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    • 3. 发明申请
    • SOUNDPROOF STRUCTURE
    • US20180082668A1
    • 2018-03-22
    • US15822638
    • 2017-11-27
    • FUJIFILM Corporation
    • Shogo YAMAZOEShinya HAKUTATadashi KASAMATSUMasayuki NAYA
    • G10K11/16
    • G10K11/16
    • There is provided a soundproof structure which is light and thin, which has air permeability so that wind and heat can pass therethrough and accordingly no heat accumulates on the inside, and which is suitable for equipment, automobiles, and household applications. The soundproof structure has one or more soundproof cells. Each soundproof cell includes a frame having a through-hole through which sound passes, a film fixed to the frame, an opening portion configured to include one or more holes drilled in the film, and a weight disposed on the film. The soundproof structure has a first shielding peak frequency, which is determined by the opening portion drilled in the film and at which a transmission loss is maximized, on a lower frequency side than a first natural vibration frequency of the film of each soundproof cell and a second shielding peak frequency, which is determined by the weight and at which a transmission loss is maximized, on a higher frequency side than the first natural vibration frequency of the film, and selectively insulates sound in a predetermined frequency band centered on the first shielding peak frequency and sound in a predetermined frequency band centered on the second shielding peak frequency.
    • 4. 发明申请
    • MEASUREMENT DEVICE, MEASUREMENT APPARATUS, AND METHOD
    • 测量装置,测量装置和方法
    • US20160027631A1
    • 2016-01-28
    • US14875129
    • 2015-10-05
    • FUJIFILM CORPORATION
    • Masayuki NAYAShogo YAMAZOEMegumi SHIOTAMakoto SUEMATSU
    • H01J49/16H01J49/04G01N21/65
    • H01J49/164G01N21/658G01N2201/06113G01N2201/068H01J49/0004H01J49/0418H01J49/40
    • A metal film of a measurement device including a transparent dielectric substrate is irradiated with first light from a transparent dielectric substrate side, an optical electric field enhanced by an optical electric field enhancing effect of a localized plasmon induced to a surface of the metal film by the irradiation is generated, light emitted from the transparent dielectric substrate side is detected, a specimen installed on a surface of a metal fine concavo-convex structure layer and a matrix agent are irradiated with second light from a side opposite to the side of the irradiation with the first light in a state where a voltage is applied to the metal fine concavo-convex structure layer through a voltage application electrode, an analysis target substance for mass spectrometry in the specimen is desorbed from the surface by the irradiation, and the desorbed analysis target substance is detected.
    • 用透明电介质基板侧的第一光照射包括透明电介质基板的测量装置的金属膜,通过由金属膜的表面引起的局部等离子体激元的光电场增强效应增强的光电场 产生照射,检测从透明电介质基板侧发出的光,将安装在金属微细凹凸结构层的表面上的试样和基体试剂从与照射侧相反侧的第二光照射, 通过电压施加电极向金属微细凹凸结构层施加电压的状态下的第一光,通过照射将样品中的质谱分析对象物质从表面解吸,解吸分析对象 检测到物质。