专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20170178308A1 METHODS AND SYSTEMS FOR DETECTING COMPONENT WEAR 有权
公开(公告)号：US20170178308A1
公开(公告)日：2017-06-22
申请号：US14977253
申请日：2015-12-21
申请人： General Electric Company
发明人： Arun Karthi Subramaniyan , Khan Mohamed Khirullah Genghis Khan , Clifford Bueno , Ali Can , Adrian Gabriel Loghin , Jie Yu
IPC分类号： G06T7/00 , G06T5/50 , G06K9/62 , G06K9/00 , G06F17/50 , G06K9/46
CPC分类号： G06T7/001 , G06K9/00208 , G06K9/6212 , G06K9/6214 , G06K2209/19 , G06T7/11 , G06T2207/10081 , G06T2207/30164
摘要： A monitoring system for determining component wear is provided. The monitoring system includes a memory device configured to store a reference model of a component and a component wear monitoring (CWM) device configured to receive a component image of a first component being inspected, detect a plurality of manmade structural features in the received component image, adjust the component image to mask out at least some of the plurality of manmade structural features from the received component image, compare the adjusted component image with the reference model to determine one or more potential defect areas in the first component, analyze each of the one or more defect areas to determine a state of the potential defect areas, and output the state of the one or more potential defect areas to a user.

2. 发明申请

US20180193947A1 IMAGING DEVICES FOR USE WITH ADDITIVE MANUFACTURING SYSTEMS AND METHODS OF MONITORING AND INSPECTING ADDITIVE MANUFACTURING COMPONENTS 审中-公开
公开(公告)号：US20180193947A1
公开(公告)日：2018-07-12
申请号：US15867112
申请日：2018-01-10
申请人： General Electric Company
发明人： Kevin George Harding , William Robert Ross , Bryon Edward Knight , Venkata Vijayaraghava Nalladega , Clifford Bueno
IPC分类号： B23K26/03 , B33Y10/00 , B33Y30/00 , B33Y40/00 , B23K26/342 , G01N23/04
摘要： An additive manufacturing system includes at least one imaging device configured to direct electromagnetic radiation towards a build layer of a component positioned within a powder bed of the additive manufacturing system. The additive manufacturing system also includes at least one detector configured to detect the electromagnetic radiation that reflects from the build layer.

3. 发明授权

US09746583B2 Gas well integrity inspection system 有权
公开(公告)号：US09746583B2
公开(公告)日：2017-08-29
申请号：US14470348
申请日：2014-08-27
申请人： General Electric Company
发明人： Ertugrul Berkcan , John Scott Price , Edward James Nieters , William Robert Ross , Clifford Bueno , Yuri Alexeyevich Plotnikov , Susanne Madeline Lee
IPC分类号： G01V5/14
CPC分类号： G01V5/145
摘要： A well integrity inspection system configured to inspect a well structure including multiple concentric layers. The well integrity inspection system includes an inspection probe positioned in the well structure. The inspection probe includes a plurality of excitation assemblies for transmitting a plurality of radiation emissions into the well structure. The plurality of excitation assemblies includes at least a neutron excitation assembly and an X-ray excitation assembly. The inspection probe also includes a plurality of detection assemblies configured to receive a plurality of backscatter radiation returns from the well structure. The plurality of detection assemblies includes at least a neutron detection assembly and an X-ray detection assembly. The well integrity inspection system further including a processor operatively coupled to the inspection probe. The processor is configured to determine a well integrity parameter of the well structure based on at least one of the plurality of backscatter radiation returns.

4. 发明授权

US09746405B2 Method for elementally detecting variations in density 有权
公开(公告)号：US09746405B2
公开(公告)日：2017-08-29
申请号：US14274160
申请日：2014-05-09
申请人： GENERAL ELECTRIC COMPANY
发明人： Philip Harold Monaghan , Clifford Bueno , Jonathan Immanuel Sperl , Cristina Francesca Cozzini
IPC分类号： G01N23/00 , G01N9/24 , G01N23/04 , G01T1/29
CPC分类号： G01N9/24 , G01N23/04 , G01N23/046 , G01N2223/419 , G01N2223/652 , G01T1/2985
摘要： A method and system are provided for elementally detecting variations in density. The method includes providing a computed tomography device, comprising a radiation source, a detector, and at least one grating between the radiation source and the detector, positioning the component between the radiation source and the detector, directing radiation from the radiation source to the detector to acquire information from the component, generating at least one phase contrast image and at least one dark field contrast image of the component corresponding to variations in density with the information from the component, correlating the variations in density to a foreign mass, and displaying foreign mass distribution within the component. The system includes a radiation source, a detector, a component, a first grating, a second grating, and an analysis device capable of determining total variation of density in response to radiation received by the detector, and correlating the variation of density to free element distribution in the component.

5. 发明授权

US09721044B2 Systems and methods for non-destructive evaluation of molds and crucibles used in investment casting 有权
公开(公告)号：US09721044B2
公开(公告)日：2017-08-01
申请号：US13891624
申请日：2013-05-10
申请人： GENERAL ELECTRIC COMPANY
发明人： Bernard Patrick Bewlay , Jonathan Sebastian Janssen , Christopher Allen Nafis , Clifford Bueno , Krzysztof Lesnicki
IPC分类号： G06F19/00 , G06F17/50 , G01B21/04 , G01B21/20 , G01B11/24
CPC分类号： G06F17/50 , G01B11/24 , G01B21/04 , G01B21/20
摘要： Systems for non-destructive evaluation (NDE) of molds and crucibles used in investment casting processes include a support, a 3D scanning device, and a computer component. Methods for non-destructive evaluation include providing a system for non-destructive evaluation of a mold or crucible; securing a mold or crucible to the support of the system; and operating the 3D scanning device of the system in conjunction with the computer component in order to create a 3D structure difference map that indicates whether the mold or crucible falls within or outside a desired structural integrity parameter range.

6. 发明授权

US10168288B2 System for radiography imaging and method of operating such system 有权
公开(公告)号：US10168288B2
公开(公告)日：2019-01-01
申请号：US14860197
申请日：2015-09-21
申请人： General Electric Company
发明人： Clifford Bueno , Tamas Gschwendtner , George Gibson Chalmers , Donald Seton Farquhar , Antonio Luigi Ibba
IPC分类号： G01N23/04 , G01N23/06 , G01N23/083 , G01N23/087 , G01T1/20
摘要： A radiography imaging system for generating images of a pipe assembly includes a radiation source for emitting rays. The pipe assembly includes at least one of a pipe, tubing, and a weld. The radiation source includes a radioactive isotope having an activity level within a range between about 1 Curie and about 40 Curies. The radiation source is positioned adjacent a portion of the pipe assembly. A detector is positioned opposite the radiation source. The portion of the pipe assembly is positioned between the radiation source and the detector such that the rays interact with the portion of the pipe assembly and strike the detector. The detector includes an imaging plate that is activated by illumination with the rays with an exposure within a range between about 0.5 Curie-minute and about 5 Curie-minutes of radiation. The imaging plate has a thickness within a range between about 5 mm and about 15 mm. The detector further includes an imaging unit for generating images based on information from the imaging plate. The imaging unit has a pixel pitch that is within a range between about 25 microns and about 100 microns.

7. 发明授权

US09747683B2 Methods and systems for detecting component wear 有权
公开(公告)号：US09747683B2
公开(公告)日：2017-08-29
申请号：US14977253
申请日：2015-12-21
申请人： General Electric Company
发明人： Arun Karthi Subramaniyan , Khan Mohamed Khirullah Genghis Khan , Clifford Bueno , Ali Can , Adrian Gabriel Loghin , Jie Yu
IPC分类号： G06T7/00 , G06F17/50 , G06K9/46 , G06K9/62 , G06K9/00 , G06T5/50
CPC分类号： G06T7/001 , G06K9/00208 , G06K9/6212 , G06K9/6214 , G06K2209/19 , G06T7/11 , G06T2207/10081 , G06T2207/30164
摘要： A monitoring system for determining component wear is provided. The monitoring system includes a memory device configured to store a reference model of a component and a component wear monitoring (CWM) device configured to receive a component image of a first component being inspected, detect a plurality of manmade structural features in the received component image, adjust the component image to mask out at least some of the plurality of manmade structural features from the received component image, compare the adjusted component image with the reference model to determine one or more potential defect areas in the first component, analyze each of the one or more defect areas to determine a state of the potential defect areas, and output the state of the one or more potential defect areas to a user.

8. 发明授权

US10773336B2 Imaging devices for use with additive manufacturing systems and methods of monitoring and inspecting additive manufacturing components 有权
公开(公告)号：US10773336B2
公开(公告)日：2020-09-15
申请号：US15867112
申请日：2018-01-10
申请人： General Electric Company
发明人： Kevin George Harding , William Robert Ross , Bryon Edward Knight , Venkata Vijayaraghava Nalladega , Clifford Bueno
IPC分类号： B23K26/03 , G01N23/04 , B33Y40/00 , B23K26/342 , B33Y50/02 , B22F3/105 , G01N23/203 , G05B19/4099 , B33Y10/00 , B33Y30/00
摘要： An additive manufacturing system includes at least one imaging device configured to direct electromagnetic radiation towards a build layer of a component positioned within a powder bed of the additive manufacturing system. The additive manufacturing system also includes at least one detector configured to detect the electromagnetic radiation that reflects from the build layer.

9. 发明申请

US20170082556A1 SYSTEM FOR RADIOGRAPHY IMAGING AND METHOD OF OPERATING SUCH SYSTEM 审中-公开
公开(公告)号：US20170082556A1
公开(公告)日：2017-03-23
申请号：US14860197
申请日：2015-09-21
申请人： General Electric Company
发明人： Clifford Bueno , Tamas Gschwendtner , George Gibson Chalmers , Donald Seton Farquhar , Antonio Luigi Ibba
IPC分类号： G01N23/04
CPC分类号： G01N23/04 , G01N23/06 , G01N23/083 , G01N23/087 , G01N2223/628 , G01T1/2012 , G01T1/2018
摘要： A radiography imaging system for generating images of a pipe assembly includes a radiation source for emitting rays. The pipe assembly includes at least one of a pipe, tubing, and a weld. The radiation source includes a radioactive isotope having an activity level within a range between about 1 Curie and about 40 Curies. The radiation source is positioned adjacent a portion of the pipe assembly. A detector is positioned opposite the radiation source. The portion of the pipe assembly is positioned between the radiation source and the detector such that the rays interact with the portion of the pipe assembly and strike the detector. The detector includes an imaging plate that is activated by illumination with the rays with an exposure within a range between about 0.5 Curie-minute and about 5 Curie-minutes of radiation. The imaging plate has a thickness within a range between about 5 mm and about 15 mm. The detector further includes an imaging unit for generating images based on information from the imaging plate. The imaging unit has a pixel pitch that is within a range between about 25 microns and about 100 microns.

10. 发明申请

US20160061991A1 GAS WELL INTEGRITY INSPECTION SYSTEM 有权
标题翻译：气体良好检测系统
公开(公告)号：US20160061991A1
公开(公告)日：2016-03-03
申请号：US14470348
申请日：2014-08-27
申请人： General Electric Company
发明人： Ertugrul Berkcan , John Scott Price , Edward James Nieters , William Robert Ross , Clifford Bueno , Yuri Alexeyevich Plotnikov , Susanne Madeline Lee
IPC分类号： G01V5/14
CPC分类号： G01V5/145
摘要： A well integrity inspection system configured to inspect a well structure including multiple concentric layers. The well integrity inspection system includes an inspection probe positioned in the well structure. The inspection probe includes a plurality of excitation assemblies for transmitting a plurality of radiation emissions into the well structure. The plurality of excitation assemblies includes at least a neutron excitation assembly and an X-ray excitation assembly. The inspection probe also includes a plurality of detection assemblies configured to receive a plurality of backscatter radiation returns from the well structure. The plurality of detection assemblies includes at least a neutron detection assembly and an X-ray detection assembly. The well integrity inspection system further including a processor operatively coupled to the inspection probe. The processor is configured to determine a well integrity parameter of the well structure based on at least one of the plurality of backscatter radiation returns.
摘要翻译：一种良好完整性检查系统，其被配置为检查包括多个同心层的井结构。井完整性检查系统包括位于井结构中的检查探针。检查探针包括用于将多个辐射发射物传输到井结构中的多个激发组件。多个激励组件至少包括中子激发组件和X射线激发组件。检查探针还包括多个检测组件，其被配置为从井结构接收多个反向散射辐射返回。多个检测组件至少包括中子检测组件和X射线检测组件。井完整性检查系统还包括可操作地耦合到检查探针的处理器。处理器被配置为基于多个反向散射辐射返回中的至少一个来确定井结构的井完整性参数。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式