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    • 7. 发明申请
    • CRYSTAL UNIT
    • 水晶单元
    • US20160231368A1
    • 2016-08-11
    • US14974434
    • 2015-12-18
    • FUJITSU LIMITED
    • Masakazu KishiHajime KubotaMasayuki ITOH
    • G01R29/22H03H9/10H03B5/32H03H9/13
    • G01R29/22G01L1/10G01L1/162G01L9/008H03B5/32H03H9/1021H03H9/13
    • A crystal unit includes: a crystal blank; an excitation electrode formed on the crystal blank and excites a main vibration of the crystal blank; a housing that accommodates the crystal blank; and a sub-vibration electrode formed on the housing and excites a sub-vibration of the crystal blank.And a method for inspecting a crystal unit, the method includes: generating a sub-vibration in a crystal blank by applying an input signal to a sub-vibration electrode formed on a housing, which accommodates the crystal blank, via external electrodes which are electrically coupled to the sub-vibration electrode and formed on the outer surface of the housing; obtaining an output of the crystal unit via the external electrodes; obtaining frequency characteristics of impedance between the external electrodes based on the output; and comparing the obtained frequency characteristics with the reference frequency characteristics indicating the quality of the crystal unit.
    • 晶体单元包括:晶体空白; 形成在晶体坯上的激励电极,激发晶体坯的主振动; 容纳晶体空白的壳体; 以及形成在壳体上的辅助振动电极,并且激发晶体坯的亚振动。 以及一种用于检查晶体单元的方法,该方法包括:通过外部电极将形成在容纳晶体坯料的壳体上形成的辅助振动电极施加输入信号,从而在晶体坯体中产生亚振动 耦合到副振动电极并形成在壳体的外表面上; 通过外部电极获得晶体单元的输出; 基于输出获得外部电极之间的阻抗的频率特性; 并将获得的频率特性与表示晶体单元的质量的参考频率特性进行比较。