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    • 1. 发明申请
    • Variation tolerant charge leakage correction circuit for phase locked loops
    • 用于锁相环的变容差电荷泄漏校正电路
    • US20060044030A1
    • 2006-03-02
    • US10926596
    • 2004-08-26
    • Franklin BaezDavid BoerstlerEskinder HailuKazuhiko Miki
    • Franklin BaezDavid BoerstlerEskinder HailuKazuhiko Miki
    • H03L7/06
    • H03L7/0893H03L7/095
    • The present invention provides for compensation of leakage charge in a PLL. A first plurality and second plurality of charge pumps has a source charge pump and a sink charge pump, and each charge pump has its own switch. A first node is coupled between at least one source charge pump and at least one sink charge pump. A second node coupled between at least one source charge pump and at least one sink charge pump. A PLL filter is coupled to the first node. A dummy filter is coupled to the second node. A first input of a differential mode sensor is coupled to the PLL filter. A second input of a differential mode sensor is coupled to the dummy filter. A first input of a common mode sensor is coupled to the dummy filter. A second input of a common mode sensor coupled to the PLL filter.
    • 本发明提供了对PLL中的泄漏电荷的补偿。 第一多个和第二多个电荷泵具有源电荷泵和吸收电荷泵,并且每个电荷泵具有其自己的开关。 第一节点耦合在至少一个源电荷泵和至少一个电荷泵之间。 耦合在至少一个源电荷泵和至少一个吸收电荷泵之间的第二节点。 PLL滤波器耦合到第一节点。 虚拟滤波器耦合到第二节点。 差分模式传感器的第一输入端耦合到PLL滤波器。 差模传感器的第二输入端连接到虚拟滤波器。 共模传感器的第一输入耦合到虚拟滤波器。 耦合到PLL滤波器的共模传感器的第二输入。
    • 5. 发明申请
    • Thermal sensing method and apparatus using existing ESD devices
    • 使用现有ESD器件的热感测方法和设备
    • US20070075370A1
    • 2007-04-05
    • US11242675
    • 2005-10-04
    • David BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • David BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • H01L23/62
    • G01K7/01G01K2217/00
    • The present invention provides a method, an apparatus, and a computer program product for measuring the temperature of a microprocessor through the use of ESD circuitry. The present invention uses diodes and an I/O pad within ESD circuits to determine the temperature at the location of the ESD circuitry. First, a current measuring device connects to a diode. A user or a computer program disables the protected component or circuitry, and subsequently applies a predetermined voltage to the I/O pad. This creates a reverse saturation current through the diode, which is measured by the current measuring device. From this current the user or a computer program determines the temperature of the microprocessor at the diode through the use of a graphical representation of diode reverse saturation current and corresponding temperature.
    • 本发明提供了一种通过使用ESD电路来测量微处理器的温度的方法,装置和计算机程序产品。 本发明在ESD电路中使用二极管和I / O焊盘来确定ESD电路位置处的温度。 首先,电流测量装置连接到二极管。 用户或计算机程序禁用受保护的组件或电路,然后将预定电压施加到I / O焊盘。 这通过二极管产生反向饱和电流,由电流测量装置测量。 从该电流,用户或计算机程序通过使用二极管反向饱和电流和相应温度的图形表示来确定微处理器在二极管处的温度。
    • 7. 发明申请
    • PLL filter leakage sensor
    • PLL滤波器泄漏传感器
    • US20050280406A1
    • 2005-12-22
    • US10870533
    • 2004-06-17
    • David BoerstlerEskinder HailuKazuhiko Miki
    • David BoerstlerEskinder HailuKazuhiko Miki
    • G06F19/00H03L7/093
    • H03L7/093
    • The present invention provides a method, apparatus, and computer program for measuring the current leakage in a Low Pass Filter (LPF) capacitor of a Phased Locked Loop (PLL). As a result of thinner and thinner film capacitors in Complementary Metal-Oxide Semiconductor (CMOS) technology, leakage current, which causes a PLL to drift out of phase lock, has become an increasingly difficult problem. To overcome the leakage current problems, knowing the leakage current of an LPF capacitor is important to implement the correction circuitry. In the present invention, an external interface and a time interface analyzer are used to charge the LPF capacitor and measure the output frequency of the PLL's Voltage Controlled Oscillator. Because of the change in the output frequency, the leakage current can be determined.
    • 本发明提供一种用于测量相位锁定环(PLL)的低通滤波器(LPF)电容器中的电流泄漏的方法,装置和计算机程序。 由于互补金属氧化物半导体(CMOS)技术中薄膜电容器越来越薄,导致PLL漂移出相位锁定的漏电流已经成为越来越难的问题。 为了克服漏电流问题,知道LPF电容器的漏电流对于实现校正电路是重要的。 在本发明中,使用外部接口和时间接口分析器对LPF电容器充电并测量PLL的压控振荡器的输出频率。 由于输出频率的变化,可以确定漏电流。
    • 10. 发明申请
    • Self-biased high speed level shifter circuit
    • 自偏置高速电平转换电路
    • US20070008003A1
    • 2007-01-11
    • US11171758
    • 2005-06-30
    • David BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • David BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • H03K19/0175
    • H03K19/018507
    • A method and apparatus for translating signals between different components located in different power boundaries in a mixed voltage system. A level shifter system includes a first level shifter circuit connected to a first voltage source. A second level shifter circuit connects to a second voltage source. An intermediate level shifter circuit has an input that connects to the output of the first level shifter circuit. The output of the intermediate level shifter circuit connects to the input of the second level shifter circuit. The intermediate level shifter circuit uses an intermediate voltage source having an intermediate voltage about midway between the first voltage of the first voltage source and the second voltage of the second voltage source.
    • 一种用于在混合电压系统中位于不同功率边界的不同部件之间转换信号的方法和装置。 电平移位器系统包括连接到第一电压源的第一电平移位器电路。 第二电平移位器电路连接到第二电压源。 中间电平移位器电路具有连接到第一电平移位器电路的输出的输入。 中间电平移位器电路的输出连接到第二电平移位器电路的输入端。 中间电平移位器电路使用具有在第一电压源的第一电压和第二电压源的第二电压之间的中间的中间电压的中间电压源。