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    • 5. 发明申请
    • ELECTRONIC DEVICE RELIABILITY MEASUREMENT SYSTEM AND METHOD
    • 电子设备可靠性测量系统和方法
    • US20140152338A1
    • 2014-06-05
    • US13950939
    • 2013-07-25
    • Electronics and Telecommunications Research Institute
    • Jongmin LEEByoung-Gue MinChull Won Ju
    • G01R31/26
    • G01R31/2608G01R31/2621G01R31/2632
    • Provided is a low-cost and high-efficient system for measuring reliability of an electronic device. According to the present invention, a single input power source for applying power to an input terminal of a plurality of electronic device samples and a single output power source for applying power to an output terminal of the plurality of electronic device samples are provided. Further, an input switch having first switches of which the number corresponds to the number of the plurality of electronic device samples, the input switch being installed between the input power source and the input terminal so that the first switches are selectively switched to apply input power; and an output switch having second switches of which the number corresponds to the number of the plurality of electronic device samples, the output switch being installed between the output power source and the output terminal so that the second switches are selectively switched to apply output power are provided.
    • 提供了用于测量电子设备的可靠性的低成本和高效率的系统。 根据本发明,提供了用于向多个电子设备样本的输入端施加电力的单个输入电源和用于向多个电子设备样本的输出端施加电力的单个输出电源。 此外,具有第一开关的输入开关,其数量对应于多个电子设备样本的数量,输入开关安装在输入电源和输入端子之间,使得第一开关被选择性地切换以施加输入功率 ; 以及具有第二开关的输出开关,其数量对应于多个电子设备样本的数量,输出开关安装在输出电源和输出端子之间,使得第二开关选择性地切换以施加输出功率 提供。