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    • 2. 发明授权
    • Flexible test fixture
    • 灵活的测试夹具
    • US08166446B2
    • 2012-04-24
    • US12173463
    • 2008-07-15
    • Mark A. DicksonEdward J. CollinsRobert Gregory Jukna
    • Mark A. DicksonEdward J. CollinsRobert Gregory Jukna
    • G06F11/22G06F17/50H05K7/20H05K1/00H05K1/18H05K7/00
    • G01R1/07371G01R31/2808
    • A system for testing an electronic circuit board (ECB) having a plurality of test points in a pre-defined arrangement on a measurement device having a plurality of resources includes an interface fixture having a plurality of contact pads arranged in an array on a first surface. The contact pads can be electrically coupled to the plurality of resources of the measurement system according to a pre-defined pattern, where at least two of the contact pads are electrically coupled to one of the plurality of resources in a many-to-one relationship. The system also includes a test fixture removably attached to the first surface of the interface fixture. The test fixture includes an upper probe plate having a plurality of openings and a lower probe plate parallel to the upper probe plate. The lower probe plate includes a plurality of openings associated with the openings in the upper probe plate. The test fixture also includes a plurality of probes extending through the associated openings in the upper and the lower probe plates, contacting one of the contact pads, and guided to test points of the ECB by the associated openings.
    • 一种用于测试在具有多个资源的测量装置上具有预定布置的多个测试点的电子电路板(ECB)的系统,包括:接口固定装置,具有在第一表面上排列成阵列的多个接触焊盘 。 接触焊盘可以根据预定义的图案电耦合到测量系统的多个资源,其中至少两个接触焊盘以多对一关系电耦合到多个资源之一 。 该系统还包括可拆卸地附接到接口夹具的第一表面的测试夹具。 测试夹具包括具有多个开口的上探针板和平行于上探针板的下探针板。 下探针板包括与上探针板中的开口相关联的多个开口。 测试夹具还包括多个探针,其延伸穿过上和下探针板中的相关联的开口,接触其中一个接触垫,并通过相关的开口被引导到ECB的测试点。
    • 4. 发明授权
    • Flexible test fixture
    • 灵活的测试夹具
    • US08407657B2
    • 2013-03-26
    • US13427532
    • 2012-03-22
    • Mark A. DicksonEdward J. CollinsRobert Gregory Jukna
    • Mark A. DicksonEdward J. CollinsRobert Gregory Jukna
    • G06F11/22G06F17/50G01R31/304G01R31/306G01R31/309
    • G01R1/07371G01R31/2808
    • A system for testing an electronic circuit board (ECB) having a plurality of test points in a pre-defined arrangement on a measurement device having a plurality of resources includes an interface fixture having a plurality of contact pads arranged in an array on a first surface. The contact pads can be electrically coupled to the plurality of resources of the measurement system according to a pre-defined pattern, where at least two of the contact pads are electrically coupled to one of the plurality of resources in a many-to-one relationship. The system also includes a test fixture removably attached to the first surface of the interface fixture. The test fixture includes an upper probe plate having a plurality of openings and a lower probe plate parallel to the upper probe plate. The lower probe plate includes a plurality of openings associated with the openings in the upper probe plate.
    • 一种用于测试在具有多个资源的测量装置上具有预定布置的多个测试点的电子电路板(ECB)的系统,包括:接口固定装置,具有在第一表面上排列成阵列的多个接触焊盘 。 接触焊盘可以根据预定义的图案电耦合到测量系统的多个资源,其中至少两个接触焊盘以多对一关系电耦合到多个资源之一 。 该系统还包括可拆卸地附接到接口夹具的第一表面的测试夹具。 测试夹具包括具有多个开口的上探针板和平行于上探针板的下探针板。 下探针板包括与上探针板中的开口相关联的多个开口。
    • 5. 发明申请
    • FLEXIBLE TEST FIXTURE
    • 灵活的测试仪器
    • US20120217988A1
    • 2012-08-30
    • US13427532
    • 2012-03-22
    • Mark A. DicksonEdward J. CollinsRobert Gregory Jukna
    • Mark A. DicksonEdward J. CollinsRobert Gregory Jukna
    • G01R31/00
    • G01R1/07371G01R31/2808
    • A system for testing an electronic circuit board (ECB) having a plurality of test points in a pre-defined arrangement on a measurement device having a plurality of resources includes an interface fixture having a plurality of contact pads arranged in an array on a first surface. The contact pads can be electrically coupled to the plurality of resources of the measurement system according to a pre-defined pattern, where at least two of the contact pads are electrically coupled to one of the plurality of resources in a many-to-one relationship. The system also includes a test fixture removably attached to the first surface of the interface fixture. The test fixture includes an upper probe plate having a plurality of openings and a lower probe plate parallel to the upper probe plate.
    • 一种用于测试在具有多个资源的测量装置上具有预定布置的多个测试点的电子电路板(ECB)的系统,包括:接口固定装置,具有在第一表面上排列成阵列的多个接触焊盘 。 接触焊盘可以根据预定义的图案电耦合到测量系统的多个资源,其中至少两个接触焊盘以多对一关系电耦合到多个资源之一 。 该系统还包括可拆卸地附接到接口夹具的第一表面的测试夹具。 测试夹具包括具有多个开口的上探针板和平行于上探针板的下探针板。
    • 8. 发明授权
    • Reduced voltage and time delay to eliminate filament hot shock
    • 降低电压和时间延迟,消除细丝热冲击
    • US06208090B1
    • 2001-03-27
    • US09565252
    • 2000-05-05
    • Ludwig SkilskyjLaszlo V. LieszkovszkyLeonard E. HoeglerEdward J. Collins
    • Ludwig SkilskyjLaszlo V. LieszkovszkyLeonard E. HoeglerEdward J. Collins
    • H05B3702
    • H05B39/02
    • A method to eliminate filament hot shock in lamp filaments, particularly in compact filament light sources such as high efficiency infrared reflective coated halogen lamps, during installation or during energization comprising a voltage reduction circuit that reduces the voltage applied to the lamp filaments for a predetermined period of time and a timing circuit that is activated each time the lamp is energized and controls the predetermined period of time during which the voltage reduction circuit reduces voltage applied to the lamp filaments. Optionally, a one time latch circuit may be included that enables the timing circuit upon energization and disables it after the voltage reduction circuit has operated continuously for the predetermined period of time, and forever thereafter.
    • 在安装期间或在通电期间消除灯丝中的细丝热冲击的方法,特别是在诸如高效率的红外线反射涂覆的卤素灯的紧凑的灯丝光源中的方法包括降压电路,其将施加到灯丝​​的电压降低预定时间 的时间和定时电路,每当灯被通电时被激活,并且控制电压降低电路降低施加到灯丝​​的电压的预定时间段。 可选地,可以包括一次锁存电路,其在通电时使定时电路能够被激活,并且在电压降低电路连续运行预定时间段之后,并且在此之后永久地停止。