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    • 1. 发明授权
    • Self-timed semiconductor integrated circuit device
    • 自定时半导体集成电路器件
    • US5612640A
    • 1997-03-18
    • US308303
    • 1994-09-19
    • Fumio MurabayashiTatsumi YamauchiYutaka Kobayashi
    • Fumio MurabayashiTatsumi YamauchiYutaka Kobayashi
    • G06F7/00G06F9/38G06F15/78H04L7/00H03K5/13
    • G06F9/3869
    • A semiconductor integrated circuit device is equipped with a series of data handling stages, at least one of which includes a plurality of functional blocks arranged in parallel, a connecting means for connecting the functional blocks to functional blocks in a subsequent data handling stage, and a detection means for detecting data flow along a first connection in the connecting means. The detection means is included within a control means which controls data flow through at least one other connection in the connecting means based on the detection of data flow through the first connection in the connecting means. In a second embodiment, the semiconductor integrated circuit device includes a plurality of functional blocks arranged in a series for handling data along the series, a connecting means for handling data flow between at least two of the functional blocks, a data detecting means for detecting data flow along a selected connection in the connecting means, and for controlling data flow along another connection in the connecting means based on the detection of data flow through the selected connection.
    • 半导体集成电路器件配备有一系列数据处理级,其中至少一个包括并行布置的多个功能块,用于在后续数据处理阶段将功能块连接到功能块的连接装置,以及 检测装置,用于沿连接装置中的第一连接检测数据流。 检测装置包括在控制装置内,该控制装置基于通过连接装置中的第一连接的数据流的检测来控制连接装置中的至少一个其他连接的数据流。 在第二实施例中,半导体集成电路器件包括一系列用于处理串联数据的功能块,用于处理至少两个功能块之间的数据流的连接装置,用于检测数据的数据检测装置 沿着所述连接装置中的所选连接流动,并且用于基于通过所选择的连接的数据流的检测来控制沿连接装置中的另一连接的数据流。
    • 10. 发明授权
    • High-speed semiconductor memory device and data processing system using
the same
    • 高速半导体存储器件和数据处理系统使用相同
    • US5654931A
    • 1997-08-05
    • US213531
    • 1994-03-16
    • Akihiro TambaMasahiro IwamuraYutaka KobayashiKinya MitsumotoTatsumi YamauchiShuko YamauchiTakashi Akioka
    • Akihiro TambaMasahiro IwamuraYutaka KobayashiKinya MitsumotoTatsumi YamauchiShuko YamauchiTakashi Akioka
    • G11C7/22G11C13/00
    • G11C7/22
    • A semiconductor integrated circuit device is divided into a plurality of blocks, which are individually equipped with signal generate units such that the signal generate units are distributed in the semiconductor integrated circuit device. The semiconductor integrated circuit device is preferably constructed to generate the pulse signal by the pulse generate units which are provided for the individual blocks, after all initial logic operations on the data and control signals have been taken. Thanks to this construction, an SRAM, for example, can have its write recovery time minimized to 0 so that it can achieve high-speed operations. Moreover, since predecoders are provided for the individual blocks, the wiring line number and area in the chip can be reduced to improve the degree of integration of the semiconductor integrated circuit device. Still moreover, signal delay and skew can be reduced in the chip so that high-speed can be achieved. Another feature is that either the input/output pads of the data into or out of the semiconductor integrated circuit device or their accompanying circuit units are distributed in the semiconductor integrated circuit device. The individual features described above can be used solely or in combination, if necessary, to achieve the above-specified objects.
    • 半导体集成电路器件被分成多个块,它们分别配备有信号生成单元,使得信号生成单元分布在半导体集成电路器件中。 优选地,半导体集成电路器件被构造为在对数据和控制信号进行了所有初始逻辑运算之后,通过针对各个块提供的脉冲产生单元产生脉冲信号。 由于这种结构,例如,SRAM可以将其写恢复时间最小化为0,从而可以实现高速操作。 此外,由于为每个块提供预编码器,所以可以减少芯片中的布线数量和面积,以提高半导体集成电路器件的集成度。 此外,芯片中的信号延迟和偏斜可以降低,从而可以实现高速度。 另一个特征是将半导体集成电路器件的数据的输入/输出焊盘或其相应的电路单元分布在半导体集成电路器件中。 如果需要,可以单独地或组合地使用上述各个特征来实现上述目的。