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    • 3. 发明授权
    • Indication of the condition of a user
    • 指示用户的状况
    • US08436810B2
    • 2013-05-07
    • US12293115
    • 2007-03-07
    • Geert LangereisEvert Jan Van LoenenRalph KurtDavid Paul WalkerSteffen Reymann
    • Geert LangereisEvert Jan Van LoenenRalph KurtDavid Paul WalkerSteffen Reymann
    • G09G5/00
    • A61B5/02438A61B5/0205A61B5/165A61B5/681A61B5/7445G04G21/025
    • A wearable electronic device such as a wrist watch (60) is supplied with conventional clock with two pointers (32,33). The device displays a parameter indicative of how “cool” the wearer has been over the past period as a function of time, using the time axis of one of the pointers (32,33). “Coolness” can be based on the measurement of related physiological parameters like heart-rate, body temperature, movement, skin resistance or muscle activity. “Coolness” of a person is understood as being the ability to cope with stress. Therefore, the stability of physiological parameters can be used to derive a signal for the subjective trait called “coolness”. All physiological parameters can be measured by sensors (10) in the watch (60) or in the strap (50). The invention is used as a gadget for self expression and emotional feedback.
    • 诸如手表(60)的可穿戴电子装置用两个指针(32,33)提供常规时钟。 设备使用指针之一(32,33)的时间轴,显示表示使用者在过去一段时间内作为时间的函数如何“冷静”的参数。 “冷静”可以基于相关生理参数的测量,如心率,体温,运动,皮肤抵抗力或肌肉活动。 一个人的“冷静”被理解为应付压力的能力。 因此,可以使用生理参数的稳定性来导出称为“冷静”的主观性状的信号。 所有的生理参数可以通过手表(60)中或传感器(50)中的传感器(10)来测量。 本发明用作自我表达和情感反馈的小工具。
    • 6. 发明申请
    • LOCATION ESTIMATION FOR A MOBILE DEVICE
    • 移动设备的位置估计
    • US20140120950A1
    • 2014-05-01
    • US14126954
    • 2012-06-21
    • Paul Michael FultonMartin John EdwardsSteffen ReymannDennis PollingPaul Richard Simons
    • Paul Michael FultonMartin John EdwardsSteffen ReymannDennis PollingPaul Richard Simons
    • H04W4/02G01S5/00
    • H04W4/029G01S5/0018G01S5/0027G01S5/0252G01S19/17G01S19/46
    • There is therefore provided a method of estimating the location of a mobile device, the mobile device being configured for use in a cellular mobile communications network comprising a plurality of base stations, the method comprising generating a database of locations visited by the mobile device by obtaining measurements of the position of the mobile device over time using a satellite-based positioning system; obtaining the identity of the base station serving the mobile device at the time of each measurement of the position of the mobile device; and analyzing the measurements to identify locations visited by the mobile device, each location being associated with a particular base station, such that the mobile device is attached to said base station when at said location; and during subsequent use of the mobile device, in the event that it is not possible to use the satellite-based positioning system to measure the position of the mobile device, estimating the location of the mobile device as one or more identified locations that are associated with the base station to which the mobile device is currently attached. Corresponding apparatus and computer program products are also provided.
    • 因此,提供了一种估计移动设备的位置的方法,该移动设备被配置为在包括多个基站的蜂窝移动通信网络中使用,该方法包括:通过获得移动设备生成由移动设备访问的位置的数据库 使用基于卫星的定位系统测量移动设备随时间的位置; 在每次测量移动设备的位置时获得服务移动设备的基站的身份; 以及分析所述测量以识别由所述移动设备访问的位置,每个位置与特定基站相关联,使得所述移动设备在所述位置附接到所述基站; 并且在随后使用移动设备期间,在不可能使用基于卫星的定位系统来测量移动设备的位置的情况下,将移动设备的位置估计为相关联的一个或多个已识别位置 与移动设备当前附接到的基站。 还提供了相应的设备和计算机程序产品。
    • 9. 发明申请
    • PRODUCTION OF HIGH ALIGNMENT MARKS AND SUCH ALIGNMENT MARKS ON A SEMICONDUCTOR WAFER
    • 在半导体波长上生成高对齐标记和这样的对准标记
    • US20120032356A1
    • 2012-02-09
    • US13139002
    • 2009-12-23
    • Steffen ReymannGerhard FiehneUwe Eckoldt
    • Steffen ReymannGerhard FiehneUwe Eckoldt
    • H01L23/544H01L21/02
    • G03F9/7084G03F9/7076G03F9/708H01L23/544H01L2223/54426H01L2223/5446H01L2924/0002H01L2924/00
    • The invention relates to production of alignment marks on a semiconductor wafer with the use of a light-opaque layer (17), wherein, before the light-opaque layer (17) is applied, by means of the etching of cavities, free-standing pillar groups are produced in the cavities and then the light-opaque layer (17) is applied. The pillars are produced with a height of above 1 μm, which, moreover, is greater than a thickness of the light-opaque layer (17) to be applied in the cavities as layer portions (17x; 17y). The cavities are formed with a width such that they are filled only partly with the layer portions (17x; 17y) when the light-opaque layer (17) is applied. The high, freely positioned alignment marks produced by the method as pillar series (16x; 16y), having a plurality of individual pillars (16a; 16a′) in a cavity (12a, 12y), of a scribing trench on the semiconductor wafer are likewise described.
    • 本发明涉及使用不透光层(17)在半导体晶片上制造对准标记,其中,在施加不透光层(17)之前,通过蚀刻空腔,独立地 在空腔中产生柱组,然后施加不透光层(17)。 产生高度大于1μm的柱,此外,其大于作为层部分(17x; 17y)施加在空腔中的不透光层(17)的厚度。 这些空腔形成为宽度,使得当应用不透光层(17)时,它们仅部分地填充有层部分(17x; 17y)。 在半导体晶片上的划线沟槽的空腔(12a,12y)中具有多个单独的支柱(16a,16a')作为柱系列(16x; 16y)的方法产生的高自由定位的对准标记是 同样描述。