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1. 发明授权

US07719760B2 Optical microscope system for detecting nanowires using polarizer and fast fourier transform 失效
标题翻译：用于使用偏振器和快速傅里叶变换检测纳米线的光学显微镜系统
公开(公告)号：US07719760B2
公开(公告)日：2010-05-18
申请号：US11940379
申请日：2007-11-15
申请人： Eun Kyoung Kim , Seung Eon Moon , Hong Yeol Lee , Jong Hyurk Park , Kang Ho Park , Jong Dae Kim , Gyu Tae Kim , Do Young Jang , Eung Seook Park , Hyun Jin Ji
发明人： Eun Kyoung Kim , Seung Eon Moon , Hong Yeol Lee , Jong Hyurk Park , Kang Ho Park , Jong Dae Kim , Gyu Tae Kim , Do Young Jang , Eung Seook Park , Hyun Jin Ji
IPC分类号： G02B21/06
CPC分类号： G02B21/06 , G01N21/21 , G02B21/365 , G02B27/286 , Y10S977/881
摘要： Provided is an optical microscope system for detecting nanowires to allow for use of an existing optical microscope in fabricating an electronic device having the nanowires and including: a light source for emitting light to provide the light to a nanowire sample; a rotational polarizer provided on a path of the light emitted from the light source for polarizing the light; an optical microscope for detecting a nanowire image using light that is polarized by the rotational polarizer and incident on the nanowire sample; a CCD camera provided in a region of the optical microscope for photographing and storing the nanowire image detected by the optical microscope; and a data processor for performing Fast Fourier Transform (FFT) on the nanowire image stored in the CCD camera. Intensity of reflected light varies, due to optical anisotropy of the nanowires, along a polarizing orientation of light incident on the nanowires.
摘要翻译：提供了一种用于检测纳米线的光学显微镜系统，以允许使用现有的光学显微镜来制造具有纳米线的电子器件，并且包括：用于发射光以向纳米线样品提供光的光源; 设置在从光源发射的光的路径上以使光偏振的旋转偏振器; 光学显微镜，用于使用被旋转偏振器偏振并入射在纳米线样品上的光检测纳米线图像; 设置在光学显微镜的区域中的CCD照相机，用于拍摄和存储由光学显微镜检测的纳米线图像; 以及用于在存储在CCD照相机中的纳米线图像上执行快速傅里叶变换（FFT）的数据处理器。反射光的强度由于纳米线的光学各向异性而沿着入射在纳米线上的光的偏振方向而变化。

2. 发明申请

US20090195869A1 Optical microscope system for detecting nanowires using polarizer and fast fourier transform 失效
标题翻译：用于使用偏振器和快速傅里叶变换检测纳米线的光学显微镜系统
公开(公告)号：US20090195869A1
公开(公告)日：2009-08-06
申请号：US11940379
申请日：2007-11-15
申请人： Eun Kyoung Kim , Seung Eon Moon , Hong Yeol Lee , Jong Hyurk Park , Kang Ho Park , Jong Dae Kim , Gyu Tae Kim , Do Young Jang , Eung Seok Park , Hyun Jin Ji
发明人： Eun Kyoung Kim , Seung Eon Moon , Hong Yeol Lee , Jong Hyurk Park , Kang Ho Park , Jong Dae Kim , Gyu Tae Kim , Do Young Jang , Eung Seok Park , Hyun Jin Ji
IPC分类号： G02B21/06 , G06K9/00
CPC分类号： G02B21/06 , G01N21/21 , G02B21/365 , G02B27/286 , Y10S977/881
摘要： Provided is an optical microscope system for detecting nanowires that is designed with a rotational polarizer and Fast Fourier Transform (FFT) to allow for use of an existing optical microscope in fabricating an electronic device having the nanowires. The optical microscope system includes: a light source for emitting light to provide the light to a nanowire sample; a rotational polarizer provided on a path of the light emitted from the light source for polarizing the light; an optical microscope for detecting a nanowire image using light that is polarized by the rotational polarizer and incident on the nanowire sample; a CCD camera provided in a region of the optical microscope for photographing and storing the nanowire image detected by the optical microscope; and a data processor for performing Fast Fourier Transform (FFT) on the nanowire image stored in the CCD camera. Intensity of reflected light varies, due to optical anisotropy of the nanowires, along a polarizing orientation of light incident on the nanowires. It is possible to obtain a distinct image of the nanowires having a nanometer line width by performing FFT on each pixel of reflected light images obtained at predetermined time intervals after light passing through the polarizer rotating in a predetermined period is incident on the nanowires.
摘要翻译：提供了一种用于检测纳米线的光学显微镜系统，其被设计为具有旋转偏振器和快速傅里叶变换（FFT），以允许使用现有的光学显微镜来制造具有纳米线的电子器件。光学显微镜系统包括：用于发射光以向纳米线样品提供光的光源; 设置在从光源发射的光的路径上以使光偏振的旋转偏振器; 光学显微镜，用于使用被旋转偏振器偏振并入射在纳米线样品上的光检测纳米线图像; 设置在光学显微镜的区域中的CCD照相机，用于拍摄和存储由光学显微镜检测的纳米线图像; 以及用于在存储在CCD照相机中的纳米线图像上执行快速傅里叶变换（FFT）的数据处理器。反射光的强度由于纳米线的光学各向异性而沿着入射在纳米线上的光的偏振方向而变化。通过在经过预定时间内旋转的偏振片的光入射到纳米线上之后，以预定时间间隔获得的反射光图像的每个像素执行FFT，可以获得具有纳米线宽度的纳米线的不同图像。

3. 发明申请

US20100142918A1 RESERVED RECORDING METHOD AND APPARATUS OF BROADCAST PROGRAM 审中-公开
标题翻译：保留的记录方法和广播程序的设备
公开(公告)号：US20100142918A1
公开(公告)日：2010-06-10
申请号：US12629396
申请日：2009-12-02
申请人： Min Haeng CHO , Do Young Jang
发明人： Min Haeng CHO , Do Young Jang
IPC分类号： H04N5/91 , G06F13/00
CPC分类号： H04N5/76 , G11B15/026 , G11B19/025 , G11B19/06 , H04N21/4147 , H04N21/4334 , H04N21/4583 , H04N21/4622 , H04N21/47214
摘要： A reserved recording method and apparatus of broadcast programs are disclosed. In setting reserved recording for broadcast programs, a start complementary time (SCT) and/or an end complementary time (ECT) are additionally set before a start time and after an end time of the broadcast programs, and if the SCT or a start time of a second broadcast program is ahead of the ECT of a first broadcast program, a switching time from the recording of the first broadcast program to the recording of the second broadcast program can be changed. Thus, a failure to record a portion of a broadcast program previously reserved for recording due to a delay in a broadcast time or the like can be prevented.
摘要翻译：公开了广播节目的保留记录方法和装置。在设置用于广播节目的保留记录时，在广播节目的开始时间和结束时间之后，另外设定开始补充时间（SCT）和/或结束互补时间（ECT），如果SCT或开始时间在第一广播节目的ECT之前，可以改变从第一广播节目的记录到第二广播节目的记录的切换时间。因此，可以防止由于广播时间等中的延迟而先前保留用于记录的广播节目的一部分的记录失败。

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