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    • 1. 发明授权
    • Universal four-side buttable digital CMOS imager
    • 通用四面对面数字CMOS成像器
    • US09571765B2
    • 2017-02-14
    • US14750067
    • 2015-06-25
    • General Electric Company
    • Jianjun GuoBrian David YanoffJonathan David ShortBiju Jacob
    • H04N5/335H04N5/369H04N5/378
    • H04N5/369H01L27/14641H04N5/347H04N5/37457H04N5/378
    • An imager including sub-imager pixel arrays having a plurality of four-side buttable imagers distributed on a substrate and an on-chip digitizing readout circuit. Pixel groupings formed from among the plurality of four-side buttable imagers. The readout electronics including a buffer amplifier for each of the pixel groupings and connected to respective outputs of each four-side buttable imager of the pixel grouping. A plurality of shared analog front ends, each shared analog front end connected to respective multiple buffer amplifiers from among the plurality of pixel groupings. An analog-to-digital converter located at a common centroid location relative to the plurality of shared analog front ends, the analog-to-digital converter having a fully addressable input selection to individually select an output from each of the plurality of shared analog front ends. An output of the analog-to-digital converter connected to a trace on a back surface of the wafer substrate by a through-substrate-via.
    • 包括具有分布在基板上的多个四边对称成像器的子成像像素阵列和片上数字化读出电路的成像器。 从多个四面对面的成像器中形成的像素组。 读出电路包括用于每个像素分组的缓冲放大器,并且连接到像素分组的每个四面可图像成像器的相应输出。 多个共享模拟前端,每个共享模拟前端从多个像素分组中连接到相应的多个缓冲放大器。 一种模数转换器,位于相对于多个共享模拟前端的公共中心位置处,该模数转换器具有完全可寻址的输入选择,以单独选择多个共享模拟前端中的每一个的输出 结束。 模数转换器的输出通过基板通孔连接到晶片衬底背面上的迹线。
    • 6. 发明申请
    • UNIVERSAL FOUR-SIDE BUTTABLE DIGITAL CMOS IMAGER
    • 通用四边可调数字CMOS图像
    • US20160381311A1
    • 2016-12-29
    • US14750067
    • 2015-06-25
    • General Electric Company
    • Jianjun GuoBrian David YanoffJonathan David ShortBiju Jacob
    • H04N5/369H04N5/378
    • H04N5/369H01L27/14641H04N5/347H04N5/37457H04N5/378
    • An imager including sub-imager pixel arrays having a plurality of four-side buttable imagers distributed on a substrate and an on-chip digitizing readout circuit. Pixel groupings formed from among the plurality of four-side buttable imagers. The readout electronics including a buffer amplifier for each of the pixel groupings and connected to respective outputs of each four-side buttable imager of the pixel grouping. A plurality of shared analog front ends, each shared analog front end connected to respective multiple buffer amplifiers from among the plurality of pixel groupings. An analog-to-digital converter located at a common centroid location relative to the plurality of shared analog front ends, the analog-to-digital converter having a fully addressable input selection to individually select an output from each of the plurality of shared analog front ends. An output of the analog-to-digital converter connected to a trace on a back surface of the wafer substrate by a through-substrate-via.
    • 包括具有分布在基板上的多个四边对称成像器的子成像像素阵列和片上数字化读出电路的成像器。 从多个四面对面的成像器中形成的像素组。 读出电路包括用于每个像素分组的缓冲放大器,并且连接到像素分组的每个四面可图像成像器的相应输出。 多个共享模拟前端,每个共享模拟前端从多个像素分组中连接到相应的多个缓冲放大器。 一种模数转换器,位于相对于多个共享模拟前端的公共中心位置处,该模数转换器具有完全可寻址的输入选择,以单独选择多个共享模拟前端中的每一个的输出 结束。 模数转换器的输出通过基板通孔连接到晶片衬底背面上的迹线。
    • 9. 发明授权
    • Apparatus for reducing photodiode thermal gain coefficient
    • 减少光电二极管热增益系数的装置
    • US08564086B2
    • 2013-10-22
    • US13853192
    • 2013-03-29
    • General Electric Company
    • Wen LiJonathan David ShortGeorge Edward Possin
    • H01L27/146
    • H01L27/14601A61B6/032G01T1/2018G01T1/249H01L31/105
    • An apparatus for reducing photodiode thermal gain coefficient includes a bulk semiconductor material having a light-illumination side. The bulk semiconductor material includes a minority charge carrier diffusion length property configured to substantially match a predetermined hole diffusion length value and a thickness configured to substantially match a predetermined photodiode layer thickness. The apparatus also includes a dead layer coupled to the light-illumination side of the bulk semiconductor material, the dead layer having a thickness configured to substantially match a predetermined thickness value and wherein an absolute value of a thermal coefficient of gain due to the minority carrier diffusion length property of the bulk semiconductor material is configured to substantially match an absolute value of a thermal coefficient of gain due to the thickness of the dead layer.
    • 减少光电二极管热增益系数的装置包括具有光照射侧的体半导体材料。 体半导体材料包括少数电荷载流子扩散长度特性,其被配置为基本上匹配预定的空穴扩散长度值和被配置为基本匹配预定的光电二极管层厚度的厚度。 该装置还包括耦合到体半导体材料的光照射侧的死层,该死层具有被配置为基本匹配预定厚度值的厚度,并且其中由少数载体产生的增益热系数的绝对值 体半导体材料的扩散长度特性被配置为基本上匹配由于死层的厚度而导致的增益热系数的绝对值。