of shielding pads and a plurality of interstices between the plurality of shielding pads, the plurality of shielding pads having a greater thickness than the thickness of the plurality of interstices. The plurality of shielding pads is configured to be positioned over active components of the x-ray digital detector array and the interstices are configured to be positioned over passive components of the x-ray digital detector array.

9. 发明授权

US09008278B2 Multilayer X-ray source target with high thermal conductivity 有权
标题翻译：具有高导热性的多层X射线源靶
公开(公告)号：US09008278B2
公开(公告)日：2015-04-14
申请号：US13730303
申请日：2012-12-28
申请人： General Electric Company
发明人： Susanne Madeline Lee , Raj Bahadur , Sudeep Mandal
IPC分类号： H01J35/06 , B82Y99/00 , H01J5/18 , G21K1/06 , H01J35/12
CPC分类号： G21K1/06 , H01J5/18 , H01J35/12 , H01J2235/086 , H01J2235/087 , H01J2235/088
摘要： In one embodiment, an X-ray source is provided that includes one or more electron emitters configured to emit one or more electron beams and one or more source targets configured to receive the one or more electron beams emitted by the one or more electron emitters and, as a result of receiving the one or more electron beams, to emit X-rays. Each source target of the X-ray source includes a first layer having one or more first materials; and a second layer in thermal communication with the first layer and having one or more second materials. The first layer is positioned closer to the one or more emitters than the second layer, the first material has a higher overall thermal conductivity than the second layer, and the second layer produces the majority of the X-rays emitted by the source target.
摘要翻译：在一个实施例中，提供了一种X射线源，其包括被配置为发射一个或多个电子束的一个或多个电子发射器和被配置为接收由一个或多个电子发射器发射的一个或多个电子束的一个或多个源极，以及作为接收一个或多个电子束的结果，发射X射线。 X射线源的每个源目标包括具有一个或多个第一材料的第一层; 以及与第一层热连通并具有一个或多个第二材料的第二层。第一层被定位成比第二层更靠近一个或多个发射体，第一材料具有比第二层更高的整体热导率，第二层产生由源靶发射的大部分X射线。

10. 发明申请

US20140177801A1 LABORATORY DIFFRACTION-BASED PHASE CONTRAST IMAGING TECHNIQUE 有权
标题翻译：基于实验基于差分的相位对比成像技术
公开(公告)号：US20140177801A1
公开(公告)日：2014-06-26
申请号：US13725480
申请日：2012-12-21
申请人： GENERAL ELECTRIC COMPANY
发明人： Susanne Madeline Lee , Sudeep Mandal
IPC分类号： G01N23/207
CPC分类号： G01N23/207 , G21K1/06 , G21K2207/005 , H01J35/08 , H01J35/12 , H01J35/14 , H01J2235/086 , H01J2235/186
摘要： Embodiments of the disclosure relate to X-ray imaging systems. In one embodiment, the X-ray imaging system features a target configured to receive a focused electron beam from an electron emitter and emit a line source X-ray beam as a result of receiving the focused electron beam; and a monochromator crystal configured to receive the line source X-ray beam from the target and diffract only a portion of the X-rays, wherein the portion of X-rays satisfies the Bragg diffraction condition for the monochromator crystal, and wherein the monochromator crystal is oriented relative to the target such that the portion of the X-rays from the target that satisfy the Bragg condition illuminate an entire length of a surface of the monochromator crystal.
摘要翻译：本公开的实施例涉及X射线成像系统。在一个实施例中，X射线成像系统具有被配置为从电子发射器接收聚焦的电子束并且作为接收聚焦的电子束而发射线源X射线束的靶; 以及单色器晶体，被配置为从所述目标接收所述线源X射线束，并且仅衍射所述X射线的一部分，其中所述X射线部分满足所述单色器晶体的布拉格衍射条件，并且其中所述单色器晶体相对于目标取向，使得来自目标的满足布拉格条件的X射线的部分照亮单色器晶体的表面的整个长度。

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