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1. 发明申请

US20200074026A1 THERMAL ANALYSIS DEVICE AND THERMAL ANALYSIS METHOD 审中-公开
公开(公告)号：US20200074026A1
公开(公告)日：2020-03-05
申请号：US16679372
申请日：2019-11-11
申请人： FUJITSU LIMITED
发明人： Jun Taniguchi , Takeshi Soeda
IPC分类号： G06F17/50
摘要： A thermal analysis device includes a memory and a processor configured to perform estimation of whether a pair of components included in a target product has contact with each other by referring to first information obtained from design information of a product, the first information indicating whether two components have contact with each other, perform determination of a division number of the pair of components in a thermal network model by referring to second information indicating a relationship between a parameter regarding thermal transfer of components and a division number of the components in the thermal network model, perform generation of the thermal network model of the target product on the basis of a result of the estimation and another result of the determination, and perform thermal analysis based on the generated thermal network model of the target product.

2. 发明申请

US20230121368A1 STORAGE MEDIUM, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING APPARATUS 有权
公开(公告)号：US20230121368A1
公开(公告)日：2023-04-20
申请号：US17840670
申请日：2022-06-15
申请人： FUJITSU LIMITED
发明人： Akito MARUO , Kenji Homma , Hideyuki Jippo , Takeshi Soeda
IPC分类号： G06F16/2453 , G06N20/10
摘要： A storage medium storing an information processing program that causes a computer to execute a process that includes generating a solution set of a combination of the value and the index value by performing first multi-objective optimization by using a first objective function that searches for a value of the characteristic variable and a second objective function that searches for an index value that indicates reliability of the value; specifying an index value included in a combination that serves as a solution in a case where a characteristic variable is a certain value in the generated solution set; and generating a solution set of a combination of the respective values of the plurality of characteristic variables by performing second multi-objective optimization by using an objective function that searches for a value of each of a plurality of characteristic variables.

3. 发明授权

US11199833B2 Quality determination method, quality determination device, quality determination system and computer-readable non-transitory medium 有权
公开(公告)号：US11199833B2
公开(公告)日：2021-12-14
申请号：US16436972
申请日：2019-06-11
申请人： FUJITSU LIMITED
发明人： Jun Taniguchi , Takeshi Soeda
IPC分类号： G05B19/418 , G01B21/32 , G01B5/30
摘要： A quality determination method includes: in a quality determination space, mapping a quality of a package product in which a plurality of devices are assembled in accordance with a predetermined design condition, with use of each test result of each of the plurality of devices; and determining a quality of the package product, on a basis of mapping result of the mapping.

4. 发明授权

US11650579B2 Information processing device, production facility monitoring method, and computer-readable recording medium recording production facility monitoring program 有权
公开(公告)号：US11650579B2
公开(公告)日：2023-05-16
申请号：US16809713
申请日：2020-03-05
申请人： FUJITSU LIMITED
发明人： Kazunori Maruyama , Takeshi Soeda
IPC分类号： G05B23/02
CPC分类号： G05B23/0245 , G05B2219/32179 , G05B2223/02
摘要： An information processing device includes: a memory; and a processor coupled to the memory and configured to: learn a classification rule that classifies an abnormal degree of a production facility from a text feature amount based on the text feature amount obtained from a number of texts included in a plurality of pieces of log data obtained in a predetermined process of the production facility and production history information of the production facility; extract a text feature amount of log data to be monitored obtained in the predetermined process of the production facility; and determine an abnormal degree of the production facility when the log data to be monitored is obtained based on the text feature amount and the classification rule.

5. 发明申请

US20230041877A1 MATERIAL EVALUATION DEVICE, MATERIAL EVALUATION METHOD, AND STORAGE MEDIUM 有权
公开(公告)号：US20230041877A1
公开(公告)日：2023-02-09
申请号：US17967923
申请日：2022-10-18
申请人： FUJITSU LIMITED
发明人： Takeshi Soeda
IPC分类号： G01N3/32
摘要： A material evaluation device includes one or more memories; and one or more processors coupled to the one or more memories and the one or more processors configured to: store a certain number of hysteresis curves that, with respect to a change in a first physical quantity of N times at least one of a plurality of positions of a material, each represents a change in a second physical quantity of each time, the N being an integer equal to or greater than 2, extract points extracted by scanning each of the N hysteresis curves with a value of the second physical quantity for at least one of the plurality of positions, generate one-dimensional information regarding the second physical quantity by arraying the extracted points, and acquire a physical property value of the material by using the generated one-dimensional information.

6. 发明申请

US20230035149A1 INFORMATION PROCESSING DEVICE, WORK PLAN SPECIFYING METHOD, AND STORAGE MEDIUM 有权
公开(公告)号：US20230035149A1
公开(公告)日：2023-02-02
申请号：US17962564
申请日：2022-10-10
申请人： FUJITSU LIMITED
发明人： Jun Taniguchi , Kazunori Maruyama , Takeshi Soeda
IPC分类号： G06F30/27 , G06N3/12
摘要： An information processing device includes one or more processors configured to: by executing single-objective optimization on a first objective function among a plurality of objective functions defined according to feeding orders of a plurality of objects into a work line, specify first feeding orders in which values of the first objective function are better than an initial feeding order, by executing the single-objective optimization on a second objective function, specify second feeding orders in which the values of the second objective function are better than the initial feeding order, and executing multi-objective optimization on the plurality of objective functions by using the first feeding orders and the second feeding orders.

7. 发明申请

US20220350318A1 INFORMATION PROCESSING APPARATUS, SEARCH METHOD, AND STORAGE MEDIUM 有权
公开(公告)号：US20220350318A1
公开(公告)日：2022-11-03
申请号：US17866609
申请日：2022-07-18
申请人： FUJITSU LIMITED
发明人： Kazunori Maruyama , Takashi Yamazaki , Takeshi Soeda
IPC分类号： G05B19/418
摘要： An information processing apparatus configured to generate an initial order for manufacturing a plurality of products by using a plurality of parts, generate a plurality of states in which the order of the plurality of parts, allocate the plurality of parts included in the range to the plurality of products, acquire the product quality of each of the plurality of products to which the plurality of parts is allocated, repeat order search that determines the order of the parts in the range based on the product quality while changing the position of the range in the initial order, and search for a first order of the plurality of parts by executing processing of determining the order of the parts in the initial order after changing the order in the range as a part of the initial order, while sequentially changing a position of the range in the initial order.

8. 发明授权

US11054460B2 Soft error inspection method, soft error inspection apparatus, and soft error inspection system 有权
公开(公告)号：US11054460B2
公开(公告)日：2021-07-06
申请号：US16683875
申请日：2019-11-14
申请人： FUJITSU LIMITED
发明人： Takeshi Soeda
IPC分类号： G01R31/265 , G01R31/307
摘要： A soft error inspection method for a semiconductor device includes: irradiating and scanning the semiconductor device with a laser beam or an electron beam; and measuring and storing a time of bit inversion for each of areas irradiated with the laser beam or the electron beam of the semiconductor device.

9. 发明申请

US20200348131A1 METHOD OF DIAGNOSING PIPE, DEVICE OF DIAGNOSING PIPE, AND SYSTEM OF DIAGNOSING PIPE 审中-公开
公开(公告)号：US20200348131A1
公开(公告)日：2020-11-05
申请号：US16932889
申请日：2020-07-20
申请人： FUJITSU LIMITED
发明人： Jun Taniguchi , Takeshi Soeda , YOICHI TAKASU
IPC分类号： G01B21/08 , F17D3/01 , G01N25/18
摘要： A method of diagnosing a pipe includes diagnosing, by a computer, a state of a pipe from an updated model based on change in temperature of the pipe calculated from the model in a case where the pipe is heated in the model obtained by modeling a heat transfer behavior of an inside of the pipe containing deposition by using an equivalent circuit and change in temperature of the pipe measured in a case where the pipe is heated.

10. 发明申请

US20160327498A1 MATERIAL EVALUATION DEVICE AND METHOD 审中-公开
标题翻译：材料评估装置和方法
公开(公告)号：US20160327498A1
公开(公告)日：2016-11-10
申请号：US15213913
申请日：2016-07-19
申请人： FUJITSU LIMITED
发明人： Hideshi Yamaguchi , Takeshi Soeda
IPC分类号： G01N23/225
CPC分类号： G01N23/2251 , H01J37/244 , H01J2237/24578
摘要： A detector is the one which detects reflected electrons or secondary electrons emitted from a sample as a result of irradiation with an electron beam by an electron beam irradiation unit, and its one end is set into a non-contact state where it is separated from and faces the sample and the other end is supported on and fixed to a drive mechanism, and the drive mechanism freely moves the detector random positions three-dimensionally with respect to the sample. According to this configuration, it is possible to detect reflected electrons and secondary electrons scattered in random directions appropriately, and accurate evaluation of a crystal grain diameter in which no crystal grain boundary is overlooked and acquisition of an isotropic surface shape image are achieved.
摘要翻译：检测器是通过电子束照射单元检测由电子束照射而从样品发射的反射电子或二次电子的检测器，其一端设定为非接触状态，面对样品，另一端支撑并固定在驱动机构上，并且驱动机构相对于样品三维自由移动检测器随机位置。根据该结构，可以适当地检测在随机方向上散射的反射电子和二次电子，并且可以精确地评价不忽略晶粒边界的晶粒直径，并获得各向同性的表面形状图像。

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