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1. 发明申请

US20120263376A1 SUPERVISED AND SEMI-SUPERVISED ONLINE BOOSTING ALGORITHM IN MACHINE LEARNING FRAMEWORK 有权
标题翻译：监督和半监督的机器学习框架中的在线升压算法
公开(公告)号：US20120263376A1
公开(公告)日：2012-10-18
申请号：US13085329
申请日：2011-04-12
申请人： Fan Wang , Xinyu Xu , Chang Yuan , Petrus J.L. van Beek
发明人： Fan Wang , Xinyu Xu , Chang Yuan , Petrus J.L. van Beek
IPC分类号： G06K9/62
CPC分类号： G06K9/6256 , G06K9/6262
摘要： A method for classification of samples comprising providing a trained statistical model based upon a set of initial samples. Receiving a set of first samples and training a first statistical model base upon the first set of samples, where the first statistical model is of the same class as the trained statistical model. Receiving a set of second samples and training a second statistical model base upon the second set of samples, where the second statistical model is of the same class as the trained statistical model. The trained statistical model, the first statistical model, and the second statistical model, being independent of each other and collectively used to classify another sample.
摘要翻译：一种用于样本分类的方法，包括基于一组初始样本提供经过训练的统计模型。接收一组第一个样本，并基于第一组样本训练第一个统计模型，其中第一个统计模型与训练的统计模型具有相同的类别。接收一组第二样本并训练基于第二组样本的第二统计模型，其中第二统计模型与训练的统计模型具有相同的类别。经过训练的统计模型，第一个统计模型和第二个统计模型，彼此独立，并集体用于对另一个样本进行分类。

2. 发明申请

US20130129188A1 ELECTRONIC DEVICES FOR DEFECT DETECTION 有权
标题翻译：用于缺陷检测的电子设备
公开(公告)号：US20130129188A1
公开(公告)日：2013-05-23
申请号：US13300331
申请日：2011-11-18
申请人： Qiang Zhang , Xinyu Xu , Chang Yuan , Hae-Jong Seo , Petrus J.L. Van Beek
发明人： Qiang Zhang , Xinyu Xu , Chang Yuan , Hae-Jong Seo , Petrus J.L. Van Beek
IPC分类号： G06K9/00
CPC分类号： G06T7/0008 , G06T7/194 , G06T2207/20052 , G06T2207/20056
摘要： An electronic device configured for defect detection is described. The electronic device includes a processor and instructions stored in memory that is in electronic communication with the processor. The electronic device performs background suppression on the image data based on a transform of the image data to obtain a score map. The electronic device also applies thresholding to the score map to generate a detection mask. The thresholding comprises bi-thresholding. The electronic device additionally detects any defects based on the detection mask. The electronic device further indicates any defects.
摘要翻译：描述了配置用于缺陷检测的电子设备。电子设备包括处理器和存储在与处理器电子通信的存储器中的指令。电子设备基于图像数据的变换对图像数据执行背景抑制以获得分数图。电子设备还对得分图应用阈值以产生检测掩模。阈值包括双阈值。电子设备还基于检测掩模检测任何缺陷。电子设备还指示任何缺陷。

3. 发明申请

US20130058582A1 EDGE BASED TEMPLATE MATCHING 失效
标题翻译：基于边缘模式匹配
公开(公告)号：US20130058582A1
公开(公告)日：2013-03-07
申请号：US13225271
申请日：2011-09-02
申请人： Petrus J.L. Van Beek , Chang Yuan , Xinyu Xu , Xiaofan Feng , Xiaofeng Fan
发明人： Petrus J.L. Van Beek , Chang Yuan , Xinyu Xu , Xiaofan Feng , Xiaofeng Fan
IPC分类号： G06K9/68
CPC分类号： G06K9/6204 , G06K9/6857
摘要： A system for image processing includes determining edge pixels of a model image using an edge based technique, and an angular orientation for each of the edge pixels of the model image. The system determines a lower spatial resolution model image based upon the model image and determining respective angular orientations for the lower spatial resolution model image, and determines edge pixels of an input image using an edge based technique, and an angular orientation for each of the edge pixels of the input image. The system determines a lower spatial resolution input image based upon the input image and determining respective angular orientations for the lower spatial resolution input image, and matches the lower spatial resolution model image with the lower spatial resolution input image to determine candidate locations of an object within the image and based upon the candidate locations matching the input image with the model image.
摘要翻译：用于图像处理的系统包括使用基于边缘的技术来确定模型图像的边缘像素，以及模型图像的每个边缘像素的角度定向。该系统基于模型图像确定较低的空间分辨率模型图像，并且确定用于较低空间分辨率模型图像的各个角度取向，并且使用基于边缘的技术来确定输入图像的边缘像素，并且针对每个边缘输入图像的像素。该系统基于输入图像确定较低的空间分辨率输入图像，并且确定下部空间分辨率输入图像的相应角度取向，并且将下部空间分辨率模型图像与较低空间分辨率输入图像相匹配，以确定对象的候选位置并且基于与输入图像匹配的候选位置与模型图像。

4. 发明授权

US09053391B2 Supervised and semi-supervised online boosting algorithm in machine learning framework 有权
标题翻译：机器学习框架中的监督和半监督在线升压算法
公开(公告)号：US09053391B2
公开(公告)日：2015-06-09
申请号：US13085329
申请日：2011-04-12
申请人： Fan Wang , Xinyu Xu , Chang Yuan , Petrus J. L. van Beek
发明人： Fan Wang , Xinyu Xu , Chang Yuan , Petrus J. L. van Beek
IPC分类号： G06K9/62
CPC分类号： G06K9/6256 , G06K9/6262
摘要： A method for classification of samples comprising providing a trained statistical model based upon a set of initial samples. Receiving a set of first samples and training a first statistical model base upon the first set of samples, where the first statistical model is of the same class as the trained statistical model. Receiving a set of second samples and training a second statistical model base upon the second set of samples, where the second statistical model is of the same class as the trained statistical model. The trained statistical model, the first statistical model, and the second statistical model, being independent of each other and collectively used to classify another sample.
摘要翻译：一种用于样本分类的方法，包括基于一组初始样本提供经过训练的统计模型。接收一组第一个样本，并基于第一组样本训练第一个统计模型，其中第一个统计模型与训练的统计模型具有相同的类别。接收一组第二样本并训练基于第二组样本的第二统计模型，其中第二统计模型与训练的统计模型具有相同的类别。经过训练的统计模型，第一个统计模型和第二个统计模型，彼此独立，并集体用于对另一个样本进行分类。

5. 发明授权

US09092842B2 System for defect detection and repair 有权
标题翻译：缺陷检测和维修系统
公开(公告)号：US09092842B2
公开(公告)日：2015-07-28
申请号：US13197866
申请日：2011-08-04
申请人： Xinyu Xu , Chang Yuan
发明人： Xinyu Xu , Chang Yuan
IPC分类号： G06T7/00
CPC分类号： G06T7/001 , G06T2207/20224 , G06T2207/30121 , G06T2207/30141
摘要： A system for identifying a repair cut location for a defect in a liquid crystal device includes receiving an input image, a defect mask image, and a landmark structure image. The system determines a repair cut location, based upon the input image, the defect mask image, and the landmark structure image, for a liquid crystal device proximate the defect. The determination may be based upon a type of said defect, a cause of said defect, a position of said defect, and a spatial relationship of the defect and a structure of the landmark image.
摘要翻译：一种用于识别液晶装置中的缺陷的修复切割位置的系统包括接收输入图像，缺陷掩模图像和地标结构图像。对于靠近缺陷的液晶装置，系统基于输入图像，缺陷掩模图像和地标结构图像来确定修复切割位置。该确定可以基于所述缺陷的类型，所述缺陷的原因，所述缺陷的位置，以及缺陷的空间关系和标记图像的结构。

6. 发明授权

US08780097B2 Newton ring mura detection system 有权
标题翻译：牛顿环村检测系统
公开(公告)号：US08780097B2
公开(公告)日：2014-07-15
申请号：US13277953
申请日：2011-10-20
申请人： Xinyu Xu , Xiao-fan Feng , Chang Yuan
发明人： Xinyu Xu , Xiao-fan Feng , Chang Yuan
IPC分类号： G09G5/00
CPC分类号： G09G3/006 , G09G2320/0233 , G09G2320/0238 , G09G2354/00 , G09G2360/16
摘要： A system for detecting newton ring mura on a display includes sensing an image of the display with an image capture device and determining a border boundary of an illuminated portion of the display. The image is spatially filtered as defined by the border boundary using a filter that reduces sensor noise and a grid pattern of the display. The spatially filtered image is processed to determine if a region proximate a pixel location is a potential newton ring mura defect and characterizing the potential newton ring mura defects to remove at least one of the potential newton ring mura defects.
摘要翻译：用于在显示器上检测牛顿环纹的系统包括用图像捕获装置感测显示器的图像并确定显示器的照明部分的边界。图像由边界边界定义的空间过滤，使用降低传感器噪声和显示器的网格图案的滤波器。处理空间过滤的图像以确定邻近像素位置的区域是否是潜在的牛顿环mura缺陷并且表征潜在的牛顿环mura缺陷以去除潜在的牛顿环mura缺陷中的至少一个。

7. 发明授权

US08705839B2 Electronic devices for defect detection 有权
标题翻译：用于缺陷检测的电子设备
公开(公告)号：US08705839B2
公开(公告)日：2014-04-22
申请号：US13300331
申请日：2011-11-18
申请人： Qiang Zhang , Xinyu Xu , Chang Yuan , Hae-Jong Seo , Petrus J. L. Van Beek
发明人： Qiang Zhang , Xinyu Xu , Chang Yuan , Hae-Jong Seo , Petrus J. L. Van Beek
IPC分类号： G06K9/00
CPC分类号： G06T7/0008 , G06T7/194 , G06T2207/20052 , G06T2207/20056
摘要： An electronic device configured for defect detection is described. The electronic device includes a processor and instructions stored in memory that is in electronic communication with the processor. The electronic device performs background suppression on the image data based on a transform of the image data to obtain a score map. The electronic device also applies thresholding to the score map to generate a detection mask. The thresholding comprises bi-thresholding. The electronic device additionally detects any defects based on the detection mask. The electronic device further indicates any defects.
摘要翻译：描述了配置用于缺陷检测的电子设备。电子设备包括处理器和存储在与处理器电子通信的存储器中的指令。电子设备基于图像数据的变换对图像数据执行背景抑制以获得分数图。电子设备还对得分图应用阈值以产生检测掩模。阈值包括双阈值。电子设备还基于检测掩模检测任何缺陷。电子设备还指示任何缺陷。

8. 发明授权

US08483489B2 Edge based template matching 失效
标题翻译：基于边缘的模板匹配
公开(公告)号：US08483489B2
公开(公告)日：2013-07-09
申请号：US13225271
申请日：2011-09-02
申请人： Petrus J. L. Van Beek , Chang Yuan , Xinyu Xu , Xiaofan Feng , Xiaofeng Fan
发明人： Petrus J. L. Van Beek , Chang Yuan , Xinyu Xu , Xiaofan Feng , Xiaofeng Fan
IPC分类号： G06K9/64
CPC分类号： G06K9/6204 , G06K9/6857
摘要： A method for image processing that includes determining edge pixels of a model image using an edge based technique, and an angular orientation for each of the edge pixels of the model image. The method determines a lower spatial resolution model image based upon the model image and determining respective angular orientations for the lower spatial resolution model image. The method determines edge pixels of an input image using an edge based technique, and an angular orientation for each of the edge pixels of the input image. The method determines a lower spatial resolution input image based upon the input image and determining respective angular orientations for the lower spatial resolution input image. The method matches the lower spatial resolution model image with the lower spatial resolution input image to determine candidate locations of an object within the input image and based upon the candidate locations matching the input image with the model image.
摘要翻译：一种用于图像处理的方法，其包括使用基于边缘的技术来确定模型图像的边缘像素，以及模型图像的每个边缘像素的角度取向。该方法基于模型图像确定较低空间分辨率模型图像，并确定较低空间分辨率模型图像的各个角度取向。该方法使用基于边缘的技术来确定输入图像的边缘像素，并且确定输入图像的每个边缘像素的角度取向。该方法基于输入图像确定较低的空间分辨率输入图像，并确定较低空间分辨率输入图像的各个角度取向。该方法将较低空间分辨率模型图像与较低空间分辨率输入图像相匹配，以确定输入图像内的对象的候选位置，并且基于与输入图像与模型图像匹配的候选位置。

9. 发明申请

US20120027286A1 Methods, Systems and Apparatus for Defect Detection and Classification 有权
标题翻译：用于缺陷检测和分类的方法，系统和装置
公开(公告)号：US20120027286A1
公开(公告)日：2012-02-02
申请号：US12846766
申请日：2010-07-29
申请人： Xinyu Xu , Chang Yuan , Masakazu Yanase
发明人： Xinyu Xu , Chang Yuan , Masakazu Yanase
IPC分类号： G06K9/00
CPC分类号： G01N21/95 , G01N21/8851 , G01N2021/8854 , G01N2021/9513 , G06T7/0008 , G06T7/001 , G06T2207/30121
摘要： Aspects of the present invention are related to systems, methods and apparatus for image-based automatic detection of a defective area in a flat panel display and classification of the defect type and the cause of the detected defect.
摘要翻译：本发明的方面涉及用于平板显示器中的缺陷区域的基于图像的自动检测的系统，方法和装置，以及缺陷类型的分类和检测到的缺陷的原因。

10. 发明授权

US08995747B2 Methods, systems and apparatus for defect detection and classification 有权
标题翻译：用于缺陷检测和分类的方法，系统和装置
公开(公告)号：US08995747B2
公开(公告)日：2015-03-31
申请号：US12846766
申请日：2010-07-29
申请人： Xinyu Xu , Chang Yuan , Masakazu Yanase
发明人： Xinyu Xu , Chang Yuan , Masakazu Yanase
IPC分类号： G06K9/00 , G01N21/95 , G01N21/88 , G06T7/00
CPC分类号： G01N21/95 , G01N21/8851 , G01N2021/8854 , G01N2021/9513 , G06T7/0008 , G06T7/001 , G06T2207/30121
摘要： Aspects of the present invention are related to systems, methods and apparatus for image-based automatic detection of a defective area in a flat panel display and classification of the defect type and the cause of the detected defect.
摘要翻译：本发明的方面涉及用于平板显示器中的缺陷区域的基于图像的自动检测的系统，方法和装置，以及缺陷类型的分类和检测到的缺陷的原因。

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