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    • 1. 发明授权
    • Imaging system
    • 成像系统
    • US5986810A
    • 1999-11-16
    • US120368
    • 1998-07-22
    • Duncan James Webb
    • Duncan James Webb
    • H04N3/08H04N5/33H04N5/372G02B27/10G02B27/64
    • H04N5/37206H04N3/08H04N3/1525H04N5/33
    • An imaging system is provided which comprises an objective lens arrangement, a linear array of detector elements within a detector the array comprising a row of time delay an integrate (TDI) channels and a scanning optic arranged to scan an image over the array detector elements, the system further comprises means for rotating the scanning optic about an axis (N) normal to an optical surface of the scan optic when the scan optic is in the center of its field of view position, the scan optic being rotated about this axis (N) in dependence on the rate at which the imaging system is panned across a scene, such that a received image is vector scanned across the linear array of detector elements to compensate for loss in image resolution due to the panning action of the imaging system occurring during the period in which an image frame is detected.
    • 提供了一种成像系统,其包括物镜布置,检测器内的检测器元件的线性阵列,该阵列包括时延延迟的行(TDI)通道和布置成扫描阵列检测器元件上的图像的扫描光学器件, 所述系统还包括用于当所述扫描光学器件位于其视场位置的中心时围绕垂直于所述扫描光学器件的光学表面的轴线(N)旋转所述扫描光学器件的装置,所述扫描光学器件围绕该轴线旋转(N ),这取决于成像系统在场景上平移的速率,使得接收的图像被跨越检测器元件的线性阵列向量扫描,以补偿由于成像系统期间发生的平移动作造成的图像分辨率损失 检测到图像帧的周期。
    • 2. 发明授权
    • Thermal imager referencing system
    • 热像仪参考系统
    • US5864135A
    • 1999-01-26
    • US764636
    • 1996-12-11
    • Brian Frederick SmithDuncan James Webb
    • Brian Frederick SmithDuncan James Webb
    • G01J5/48G01J5/52H04N5/33G01J5/54
    • H04N5/33G01J5/522
    • A thermal imager referencing system comprises two rotating cranks in the form of discs (7, 8) each pivotally attached to connecting member (9). The discs (7, 8) are rotated at a constant speed causing two mirrors laterally displaced along connecting member (9) to intercept an optical path X of a thermal imager associated with the referencing system. Each rotation through 360 degrees of the discs (7, 8) causes each mirror to pass once through the optical path, the mirror surfaces being respectively arranged to cause a linear array of detector elements (not shown) of the thermal imager to view alternately thermo-electric devices (14, 16), which are at different temperatures, during the flyback time associated with the thermal imager. The referencing system enables processing means of the thermal imager to normalize the detector array, compensating for DC offset and differences in gain between different elements of the detector array. The referencing system is of a particularly compact design and minimizes the effect of any temperature variations across the surfaces of the Peltier on the normalization process.
    • 热成像仪参考系统包括两个旋转曲柄,其形式为圆盘(7,8),每个旋转曲柄枢转地连接到连接构件(9)。 盘(7,8)以恒定的速度旋转,使两个反射镜沿着连接构件(9)横向移位,以拦截与参考系统相关联的热像仪的光路X. 通过360度的圆盘(7,8)的每次旋转使得每个反射镜通过一次通过光路,镜面分别布置成使得热像仪的检测器元件(未示出)的线性阵列交替地观察到热 在与热像仪相关的回扫时间期间处于不同温度的电子设备(14,16)。 参考系统使得热成像仪的处理装置能够对检测器阵列进行归一化,补偿检测器阵列的不同元件之间的DC偏移和增益差异。 参考系统具有特别紧凑的设计,并且在标准化过程中最小化珀尔帖表面上任何温度变化的影响。