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1. 发明授权

US08338803B2 Device for testing an integrated circuit and method for implementing same 有权
标题翻译：用于测试集成电路的装置及其实现方法
公开(公告)号：US08338803B2
公开(公告)日：2012-12-25
申请号：US13140409
申请日：2009-12-02
申请人： Florent Miller , Cécile Weulersse , Antonin Bougerol , Thierry Carriere , Patrick Heins , Samuel Hazo
发明人： Florent Miller , Cécile Weulersse , Antonin Bougerol , Thierry Carriere , Patrick Heins , Samuel Hazo
IPC分类号： G01N23/02 , H01J37/317 , H01L21/265
CPC分类号： G01R31/2881 , G01R31/002 , G01R31/2849
摘要： The invention relates to a device for testing an integrated circuit. The device comprises a plate for receiving and subjecting the integrated circuit to a test. The plate comprises a component for powering and operating the integrated circuit and another component for measuring the operation of the integrated circuit during the test. The device also comprises an irradiation device for subjecting the circuit to a proton bombardment and a mask with a variable thickness provided between a bombardment access region on the integrated circuit and an established zone of the integrated circuit.
摘要翻译：本发明涉及用于测试集成电路的装置。该装置包括用于接收和使集成电路经受测试的板。该板包括用于为集成电路供电和操作的部件，以及用于在测试期间测量集成电路的操作的另一部件。该装置还包括用于对电路进行质子轰击的照射装置和设置在集成电路的轰击访问区域和集成电路的建立区域之间的具有可变厚度的掩模。

2. 发明申请

US20120001088A1 DEVICE FOR TESTING AN INTEGRATED CIRCUIT AND METHOD FOR IMPLEMENTING SAME 有权
标题翻译：用于测试集成电路的装置及其实现方法
公开(公告)号：US20120001088A1
公开(公告)日：2012-01-05
申请号：US13140409
申请日：2009-12-02
申请人： Florent Miller , Cécile Weulersse , Antonin Bougerol , Thierry Carriere , Patrick Heins , Samuel Hazo
发明人： Florent Miller , Cécile Weulersse , Antonin Bougerol , Thierry Carriere , Patrick Heins , Samuel Hazo
IPC分类号： G01N23/02
CPC分类号： G01R31/2881 , G01R31/002 , G01R31/2849
摘要： The invention relates to a device for testing an integrated circuit. The device comprises a plate for receiving and subjecting the integrated circuit to a test. The plate comprises a component for powering and operating the integrated circuit and another component for measuring the operation of the integrated circuit during the test. The device also comprises an irradiation device for subjecting the circuit to a proton bombardment and a mask with a variable thickness provided between a bombardment access region on the integrated circuit and an established zone of the integrated circuit.
摘要翻译：本发明涉及用于测试集成电路的装置。该装置包括用于接收和使集成电路经受测试的板。该板包括用于为集成电路供电和操作的部件，以及用于在测试期间测量集成电路的操作的另一部件。该装置还包括用于对电路进行质子轰击的照射装置和设置在集成电路的轰击访问区域和集成电路的建立区域之间的具有可变厚度的掩模。

3. 发明授权

US08418027B2 Device enabling the use of a programmable component in a natural radiative environment 有权
标题翻译：可在自然辐射环境中使用可编程组件的设备
公开(公告)号：US08418027B2
公开(公告)日：2013-04-09
申请号：US12922528
申请日：2009-03-12
申请人： Bruno Grimonpont , Samuel Hazo
发明人： Bruno Grimonpont , Samuel Hazo
IPC分类号： H03M13/00
CPC分类号： G06F11/1004
摘要： A device for using a programmable component carrying out at least one logical function in a radiative environment includes: a mechanism for error detection in a data-storing working memory space actually serving to carry out each logical function of the device through use of data stored in at least one reference memory space storing a data copy implemented by at least one logical function; a mechanism blocking at least one output of at least one logical function of the component for which an error in the data implemented by the logical function is detected by the mechanism for detection; and a mechanism correcting each error detected in the working space.
摘要翻译：一种用于在辐射环境中使用执行至少一个逻辑功能的可编程组件的装置，包括：实际用于通过使用存储的数据来执行设备的每个逻辑功能的数据存储工作存储器空间中的错误检测机制存储由至少一个逻辑功能实现的数据拷贝的至少一个参考存储器空间; 通过所述检测机构检测由逻辑功能实现的数据中的错误的组件的至少一个逻辑功能的至少一个输出的机制; 以及校正在工作空间中检测到的每个错误的机构。

4. 发明申请

US20110022903A1 DEVICE ENABLING THE USE OF A PROGRAMMABLE COMPONENT IN A NATURAL RADIATIVE ENVIRONMENT 有权
标题翻译：启用在自然环境中使用可编程组件的设备
公开(公告)号：US20110022903A1
公开(公告)日：2011-01-27
申请号：US12922528
申请日：2009-03-12
申请人： Bruno Grimonpont , Samuel Hazo
发明人： Bruno Grimonpont , Samuel Hazo
IPC分类号： G06F11/25
CPC分类号： G06F11/1004
摘要： A device for using a programmable component carrying out at least one logical function in a radiative environment includes: a mechanism for error detection in a data-storing working memory space actually serving to carry out each logical function of the device through use of data stored in at least one reference memory space storing a data copy implemented by at least one logical function; a mechanism blocking at least one output of at least one logical function of the component for which an error in the data implemented by the logical function is detected by the mechanism for detection; and a mechanism correcting each error detected in the working space.
摘要翻译：一种用于在辐射环境中使用执行至少一个逻辑功能的可编程组件的装置，包括：实际用于通过使用存储的数据来执行设备的每个逻辑功能的数据存储工作存储器空间中的错误检测机制存储由至少一个逻辑功能实现的数据拷贝的至少一个参考存储器空间; 通过所述检测机构检测由逻辑功能实现的数据中的错误的组件的至少一个逻辑功能的至少一个输出的机制; 以及校正在工作空间中检测到的每个错误的机构。

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