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热词
    • 9. 发明授权
    • Device and method for testing a circuit
    • 用于测试电路的装置和方法
    • US08452553B2
    • 2013-05-28
    • US12516319
    • 2006-11-30
    • Eran GlickmanYaron AlankryErez Arbel-MeirovichErez Parnes
    • Eran GlickmanYaron AlankryErez Arbel-MeirovichErez Parnes
    • G01R31/00
    • G06F11/2236
    • A device and a method. The device includes: (i) a processor, connected to the receiver, (ii) an interface adapted to receive a test vector and to output a test response, the test vector includes a first group of signals that include idle signals and at least one information frame and a second group of signals that include timing signals and data signals; and (iii) a receiver, connected to the interface. The receiver is adapted to receive the first group of signals and filter out the idle signals and at least one instruction frame delimiters to provide at least one instruction. The device is adapted to send the at least one instruction to at least one instruction buffer. The processor is adapted to execute at least one instruction stored in the at least one instruction buffer and to respond to the second group of signals such as to provide test responses.
    • 一种设备和方法。 该设备包括:(i)连接到接收器的处理器,(ii)适于接收测试向量并输出测试响应的接口,测试向量包括第一组信号,包括空闲信号和至少一个 信息帧和包括定时信号和数据信号的第二组信号; 和(iii)连接到接口的接收器。 接收器适于接收第一组信号并滤除空闲信号和至少一个指令帧分隔符以提供至少一个指令。 该设备适于将至少一个指令发送到至少一个指令缓冲器。 处理器适于执行存储在至少一个指令缓冲器中的至少一个指令,并且响应于第二组信号,以便提供测试响应。